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Jsm 6700f

Manufactured by JEOL
Sourced in Japan, United States, United Kingdom, Germany, France

The JSM-6700F is a field emission scanning electron microscope (FESEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analytical capabilities for a wide range of applications. The JSM-6700F utilizes a field emission gun to generate a high-brightness electron beam, enabling it to achieve a high-resolution imaging performance. It is capable of operating at low accelerating voltages, making it suitable for the observation of sensitive samples.

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624 protocols using jsm 6700f

1

Morphological and Structural Analysis of Core-Shell Electrodes

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The morphology examination and nanostructural analysis of the resulting core-shell electrodes were performed using scanning electron microscopy (SEM, JSM-6700F, JEOL, Tokyo, Japan) and transmission electron microscopy (TEM, 2100F, JEOL II, Tokyo, Japan), respectively. The phase identification was carried out by X-ray diffractometry (XRD, SRA-M18XHF, MAC Science, Yokohama, Japan). The elemental and chemical compositions were determined by energy dispersive X-ray spectroscopy (EDS, attached to JEOL JSM-6700F) and X-ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe, ULVAC-PHI, Chigasaki, Japan), respectively. Electrochemical characterization of the electrodes was performed in a three-compartment cell by an electrochemical analyzer system (Model 727C, CH Instruments, Austin, TX, USA) at room temperature. An Ag/AgCl electrode was used as the reference electrode, and a piece of platinum foil served as the counter electrode. The morphologies of the Mn/Zn-oxide coatings before and after CV were observed using scanning electron microscopy (SEM, JSM-6700F, JEOL, Tokyo, Japan).
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2

Comprehensive Characterization of NiFe2O4@NiFe2O4 Nanostructured Arrays

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The morphology of the NiFe2O4@NiFe2O4 NSAs was characterized by field-emission scanning electron microscopy (SEM, JEOL JSM 6700F) and transmission electron microscopy (TEM, FEI Tecnai G2 F20 S-Twin D573) with acceleration voltage of 200 kV. The energy dispersive X-ray spectroscopy (EDS) spectra were also acquired using a JEOL JSM 6700F microscope. The composition and structure of NiFe2O4@NiFe2O4 NSAs were examined by powder X-ray diffraction (XRD, Rigaku D/Max 2550V/PC, Japan Cu-Kα radiation, λ = 0.15418 nm), and further confirmed by X-ray photoelectron spectroscopy (XPS, ESCALAB 250).
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3

Morphological Analysis of Ferulic Acid and Gelucire Formulations

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Field Emission Scanning Electron Microscopy (FESEM) study was conducted on ferulic acid powder and Gelucire 50/13 (crushed). Briefly, sample was placed on a copper stub using a double-sided adhesive tape. Then the sample was sputter-coated with gold for 120 s at 20 mA and analyzed in FESEM (JEOL JSM-6700F, Japan) at 5 kV excitation voltage. Cryogenic FESEM (cryo-FESEM) technique was used to investigate the morphology of the nanocapsules. Cryo-FESEM is expected to analyze the liquid samples close to their original state32 (link). For this, two–three drops of the nanosuspension were placed on a copper rivet and inserted in the liquid nitrogen chamber at −196 °C to freeze the sample. The frozen sample was quickly shifted into the cryo preparation chamber (Alto CT2500, Gatan, UK) under vacuum and freeze fractured with a knife at −95 °C on a cryo stage. The sample was sputter coated with platinum for 180 s and transferred into the specimen stage of the cryo-FESEM (JEOL JSM-6700F, Japan) at −140 °C. The sample was then analyzed at an excitation voltage of 5 kV.
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4

Nanofillers Dispersion in PLA Analyzed

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The dispersion state of the nanofillers within the PLA was investigated by means of a field emission SEM apparatus JSM-6700F (JSM-6700F, Jeol, Akishima, Japan) on ad-hoc fractured, etched and gold-sputtered specimens as already reported in Spinelli et al. [24 (link)] and here, for the sake of clarity and completeness, briefly outlined in Figure 3.
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5

Comprehensive Analysis of Copper Tube Corrosion

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All tubes were cut in the axial direction for visual inspection. The pit cross-section was observed with an SM (SZ61, OLYMPUS, Tokyo, Japan) to determine the pit structure. For the microstructural analysis, the inner surface of the tubes was etched for 1 min in an alcoholic ferric chloride solution (10 g FeCl3, 50 mL HCl, and 100 mL ethanol) after fine polishing. The tube microstructures were analyzed using an OM (DM2500, Leica, Wetzlar, Germany) to identify the metallurgical impurities and precipitates. The surface morphology was observed through SEM (JSM-6700F, JEOL Ltd., Tokyo, Japan). The surface components were analyzed through EPMA (JXA-8530F, JEOL Ltd., Tokyo, Japan). In addition, EDS (JSM-6700F, JEOL Ltd., Tokyo, Japan) was conducted to compare the surface component differences between the pit-out and pit-in regions. The positive static ToF-SIMS (ToF-SIMS V, ION-TOF, Münster, Germany) was conducted to analyze the molecular and elemental compositions of the surfaces of the leaking copper tubes. The ToF-SIMS spectra were obtained using a pulsed 30 keV Bi+ primary ion source over a 300 μm × 300 μm area. The XRD (SmartLab, Rigaku, Tokyo, Japan) measurements were performed to identify the corrosion product. The XRD analysis was conducted with a Cu Kα radiation source. The wavelength was approximately 1.54 Å in the 2θ range of 5–90° at a 0.02°/s scan rate.
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6

Scaffold Characterization and Bioactivity

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The phase composition of the scaffold was analyzed using X-ray diffractometry (XRD; Bruker D8 SSS, Karlsruhe, Germany) performed at 30 kV, 30 mA, and scanning speed of 1°/min. The morphology of the scaffold was coated with gold and then examined under a scanning electron microscope (SEM; JSM-6700F, JEOL, Tokyo, Japan) that operated in the lower secondary electron image (LEI) mode at an accelerating voltage of 3 kV. In order to analyzed the bioactivity of scaffolds, the specimens were soaked in Dulbecco’s modified Eagle medium (DMEM, Invitrogen, Waltham, CA, USA) containing 10% FBS. After immersion for one day, the scaffolds were removed from DMEM, and the Ca, Si, O, and P on the scaffold surface were investigated by energy dispersive spectroscopy (EDS; JSM-6700F, JEOL).
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7

Characterization of MWCNT Suspension Stability

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According to the manufacturer's product datasheet, the MWCNTs were produced via a catalytic chemical vapor deposition process and purified to over 90%, with the major impurities being the metals Al (~2.3 wt%), Fe (~0.7 wt%), and Mo (~0.15 wt%). They had diameters of 10–15 nm, an average length of 20 μm, and a bulk density of 0.035 g/mL (Figure 1). The particle size and Zeta potential of the MWCNTs were characterized using dynamic light scattering (DLS; Zetasizer nanoseries, nano-zs90, Malvern Instruments, Worcestershire, UK). To analyze the suspension stability index of the MWCNTs, the ultraviolet- (UV-) absorbance (λ = 550 nm) was measured using a UV-vis spectrophotometer (Lambda 25, PerkinElmer, MA, USA). The suspension stability index of the MWCNTs at 100 mg/L (100 μg/mL) is expressed as the % of the initial absorbance (λ = 550 nm) at time 0 for MWCNTs suspended in water for 42 and 72 h after dispersion (Figure 2). The morphology of the MWCNTs was investigated using scanning electron microscopy (SEM; JEOL JSM 6700F, JEOL, Tokyo, Japan) (Figure 1(a)) and transmission electron microscopy (TEM; FEI Tecnai 20, 200 kV, FEI, Hillsboro, OR, USA) (Figure 1(b)).
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8

Comprehensive Characterization of Corn Straw

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X-ray diffraction patterns of samples were measured with X-ray diractometer (Siemens D5000, Munich, Germany) with nickel-filtered Cu K radiation (λ = 0.15406 nm) at 4° min−1. Raman spectra was tested on a Renishaw inVia instrument (wavenumber range: 200–2000 cm−1, λ = 514 nm). Thermogravimetric analysis (TGA) of corn straw was accomplished on Q500 thermogravimetric analyzer (TA Instruments, New Castle, PA, USA) at a scanning rate of 5 °C min−1 from 20 °C to 800 °C under N2 atmosphere. The specific surface area and pore diameter were carried out using nitrogen adsorption–desorption measurements (Micromeritics, ASAP2420, Micromeritics Instrument, Norcross, GA, USA). The morphology of samples was characterized by scanning electron microscopy (SEM, JEOL-JSM-6700F, JEOL Ltd, Tokyo, Japan) and transmission electron microscopy (TEM, JEM-2100F, JEOL Ltd, Tokyo, Japan). The superficial area and pore size distribution of the carbons were observed through Micromeritics ASAP2420.
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9

Comprehensive Material Characterization Protocol

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FTIR spectra were obtained on a Bruker TENSOR 37 (Bruker, Ettlingen, Germany), with the wavenumber ranging from 4000 to 400 cm−1 and resolution of 4 cm−1. The surface morphology was characterized by field-emission scanning electron microscopy (SEM) (JEOL JSM-6700F, JEOL, Ltd., Tokyo, Japan). TG experiments were carried out on a Netzsch STA-449C thermal analysis system (Netzsch Corporation, Selb, Germany). The samples of about 3 mg were heated at a heating rate of 10 K/min from room temperature to 773 K under N2 atmosphere. The X-ray photoelectron spectroscopy (XPS) (ESCALAB 250, Thermo Electron, Altrincham, UK) was performed with a monochromatic AlKα radiation source and a hemisphere detector with an energy resolution of 0.1 eV. All core-level spectra were referenced to the C1s neutral carbon peak at 284.5 eV and obtained at a take-off 90° to the sample surface. The specific surface area was determined by N2 adsorption isotherm at 203 K, using an ASAP 2010 Micromeritics instrument and by Brunauer−Emmett−Teller (BET) method (Micromeritics Instrument Corporation, Norcross, GA, USA).
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10

Characterization of Bi2S3-MoS2 Heterostructure

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The crystallinity and purity of the resulting products were assessed by X-ray diffraction (XRD, Bruker D8 Advance diffractometer) equipped with Cu Kα radiation (λ = 1.5418 Å). Field emission scanning electron microscopy (FESEM, JEOL-JSM-6700F) was employed to investigate the morphologies of the synthesized samples, equipped with an energy dispersive X-ray spectroscopy (EDS). For detailed insight into the 2D-layered MoS2 coated Bi2S3, Transmission Electron Microscope (TEM) and high resolution transmission electron microscopy (HRTEM) studies were analyzed at the accelerating voltage of 200 kV. X-ray photoelectron spectroscopy (XPS, RBD upgraded PHI-5000C ESCA system, Perkin-Elmer) measurements were carried out with Mg-Kα radiation (hν = 1253.6 eV). Raman spectroscopy experiments were implemented by Jobin-Yvon LabRAM HR 800 micro-Raman spectrometer using a 532 nm line from a He-Cd laser. The absorption spectra have been obtained using the PerkinElmer Lambda 950 spectrophotometer in dilute solution. The specific surface area were calculated by the Brunauer-Emmett-Teller (BET) method (TriStar II 3020, America).
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