S 4800 electron microscope
The S-4800 electron microscope is a high-resolution scanning electron microscope (SEM) manufactured by Hitachi. The core function of this instrument is to provide detailed imaging and analysis of samples at the nanoscale level through the use of a focused electron beam.
Lab products found in correlation
32 protocols using s 4800 electron microscope
XRD and SEM Characterization of Reaction Precipitates
Characterizing Multilayer Film Thickness
Characterization of Porous Materials
Solid-state 31P magic angle spinning (MAS) NMR experiments were performed on a Varian VNMRS 400 MHz (9.4 T) spectrometer using a 3.2 mm Varian T3 HXY MAS probe. Single pulse experiments were carried out with a spinning rate of 20 kHz, a 90° excitation pulse of 3 μs, a recycle delay of 30 s and 100 kHz spinal-64 1H decoupling. 200 transients were recorded. The 31P chemical shift was determined using an external reference, hydroxyapatite Ca10(PO4)6(OH)2, at 2.8 ppm (with respect to H3PO4, 85 wt % in water).
SEM Analysis of FeAg2@MOF
carried out for
Data was analyzed with QUANTAX 400.
Optimizing Solvent Evaporation in Microparticle Synthesis
Morphological Characterization of Microparticles
Multimodal Characterization of Materials
E. coli Morphological Changes by SibaCec
Preparation and Imaging of Transgenic Mouse Embryo Heads
Ultrastructural Analysis of Particulated Cartilage
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