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Titan g2 60 300

Manufactured by Thermo Fisher Scientific
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The Titan G2 60–300 is an analytical instrument designed for high-resolution transmission electron microscopy (HRTEM) applications. It features a stable and high-resolution electron optical system capable of operating within an accelerating voltage range of 60 to 300 kilovolts. The Titan G2 60–300 is intended for researchers and scientists who require advanced imaging and analytical capabilities for materials science, nanotechnology, and related fields of study.

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65 protocols using titan g2 60 300

1

Characterization of Ag-CdS Icosapods

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Powder XRD patterns of the dried samples were recorded on Bruker D8 diffractometer at a scanning rate of 2° min−1 using Cu Kα radiation (λ = 1.5406 Å). XPS and UPS spectra were recorded on the ESCALAB 250Xi (Thermo Fisher Scientific) system. The XPS results were calibrated with the reference C 1s peak located at 284.6 eV. The X-ray absorption fine structure (XAFS) experiments under transmission mode were performed at the 7-BM of the National Synchrotron Light Source II (NSLS-II) which is using a channel-cut monochromator. The NSLS-II is rung at 400 mA electron beam current under top-off mode. Samples for SEM and TEM characterizations were prepared by dropping nanomaterial dispersions in toluene on a silicon substrate and amorphous carbon-coated copper grid, respectively. SEM images were obtained using FESEM, JEOL JSM-7800F. TEM characterization was performed with a JEOL JEM-2100 and FEI TF20 operated at 200 kV. Dark-field STEM, Cs-HAADF STEM, and elemental mapping images were obtained using FEI Titan G2 60-300 operated at 300 kV as well as a JEM-ARM200F operated at 200 kV. The 3D reconstruction of Ag-CdS icosapods was carried out using FEI Titan G2 60-300 operated at 60 kV.
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2

Structural Analysis of MELR-HOCl-CDS Hydrogel

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The morphology and structure of MELR and HOCl-CDS hydrogel were assessed by TEM. The hydrogel was diluted (1:100) with ultrapure water, deposited (10 μL) on the surface of fresh copper grids for 2 min, and negatively stained with phosphotungstic acid (5 %) for 30 s. After air-drying, the hydrogel grids were subjected to TEM (Titan G2 60–300, FEI Company, OR, USA).
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3

Comprehensive Material Characterization

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The morphologies and surface characteristics of these samples were observed by scanning electron microscopy (SEM, Merlin Compact, Carl Zeiss NTS GmbH, Oberkochen, Germany). The crystallinity, purity and composition were examined by X-ray diffraction (XRD, Smartlab, Rigaku Corporation, Tokyo, Japan) with Cu-Kα1 radiation (λ = 0.15406 nm). The internal microstructures, crystal planes and element distribution of the samples were analyzed by transmission electron microscope (TEM, Titan G260-300, FEI, Hillsboro, OR, USA), high-resolution TEM (HRTEM) and energy-dispersive X-ray spectroscopy (EDS). Furthermore, the research of oxygen species in the samples and the study of valence states of Pt, Co and Sn were carried out by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Thermo Scientific K-Alpha, Waltham, MA, USA) with a mono Al Kα (1486.6 eV, 6 mA × 12 kV).
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4

Multi-Modal Spectroscopic Characterization of MoS2 Films

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Raman and PL spectroscopy were conducted using a Horiba LabRAM HR instrument with a laser wavelength of 532nm. Raman imaging was performed using a WiTec alpha300R system with a 532 nm light source (333 nm spot size) and a spectral resolution of +/−1 cm−1. X-ray photoelectron spectroscopy (XPS) characterization was conducted using a Kratos AXIS ULTRADLD XPS system equipped with an A1 Kα monochromatic X-ray source and a 165 mm mean radius electron energy hemispherical analyzer along with a vacuum pressure of 3 × 10−9 Torr. FTIR measurements were taken using a Nicolet 6700 FTIR system having ATR accessory with a resolution of 0.500 cm−1. Scanning transmission electron microscopy (STEM) imaging of the MoS2 films were conducted using a FEI Titan G2 60–300 X-FEG aberration-corrected and STEM equipped system with a CEOS DCOR probe corrector. ADF-STEM images (2048 × 2048 pixel2) were acquired on the STEM operating at 200 keV using a dwell time of 3–6 µs per image pixel at a camera length of 130 mm. The beam convergence angle αobj was measured to be 23 mrad. The ADF detector inner and outer angles of collection were measured to be 54 mrad and 317 mrad, respectively. Under these conditions, the measured probe size was ~0.8 Å.
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5

Structural and Optical Characterization of Nanoparticles

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The crystalline structures of the synthesized nanoparticles were detected using an X-ray diffractometer (XRD, DX-2700, China). The Raman spectra were determined using MultiRAM Raman spectroscopy (Bruker Corporation, Raman, Italy). The chemical states of the samples were determined using X-ray photoelectron spectroscopy (XPS, Escalab 250Xi, USA). The morphology, microstructure and particle size of the synthesized nanoparticles were measured using an SEM (HITACHI S4800, Tokyo, Japan) and a transmission electron microscope and high-resolution transmission electron microscopy (TEM and HRTEM, FEI Titan G2 60-300, USA) equipped with energy dispersive X-ray (EDX) spectroscopy. The optical absorption ranges of the samples were ascertained using UV-vis diffused reflectance spectroscopy (UV-vis DRS, Agilent cary 5000, USA).
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6

Structural Characterization of Thin Films

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Selected films were investigated using TEM. The instrument used for this characterization was a probe corrected FEI Titan G2 60–300 operated at 300 kV in scanning TEM mode (STEM). Cross section TEM samples were prepared by focused ion beam (FIB) milling on a JEOL JIB-4500 dual beam system. The surface morphology and coverage of the films were characterized using optical microscopy and scanning electron microscopy (SEM, Hitachi TM3000 & JEOL JIB-4500).
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7

Iodine Atomic Positions in MSP20 Electrodes

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Scanning Transmission Electron Microscopy (STEM) was performed on an aberration corrected FEI Titan G2 60–300, operated at 300 kV. The microscope was equipped with a SuperX EDX spectrometer. The sample preparation of a MSP20 electrode (cycled at 2 mV s−1/−0.2–0.6 V) and removed at 0.6 V was performed with ultramicrotomy after embedding in epoxy (Epofix, Struers, Germany). Ultrathin sections (<70 nm) were produced on the Leica Ultramicrotome UC6 (Leica Microsystems, Vienna, Austria) equipped with a 45° diamond knife (Diatome, Biel, Switzerland). After cutting, the thin sections were transferred to Quantifoil R3/3 TEM grids. Data acquisition and analysis were performed using the Gatan Digital Micrograph (GMS) Suite (v3.42, https://www.gatan.com/products/tem-analysis/gatan-microscopy-suite-software, accessed on: 3 April 2022). For determination of the iodine atomic positions the STEM HAADF, images were background corrected by subtracting a 128 times binned and subsequently rescaled copy of the corresponding.
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8

Synthesis and Application of DNA-AgNCs

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AgNO3 (99.99%), NaBH4 (98%) and KNO3 were purchased from Sigma-Aldrich. A novel DNA sequence of 5′-GGTTGGTGTGGTTGGATCCCCCCCCCCCC-3′ was synthesized by Shanghai Sangon Biotechnology Co. Ltd. (Shanghai, China). 5′-CCCCCCCCCCCC-3′(dC12) was the scaffold for synthesis of AgNCs and 5′-GGTTGGTGTGGTTGG-3′ was the K+ ions aptamer which was widely used in a great deal of researches30 (link), 31 (link). A concentration of 20 mM phosphate-buffered (PB) was used throughout the experiments. Other reagents were of analytical grade and used without further purification. All stock solutions were prepared with double-distilled water filtered by Milli-Q (Millipore, Billerica, MA).
All fluorescence measurements were recorded on a fluorescence spectrophotometer (Hitachi, F-4600) using a 350 μL quartz cell. The emission spectra of DNA-AgNCs were recorded from 400 nm to 750 nm. Both the emission and the excitation slits were set to 10 nM, the scanning speed was 240 nm min−1. The UV−vis absorption spectra were obtained on an UV−vis spectrophotometer (Shimadzu, UV-2450). The prepared DNA-AgNCs was analyzed by using a Titan G2 60–300 transmission electron microscope (TEM, FEI, USA). Estimation of the concentration of K+ levels was carried out using the automatic biochemistry analyzer instrument (Japan, HITACHI 7060).
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9

Physicochemical Characterization of Nanomaterials

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The hydrodynamic size and zeta potential (ζ) were measured by dynamic light scattering (DLS) analysis using Malvern Zeta Sizer Nano series (Nano ZS, Malvern instruments, Malvern, UK). The morphology and elements distribution were determined by TEM-EDX instrument (Titan G2 60–300, FEI, Waltham, MA, USA). The thickness was examined by atomic force microscope (AFM, Bruker, Madison, Waltham, MA, USA). The surface elemental composition was examined by X-ray photoelectron spectroscopy (XPS, ThermoFisher-VG Scientific, ESCALAB250Xi, Madison, Waltham, MA, USA). The UV–Visible absorbance spectra were measured by UV–Visible spectrophotometer (UV2450, Shimadzu, Tokyo, Japan). The loading capacity (LC, %) of Ce6 was calculated by the Ce6 characteristic absorption peak at 404 nm using UV–Visible spectrophotometer. The LC (%) of CisPt on GO was determined using an ophenylenediamine (OPD) method47 .
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10

Characterization of PTFCG Nanoparticles

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The particle sizes and potential of PTFCG, PTFCG@M and PTFCG@MH were measured by a Malvern Zeta Sizer Nano series (Malvern, UK) at 25C. The morphologies and element content were investigated by TEM-EDS (Titan G2 60300, FEI, USA). For TEM-EDS analysis, the PTFCG or PTFCG@MH solution was dropped onto carbon film-coated copper grid and observed under TEM-EDS instrument. The UVvis absorption spectra were carried out on UVvisible spectrophotometer (Shimadzu, Japan). The fluorescence spectra were collected using FL-2700 spectrofluorometer (HITACHIH). The Ce6 concentration was determined by the UVvisible spectra spectrophotometer at 640nm. The loading amount of GOx was estimated using bicinchoninic acid (BCA) protein assay (Beyotime) and the protocol was provided by the supplier. The drug loading (DL) of Ce6 and GOx in the PTFCG@MH was calculated as follows:
DL=amount of loaded drug in the PTFCG@MH/weight of PTFCG@MH(g/mg).
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