Ht7700 exalens microscope
The HT7700 Exalens microscope is a high-performance laboratory equipment designed for detailed imaging and analysis. It offers advanced optical capabilities to provide clear, detailed images of various samples. The core function of the HT7700 Exalens is to enable precise observation and examination of specimens.
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12 protocols using ht7700 exalens microscope
Visualization of DNA-Thiacalixarene Interaction
Transmission Electron Microscopy Imaging
Transmission Electron Microscopy of Samples
Nanomaterial Characterization by DLS and TEM
Transmission electron microscopy (TEM) images were obtained at the interdisciplinary center “Analytical microscopy” of Kazan Federal University, using a Hitachi HT7700 Exalens microscope (Tokyo, Japan). The images were acquired at an accelerating voltage of 100 kV. Samples were dispersed on 300 mesh 3 mm copper grids (Ted Pella, Redding, CA, USA) with continuous carbon-formvar support films.
Synthesis and Characterization of Magnetic Nanoparticles
Transmission electron microscopy (TEM) and the related high-resolution TEM (HRTEM) images were performed on a FEI Tecnai G2 F20 microscope (accelerating voltage, 200 kV) and a Hitachi HT7700 Exalens microscope (accelerating voltage, 120 kV). The X-ray powder diffraction (XRD) patterns of the nanoparticles were acquired on a D/MAX-Ultima VI X-ray powder diffractometer (Rigaku Co., Japan). The X-ray absorption spectra (XPS) were conducted at an Escalab 250Xi X-ray photoelectron spectrometer (Thermo Scientific). The hysteresis loops at 300 K were recorded by the superconducting quantum interference device (SQUID). Dynamic light scattering (DLS) were measured by Zetasizer Nano ZS (Malvern Instruments Ltd., England). The measurement of relaxivity and phantom imaging at 0.5 T were all performed on an NMI20-Analyst system. In vivo MRI were performed on 7 T micro MRI System. The concentrations of metals were measured by inductively coupled plasma mass spectroscopy (ICP-MS) on an iCAP RQ system (Thermo Fisher).
TEM Imaging of Dispersed Samples
TEM Analysis of Materials
Nanoparticle Characterization Techniques
Characterization of Nanoparticle Properties
Transmission electron microscopy (TEM) images were obtained using a Hitachi HT7700 Exalens microscope, Japan. The images were acquired at an accelerating voltage of 100 keV. Samples were dispersed on 300 mesh 3 mm copper grids (Ted Pella) with continuous carbon formvar support films.
Electrochemical Sensing with MOFs
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