Cells cultured on the transwell membrane were fixed and processed for electron microscopy. A JSM-7610F scanning electron microscope (JEOL USA, Inc., Peabody, MA, USA) was used to obtain the scanning electron micrographs.
Jsm 7610f scanning electron microscope
Manufactured by JEOL
Sourced in United States, Japan
The JSM-7610F is a scanning electron microscope (SEM) designed and manufactured by JEOL. The SEM utilizes a focused electron beam to scan the surface of a sample, producing high-resolution images that reveal the sample's topography and composition. The JSM-7610F is capable of providing detailed information about the microstructure and properties of a wide range of materials.
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Lab products found in correlation
Jem 1400 plus tem, by JEOL (1 mentions)
Model 744, by Metrohm (1 mentions)
Rf 5301pc luminescence spectrometer, by Shimadzu (1 mentions)
Energy dispersive x ray spectrometer, by JEOL (1 mentions)
1260 hplc, by Agilent Technologies (1 mentions)
Jem 2100 transmission electron microscope, by JEOL (1 mentions)
Amazon sl ion trap mass spectrometry, by Bruker (1 mentions)
Avance 400 nmr spectrometer, by Bruker (1 mentions)
Tensor 27 ft ir spectrophotometer, by Bruker (1 mentions)
Escalab 250xi, by Thermo Fisher Scientific (1 mentions)
X ray diffraction analyzer, by Rigaku (1 mentions)
Axis ultra, by Shimadzu (1 mentions)
Axs d8 advance, by Bruker (1 mentions)
Sta449f5 qms403d instrument, by Mettler Toledo (1 mentions)
Vertex70 ir spectrometer, by Bruker (1 mentions)
8 protocols using jsm 7610f scanning electron microscope
1
Scanning Electron Microscopy of Transwell Cultured Cells
2
Visualizing Yeast Cell Structure with SEM and TEM
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Preparation of isolated yeast after growing in PR extract according to Afrikian et al., (1973). Scanning Electron Microscopes (SEM): The effect of PR extract on structure of vegetation yeast cells after growing in PR extract according to Bozzola and Russell (1999) . Examination of the yeast cells was carried out by using JEOL JSM-7610F Scanning Electron Microscope at magnification of 900×, 8000×, 10,000×, 16,000× and 20,000×.
Transmission Electron Microscopes (TEM): The Effect of PR extract on structure of vegetation yeast cells after growing in PR extract (Bozzola and Russell 1999 ). Examination of the yeast cells was carried out by using JEOL JEM-1400plus TEM at magnification of 20000×, 30000×, 40000×, 50000× and 60000×.
Transmission Electron Microscopes (TEM): The Effect of PR extract on structure of vegetation yeast cells after growing in PR extract (Bozzola and Russell 1999 ). Examination of the yeast cells was carried out by using JEOL JEM-1400plus TEM at magnification of 20000×, 30000×, 40000×, 50000× and 60000×.
3
Synthesis and Characterization of Al2O3 Nanoparticles
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An RF-5301pc luminescence spectrometer (Shimadzu, Kyoto, Japan) was used for all spectrofluorometric measurements. The slit widths for both the excitation and emission monochromators were set at 5 nm, which was used to conduct all spectrofluorometric measurements. The outcomes were controlled by a PC and data gathering was performed using FI Winlab software (version 4.00.03). A pH-meter Metrohm model 744 (Metrohm Co., Herisau, Switzerland) was used to regulate the pH of the samples under investigation. Throughout the experiment, deionized water was utilized, and it was obtained via Lonenaustausscher, SG, Germany. Several techniques were applied to reveal the synthesis of Al2O3NPs, including Shimadzu-spectrophotometer-2600i (Kyoto, Japan), Perkin-Elmer-spectrometer (Waltham, MA, USA), 6000-X-ray Shimadzu diffractometer (Kyoto, Japan), JSM-7610F scanning electron microscope (SEM, Tokyo, Japan), energy-dispersive X-Ray spectrometer (EDX, Tokyo, Japan), transmission electron microscope (TEM, JEOL Ltd., Tokyo, Japan).
4
Multimodal Characterization of Nanomaterials
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1260 HPLC (Agilent Technologies Co., Ltd, MA); AmaZon SL ion trap mass spectrometry (Bruker Daltonik GmbH Co., Ltd, Bremen); 5C18-PAQ (4.6 (ID) × 250 (mm)) chromatography column (Cosmosil, Japan); incubator (QYC-2102C, CIMO Instrument Manufacturing Co., Ltd. Shanghai, China); microplate reader (DNM-9606, Perlong Medical Equipment Co., Ltd. Beijing, China); D8 Advance XRD characterisation (Bruker, Germany); JSM-7610F scanning electron microscope (JEOL Ltd. Japan); MPMS3 Magnetic properties (Quantum Design); VERTEX 70 infrared spectra (Bruker, Germany); JEM-2100 transmission electron microscope (JEOL Ltd. Japan).
5
Comprehensive Characterization of Synthesized Materials
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FTIR spectra were recorded using a Bruker Tensor 27 FTIR spectrophotometer and the conventional KBr plate method; 32 scans were collected at a resolution of 4 cm–1. Solid state NMR spectra were measured using a Bruker Avance 400 NMR spectrometer and a Bruker magic-angle-spinning (MAS) probe, running 32,000 scans. Mass spectra were recorded using a Bruker Solarix spectrometer. TGA was carried out by the utilizing of a TA Q-50 apparatus under N2 gas stream. The Pt cell was packed and sealed with the tested samples and subjected to heat from 40 to 800 °C at a heating average of 20 °C min–1 under N2 atmosphere at a stream average of 50 mL min–1. Specific surface areas and porosimetry investigations of the synthesized samples (ca. 20–100 mg) were carried by the utilization of a Micromeritics ASAP 2020 Surface Area and Porosity technique. The gradual exposition of the tested samples to N2 gas (up to ca. 1 atm), in a bath of liquid N2 (77 K) led to the generation of adsorption-desorption isotherms. A JEOL JSM-7610F scanning electron microscope was used to afford SEM morphology by subjecting the samples to Pt sputtering for a period of 100 s before the final observation. A JEOL-2100 scanning electron microscope was used to accomplish TEM analysis, that operated at 200 kV.
6
Hydrogel Internal Structure Analysis
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To observe the internal structure of the hydrogel, lyophilized hydrogels were sliced horizontally to expose the internal structure. Then the samples were coated with platinum/palladium and observed with a JSM-7610F Scanning Electron Microscope (JEOL USA Inc., USA) at 10 μA and 10 kV.
7
Comprehensive Catalyst Characterization Protocol
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PXRD was measured using an X-ray diffraction analyzer produced by Rigaku Corporation of Japan. SEM experiments were carried out using JSM-7610F scanning electron microscope combined with EDS produced by JEOL to analyze the morphology and structure of the catalyst surface. The Thermo ESCALAB 250XI was used for XPS analysis, with the X-ray source at 150 W, the Al Kα radiation at 1486.6 eV, the pass energy of 46.95 eV, and binding energy precision within ± 0.3 eV. The C 1s line at 284.6 eV was introduced as a reference. The N2 adsorption isotherms of MCDx was tested by a Maxon Tristar II 3020 micropore-size analyzer (Micromeritics, Norcross, GA, USA). The samples were vacuum degassed at 350 °C for 10 h and then the surface areas and the pore-size distributions were measured according to the BET plot linear portion. FTIR experiments were carried out by Tensor27 Fourier transform infrared analyzer produced by Burker Company, Germany to analyze the phase species and surface groups of the catalyst. TGA experiments were tested using a microcomputer differential thermal balance HTC-4 produced by Beijing Hengjiu to test the thermal stability of the catalysts.
8
Characterization of Mo-Ru-Na-Cs Compounds
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All reagents used were of commercial reagent grade, and were used without further purification for the preparation of the title compound. Elemental analysis of Mo, Ru, Na and Cs atoms was conducted on a Perkin Eimer Optima 2100 DV inductively coupled plasma optical emission spectrometer (Perkin-Elmer, 940 Winter Street Waltham, MA, USA). IR spectra were recorded on a Bruker VERTEX 70 IR spectrometer (Nicolet, Madison, WI, USA) in the range of 4000‒450 cm−1 with pressed KBr pellets. XRPD data were performed on a Bruker AXS D8 Advance diffractometer (Bruker, Karlsruhe, Germany) with Cu Kα radiation in the angular range 2θ = 5°–45° at room temperature. TG analysis was measured on a NETZSCH STA449F5/QMS403D instrument (Mettler-Toledo, Sonnenbergstrasse 74, Schwerzenbach, Switzerland) with a heating rate of 10 °C·min−1 in flowing nitrogen. Energy-dispersive X-ray spectroscopy (EDX) measurements were performed with a JSM-7610F scanning electron microscope (JEOL, Tokyo, Japan) using an OXFORD X-act EDX. X-ray photoelectron spectroscopy (XPS) was performed on an Axis Ultra (Kratos, Manchester, UK) X-ray photoelectron spectroscope using monochromatic Al Kα (1486.7 eV) radiation.
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