The surface morphology of the above samples was characterized by a S-8220 scanning electron microscope (SEM, Hitachi, Tokyo, Japan) with an accelerating voltage of 5.0 kV. The chemical composition of nanostructures was determined by an energy-dispersive X-ray spectroscope (EDS, Bruker, Karlsruhe, Germany) attached to the SEM. The atomic force microscope (AFM) images were obtained in contact mode with a Multimode 8 atomic force microscope (Bruker, Karlsruhe, Germany). The crystalline structures of all samples were analyzed with a D8 Advance X-ray diffractometer (XRD, Bruker, Karlsruhe, Germany) using Cu Kα radiation (λ = 1.54 Å) at a voltage of 40 kV. X-ray photoelectron spectroscopy (XPS), with 200 W monochromatic Al Kα radiation, was performed, utilizing Thermo Scientific’sESCALabXi+ (Thermo Fisher, Waltham, MA, USA). Raman analyses were performed on a RenishawinVia9 (Renishaw, London, UK), using 532 nm laser irradiation, with a 50× objective focusing the laser beam onto a spot with a diameter of about 1 µm, and the collection time for each sample was about 5 s.
S 8220
Manufactured by Hitachi
Sourced in Japan
The S-8220 is a scanning electron microscope (SEM) manufactured by Hitachi. It is designed for high-resolution imaging and analysis of a wide range of materials. The S-8220 provides detailed information about the surface topography and composition of samples at the nanometer scale.
Automatically generated - may contain errors
Lab products found in correlation
Multimode 8 atomic force microscope, by Bruker (1 mentions)
Renishawinvia9, by Renishaw (1 mentions)
Asap 2420 4, by Micromeritics (1 mentions)
Nexion 300x, by PerkinElmer (1 mentions)
S 4800, by Hitachi (1 mentions)
Vhx 5000, by Keyence (1 mentions)
Tecnai g2 f20 u twin, by Thermo Fisher Scientific (1 mentions)
4 protocols using s 8220
1
Comprehensive Structural Characterization of Nanomaterials
2
Characterization of UiO-66 Nanostructures
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Scanning electron microscopy measurements were performed on a Hitachi S-8220 scanning electron microscope operated at 8 kV. Powder XRD patterns were recorded on D/MAX-TTRIII (Cross Beam Optics) with Cu Kα radiation (λ = 1.542 Å) operating at 40 kV and 200 mA. N2 adsorption-desorption isotherms were obtained using BET (Brunauer-Emmett-Teller) instrument (ASAP 2420-4, Micromeritics) at 77 K in high vacuum. The samples were degassed at 120°C for 16 hours before the measurement. The XPS measurements were carried out on an ESCALAB250Xi spectrometer at a pressure of 3 × 10−9 mbar using Al Kα as the excitation source (hν = 1486.6 eV) and operated at 15 kV and 20 mA. FTIR spectra were recorded on a Spectrum One spectrometer in the spectral range of 400 to 4000 cm−1 using the KBr disk method. NH3-TPD was performed on an Autochem II 2920 chemisorption analyzer. The contents of Zr sites in UiO-66 were determined by inductively coupled plasma mass spectrometry (NexION 300X, PerkinElmer). NMR spectra were tested using a 400-MHz NMR spectrometer (AVANCE III HD 400). TGA measurements were made with a Stanton Redcroft TGA, in which the samples were loaded in a platinum crucible. Samples were heated to 900°C at a rate of 10°C min−1 under a constant and simultaneous flow of both N2 (20 ml min−1) and O2 (5 ml min−1).
3
Comprehensive Material Characterization Protocol
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A scanning electron microscope S-8220 (SEM, Hitachi, Japan) was used to characterize the surface structural and morphological aspects of all samples in the experiment. The samples’ crystal structures were studied using D8 Advance X-ray diffraction (XRD, Bruker, Germany). The elemental composition of the sample surface was analyzed using X-ray photoelectron spectroscopy (XPS) with an ESCALabXi+ from Thermo Electron. The elemental composition of the sample surface was analyzed using Al Kα (1486.6 eV) radiation as the X-ray source with a power of 150 W at a minimum of 10−9 Torr or lower pressure conditions. Raman spectra were collected on a RenishawinVia9 (Renishaw, UK) with 785 nm laser excitation. A 50× objective was used to focus on the sample surface, and the collection time was about 15 s. A Theta Flex optical contact angle meter (Biolin, China) with 4 μL water droplets was used to determine the water contact angle (WCA).
4
Chiral Polyaniline Nanoribbon Formation
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
As-prepared chiral polyaniline (0.1 mL) was first diluted in 1.8 mL of good solvent in a test tube in the presence of a uniaxial stretched polypropylene (PP) template. Then, 2.2 mL of poor solvent methanol was added into the above solution. The mixture was vigorously shaken for 1 min and left to stand for days for self-assembly. As-prepared PANI membrane adhere to the PP template was peeled down in THF into the flat macro stripe, and the stripe transformed into a helical macroribbon in THF/iPrOH co-solvents. These macrostructures were recorded by optical microscopy (VHX-5000, Keyence). The stripe or ribbon was transferred on silicon wafer or carbon-coated copper grid for SEM (S-4800 or S-8220, Hitachi, Japan), AFM (M-Pico, Multimode Veeco), TEM and SAED (Tecnai G2 F20U-TWIN, FEI Co., USA) characterization. Dried samples transferred on copper grid and stripes immersed in the solvents of THF and iPrOH in quartz capillaries were used for WAXS characterization, respectively (Xeuss small-angle and wide-angle X-ray scattering system with Xenocs Cu Kα X-ray source GeniX Cu ULD and Dectris 100 K Pilatus). The ribbon dispersed in co-solvent with different ΦiPrOH were characterised by CD and UV-vis-IR spectra.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!