Vk x200 series
The VK-X200 series is a 3D laser scanning microscope that captures high-resolution 3D images of samples. It features a large measurement range, high-speed data acquisition, and advanced image processing capabilities.
Lab products found in correlation
12 protocols using vk x200 series
Frictional Behavior of Hot-Patterned BMG Surfaces
Characterization of Surface Materials
Surface Topography Characterization of Implants
Density, Hardness, and Stress Analysis of SLM Samples
where ρRe, ρ and ρTh are the relative density, average density value and theoretical density of the material (4.43 g/cm3), respectively.
The microhardness test was conducted on a Future-tech (MH-6) machine (FUTURE-TECH, Tokyo, Japan) according to ASTM E384-17 where the load was 0.5 kg and dwell time was 8 s. We used the X-ray residual stress measurement system μ-X360n (Pulstec, Hamamatsu, Japan) to measure the residual stress of samples. The specimens for tensile testing were prepared in accordance with the GB/T 228.1-2010 standard, and the experiment was conducted at a rate of 0.01 mm/s at room temperature. The model of the machine in this test was Instron 5582 (Instron, Boston, MA, USA). The surface topography of the samples was analyzed using laser scanning confocal microscope (Keyence, VK-X200 series, Osaka, Japan). All of the measurements were conducted at five different locations and each final value of micro-hardness, residual stress and surface roughness was the average of the five tests.
Surface Roughness Analysis of Reduced Films
Fabrication and Characterization of Magnetic Micro-Rafts
Microscopic Analysis of Coagulated Dairy Blends
Violet Laser Scanning Microscopy
Zirconia Topography and Roughness Evaluation
Surface Roughness Characterization of Titanium
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