AFM measurements were carried out on a Nanoscope IV multimode AFM (Veeco Instruments Inc.). Images were generated in the PeakForce QNM (quantitative nanomechanical property mapping) mode with a silicon oxide tip (Olympus microcantilever OTR8 PS-W) having a spring constant of 0.15 N/m and a radius of curvature of <20 nm. AFM imaging was performed at room temperature (~25°C) on freshly cleaved mica surfaces. A liquid flow cell (glass probe holder, MTFML, Bruker Corporation) was used to scan the surfaces in a liquid environment and to exchange solution in situ. All images were recorded at a resolution of 512 × 512 pixels and with a scan rate of 1 Hz. The z-set point and differential gains were manually optimized during each scan. Images were analyzed and processed in the Gwyddion 2.22 software.
Nanoscope 4 multimode afm
Manufactured by Veeco
Sourced in United States
The Nanoscope IV Multimode AFM is a high-performance atomic force microscope designed for advanced surface characterization. It provides precise imaging and measurement capabilities at the nanoscale level. The Nanoscope IV Multimode AFM is a versatile instrument that can be used for a wide range of applications.
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6 protocols using nanoscope 4 multimode afm
1
Quantitative Nanomechanical Mapping of Surfaces
2
Oligomer Morphology Characterization by AFM
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To evaluate the morphology of oligomers, AFM analysis was performed. For this study, the samples were diluted to a final concentration of 10 μM (in double distilled water) and spotted on a freshly cleaved mica sheet for 1 min at room temperature (RT). The mica sheets were then washed with double distilled water and dried in a vacuum desiccator. The imaging was done using Veeco Nanoscope IV Multimode AFM in tapping mode with etched silicon cantilever. Minimum five different areas of three independent samples were scanned with a scan rate of 1.5 Hz.
3
Interfacial Normal Force Measurements
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Interfacial normal
force measurements were acquired continuously
using a Veeco (NY, USA) NanoScope IV Multimode AFM with an EV scanner
in contact mode. All experiments were performed at room temperature
(21 °C) in a sealed, insulated box to exclude external vibrations
and minimize temperature variations. The force profiles presented
had a vertical (normal to the surface/electrolyte interface) scan
size of 50 nm at a scan rate of 0.2 Hz. The atomically smooth Au(111)
surface (a gold film of 300 nm thickness on mica, Georg Albert PVD
– Beschichtungen), AFM probe (NSC36, Micromasch, Estonia; cantilever
force constant of 0.8 ± 0.1 N m–1) and AFM
fluid cell were cleaned with ultrapure water and ethanol, then dried
under a nitrogen stream. The Au(111) surface and AFM probe were also
cleaned with UV-ozone for 15 min prior to use. A WaveNano potentiostat
(Pine Research, NC, USA) was used to measure the open-circuit potential
(OCP) and to apply a negative potential (−1 V vs OCP) to the
Au(111) surface prior to force profile measurements. All experiments
were completed in duplicate on different areas of the surface.
force measurements were acquired continuously
using a Veeco (NY, USA) NanoScope IV Multimode AFM with an EV scanner
in contact mode. All experiments were performed at room temperature
(21 °C) in a sealed, insulated box to exclude external vibrations
and minimize temperature variations. The force profiles presented
had a vertical (normal to the surface/electrolyte interface) scan
size of 50 nm at a scan rate of 0.2 Hz. The atomically smooth Au(111)
surface (a gold film of 300 nm thickness on mica, Georg Albert PVD
– Beschichtungen), AFM probe (NSC36, Micromasch, Estonia; cantilever
force constant of 0.8 ± 0.1 N m–1) and AFM
fluid cell were cleaned with ultrapure water and ethanol, then dried
under a nitrogen stream. The Au(111) surface and AFM probe were also
cleaned with UV-ozone for 15 min prior to use. A WaveNano potentiostat
(Pine Research, NC, USA) was used to measure the open-circuit potential
(OCP) and to apply a negative potential (−1 V vs OCP) to the
Au(111) surface prior to force profile measurements. All experiments
were completed in duplicate on different areas of the surface.
4
Morphology and Size of Nanostructures
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The morphology and the size of the nanostructures were studied by scanning electron microscopy (SEM), using a FEI Nova NanoSEM 450 equipped with a field emission gun. X-ray diffraction (XRD) measurements were performed on a Bruker D8 Advance diffraction spectrometer (Cu Kα1 = 0.15406 nm) with a voltage of 40 kV and an intensity of 40 mA. The zinc oxide layer surface morphology and roughness were determined by AFM using the tapping mode of a Veeco Nanoscope IV Multimode AFM. TEM images were recorded on a JEOL, ARM200CF (Tokyo, Japan), with a nominal point resolution of 0.8 A at Scherzer defocus.
5
Protein Imaging via Atomic Force Microscopy
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For atomic force microscopy, protein samples were spotted on a freshly cleaved mica sheet followed by washing with double distilled water. Immediate after addition, mica was dried in vacuum desiccator. AFM imaging was done in tapping mode under a silicon nitride cantilever using Veeco Nanoscope IV Multimode AFM. Minimum five different areas of three independent samples were scanned with a scan rate of 1.5 Hz.
6
Atomic Force Microscopy of Mycobacterium
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