X-ray diffraction (XRD) pattern of the fabricated PI FPs/TiO2 NPs was measured by a powder XRD system, SmartLab (Rigaku Corp.). Transmission electron microscopy (TEM) images were collected using FEI Tecnai G2 20. Dynamic light scattering (DLS) analysis was performed with DLS-7000 (Otsuka Electronics Co. Ltd.). Line scan elemental analysis was conducted using a scanning electron microscope (SEM, Hitachi S-4800) attached with an energy dispersive X-ray spectroscope (EDX, Bruker X Flash 6|100). For thermogravimetric analysis-differential thermal analysis (TG-DTA) of the as-fabricated material using TG-DTA2000 (Bruker Corporation) was used. UV-vis transmission spectra of ca. 50 μm thick application films, prepared from TiO2 NPs powder (1.4 wt%) or PI FPs/TiO2 NPs powder (7 wt% including 1.4 w% TiO2 NPs)-dispersed in oils used in cosmetics with a mechanical mixer, were collected using a UV-vis spectrophotometer (JASCO V-660).
Tg dta2000
Manufactured by Bruker
Sourced in United States
The TG-DTA2000 is a thermal analysis instrument that simultaneously measures the weight change (Thermogravimetry, TG) and the thermal effects (Differential Thermal Analysis, DTA) of a sample as a function of temperature or time under a controlled atmosphere. It provides quantitative information about physical and chemical changes that occur in materials during heating or cooling.
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2 protocols using tg dta2000
1
Characterization of PI FPs/TiO2 Nanocomposite
2
Characterization of BSMA Particle Size, Morphology, and Texture
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We characterized the particle size and morphology of BSMA by optical microscopy (Super eyes NM-SE02M, NETMATE, Seoul, Korea). The textural properties of samples were characterized by a N2 adsorption-desorption technique at 77 K (Micromeritics ASAP 2020, Micromeritics, Norcross, GA, USA, sorption instrument). We estimated the specific surface area of the samples by the Brunauer-Emmett-Teller (BET) formula and obtained pore size distribution by the Barret-Joyner-Halenda (BJH) method using the adsorption branch of isotherms. Crystalline characteristics of the samples were obtained by X-ray diffraction (XRD) using a Rigaku D/mas–220 diffractometer (Rigaku, Japan) with Cu Kα (λ = 1.5418 Ǻ) radiation. We observed the surface morphologies of the BSMA by scanning electron microscopy (SEM, JSM-6060, JEOL, Tokyo, Japan). The TGA experiment was carried out using a Bruker TG-DTA 2000 instrument (Bruker, Billerica, MA, USA).
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