Ts5136mm
The TS5136MM is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a high-performance electron optical column and advanced detectors, enabling detailed examination of samples at the micro- and nano-scale.
6 protocols using ts5136mm
Comprehensive Characterization of Artificial Rhino Horn
Cell Morphology Characterization in Porous Scaffold
Characterization of Zinc Oxide Nanoparticles
An XRD (D/Max 2550PC, Rigaku, Japan) diffractometer was used for X-ray diffractometry. The reflection-scanning mode was used to record the radical scan while changing 2 θ from 0° to 100°. A pH meter was used to determine the pH of the solution (Metrohm Herisau Digital E 532, Herisau, Switzerland).
Micromorphological Characterization of PET Sheets
Characterization of Titanium-based Biomaterials
Lysostaphin-Loaded Cement Characterization
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