Jsm 6700f fe sem
The JSM-6700F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The JSM-6700F utilizes a field emission electron source to generate a high-brightness, high-resolution electron beam, enabling detailed examination of small-scale features and structures.
15 protocols using jsm 6700f fe sem
Time-Lapse Fmoc-DOPA-DOPA Hydrogel Imaging
Characterization of Iron Oxide Nanoparticles
Scanning Electron Microscopy of Implants
Structural and Optoelectronic Characterization of PbI2 Microplates
HRSEM Imaging of Sample Coatings
Imaging Fmoc-DOPA Self-Assemblies
Graphene-Based Antithrombotic Biomaterials
Fmoc-G-PNA Conjugate Self-Assembly
Amino Acid SEM Imaging Protocol
were dissolved in deionized water at a concentration of 2 mg/mL by
heating to 90 °C followed by gradual cooling of the solutions.
For
dissolved in 1 mL of deionized water. A 5 μL aliquot was allowed
to dry on a microscope glass coverslip at ambient conditions overnight
and coated with Au. SEM images were recorded using a JSM-6700F FE-SEM
(JEOL, Tokyo, Japan) operating at 10 kV.
Polymer Sample Preparation for SEM
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