Sigma sem
The Sigma SEM is a scanning electron microscope (SEM) manufactured by Zeiss. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The Sigma SEM utilizes an electron beam to scan the surface of a sample, generating detailed information about its topography, composition, and other characteristics.
Lab products found in correlation
28 protocols using sigma sem
Scanning Electron Microscopy Characterization
Fly Eye Ultrastructure Analysis Protocol
Ultrastructural Analysis of Neuromuscular Junction
Electron Microscopy Sample Preparation
Comprehensive Physicochemical Characterization
Compositional Analysis of M. bucklandii Dentary
A further, larger sample was taken from the plaster of the ventro-posterior portion of the dentary (M1) to explore the bulk composition of the plaster material. This sample was cut and mounted on a glass microscope slide in order for its composition to be examined via light microscopy and X-ray fluorescence spectroscopy (XRF). XRF imaging was done using a Bruker M4 Tornado at AAMC and the slide was examined under plane-polarized and cross-polarized light using a standard petrological microscope to confirm the results of the analysis.
Imaging Cellular Interactions with Mesoporous Silica Nanoparticles
Specimen Preparation for SEM Imaging
Multimodal Electron Microscopy Imaging
Characterization of Aged Biochar Particles
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