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Asap 2020 v3.00h

Manufactured by Micromeritics
Sourced in United States

The ASAP 2020 V3.00H is a surface area and porosity analyzer designed for the measurement and characterization of a wide range of materials. It utilizes the adsorption of gases to determine the surface area, pore size, and pore volume of solid samples.

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3 protocols using asap 2020 v3.00h

1

Measuring Surface Area and Porosity

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The specific surface area and pore volume were measured following GB/T 19587-2017 [25 ]. Before testing, all samples were dried and cooled to room temperature. The samples were then placed in sample tubes and degassed under vacuum at 100~350 °C. Subsequently, they were moved to the analytical station for nitrogen adsorption experiments. The instrument ASAP 2020V3.00H (Micromeritics Instrument Corporation, Norcross, GA, USA) was employed for measuring the specific surface area and pore volume [26 ].
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2

Structural Characterization of WO3 and Pd-WO3 Nanosheets

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X-ray powder diffraction (XRD) was performed using a Shimadzu XRD-6000 diffractometer with a CuKα1 irradiation over a 2θ range from 10 to 90° to analyze the crystal phases of the samples. The morphologies of the as-obtained products were characterized and analyzed by transmission electron microscope (TEM). High-resolution TEM (HR-TEM) images were obtained using a JEOL JEM-2100 microscopy, operated at an acceleration voltage of 200 kV, to characterize the sizes and crystal structures of WO3 and Pd-WO3 nanosheets. The surface areas were measured on a surface area analyzer (Micromeritics ASAP 2020 V3.00H) and calculated using the Brunauer–Emmett–Teller (BET) equation. X-ray photoelectron spectroscopy (XPS, K-alpha) was used to investigate electron configurations of the surfaces of WO3 and Pd-WO3 nanosheets.
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3

Characterization of Zr-Phy-DES Material

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FT-IR spectra were recorded on Bruker Tensor 27 IR spectrometer using the KBr pellet method. XPS measurements were carried out on an ESCAL Lab 220i-XL specrometer under a pressure of ∼3 × 10−9 mbar (1 mbar = 100 Pa). XRD measurements were performed on an X-ray diffractometer (D/MAX-RC, Japan) at 40 kV and 200 mA with Cu Kα (λ = 0.154 nm) radiation. TEM images were achieved on a TEM JeoL-1011 with an accelerating voltage of 120 kV. SEM images were obtained on a Hitachi S-4800 Scanning Electron Microscope operated at 15 kV. Elemental mappings of Zr-Phy-DES were recorded using a JEOL-2100F high resolution of transmission electron microscopy (HR-TEM). The content of Zr was detected by ICP-AES (VISTA-MPX). N2 adsorption-desorption isotherms were obtained on the Micromeritics ASAP 2020 V3.00H (USA) surface area analyzer at 77 K at high vacuum. Temperature-programmed desorption of ammonia (NH3-TPD) and temperature-programmed desorption of carbon dioxide (CO2-TPD) were conducted on Micromeritics’ AutoChem 2950 HP Chemisorption Analyzer.
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