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Skyscan 1072 micro ct

Manufactured by Bruker
Sourced in Belgium

The Skyscan 1072 Micro-CT is a high-resolution X-ray microtomography system designed for non-destructive, three-dimensional imaging of small samples. It is capable of generating high-quality, high-resolution images of the internal structure of a wide range of materials and samples.

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2 protocols using skyscan 1072 micro ct

1

Micro-CT and SEM Imaging of Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
All samples were scanned with the Skyscan 1072 Micro-CT (Bruker, Artselaar, Belgium), with a linear resolution of 3.50 µm at a magnification of 80, with an accelerating voltage of 80 kV and tube current of 122 µA. The projection images were acquired over 180° at angular increments of 0.23° with an exposure time of 2.57 seconds per frame, averaged over six frames. Three-dimensional images were reconstructed using the reconstruction software provided by the manufacturer (NRecon Version 1.6.4.1), where the ring artifact reduction was applied as needed.
The samples were sputtered using the Cressington 108 Auto Sputter Coater with an Au coating thickness of 13 nm and studied in the JSM 6510 Scanning Electron Microscope (JEOL, Freising, Germany).
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2

Micro-CT and SEM Analysis of Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
All samples were scanned with a Skyscan 1072 micro-CT (Bruker, Artselaar, Belgium) with a linear resolution of 3.50 µm at a magnification of 80 with an accelerating voltage of 80 kV and tube current of 122 µA. Projection images were acquired over 180° at angular increments of 0.23° with an exposure time of 2.57 seconds per frame, averaged over six frames. Three-dimensional images were reconstructed using the reconstruction software provided by the manufacturer (NRecon Version 1.6.4.1, Micro Photonics Inc., Allentown, PA, USA), where the ring artifact reduction was applied as needed.
Samples were sputtered using a Cressington 108 auto sputter coater with Au coating thickness of 13 nm and studied in a JEOL JSM 6510 scanning electron microscope (JEOL, Tokyo, Japan).
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