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Osl1 ec

Manufactured by Thorlabs

The OSL1-EC is a single-mode optical fiber tip coupler. It is designed to couple a portion of the optical power from a single-mode fiber into a photodiode detector. The device features FC/PC input and output connectors for ease of integration into fiber optic systems.

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Lab products found in correlation

3 protocols using osl1 ec

1

Shadowgraphy Imaging of Film Deposition

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The imaging setup consisted on a fast-camera (AOS Technologies AG, model S-PRI F1), with an acquisition speed of 1000 frames per second, coupled to a 10× microscope objective (numerical aperture of 0.28), and a 150 W halogen light source (ThorLabs Inc, model OSL1-EC) facing the camera in shadowgraphy configuration22 (link),23 (link),53 (link). The sample was placed between the objective and the lamp at grazing incidence respect to the optical axis, so that the donor substrate appeared on top of the recorded image with the ink film facing downwards. The receiver substrate was removed during image acquisition.
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2

Spectroscopic Measurements with Integrating Sphere

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Spectroscopic measurements were carried out with a spectrophotometer (AvaSpec2048, Avantes, Netherlands) coupled to an integrating sphere (2" Integrating Sphere IS200-4, Thorlabs). The transmittance and reflectance were measured in the spectral range from 455 to 705 nm. The entrance port of the integrating sphere is 12.7-mm diameter. It is essential that the samples cover the entire port for accurate measurements. Consequently, we have reduced the entrance port diameter to 10 mm in diameter using a round washer with one face (interior) coated with a highly diffusive paint. The sample is illuminated with a tungsten-halogen light source (Thorlabs OSL1-EC) coupled to a 200-μm diameter fiber collimated with a plug-in SMA collimator.
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3

Optoelectronic Characterization of Graphene Devices

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All electrical measurements were conducted in ambient atmosphere at room temperature. The current-density-voltage (J-V) measurements were performed using a computer-interfaced Keithley 2400 source-meter. As convention, the bias voltage is applied to the silicon substrate and graphene is grounded in all measurements. Laser diodes of wavelength λ = 520, 635 and 980nm as well a monochromator (Spex 500M) with white light source (Thorlabs OSL1EC) were used to record the spectral response of devices under illumination. Neutral density (ND) filters were used to vary the light intensity. The high photoresponsivity of the diodes from near UV to IR allowed performing measurements at DC without need for a lock-in amplifier.
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