Axis ultra xps spectrometer

Infrared (IR) spectroscopy spectra were collected on a Nicolet 330 FTIR spectrometer within the 4000–500 cm⁻¹ region. Elemental analyses (C, H, and N) were conducted on a PerkinElmer 240 elemental analyzer. Thermogravimetric analysis (TGA) was performed on a Mettler Toledo TGA under a N₂ flow by heating from room temperature to 900 °C (10 °C min⁻¹). Powder X-ray diffraction (PXRD) measurements were carried out on an analytical X-Pert pro diffractometer with Cu-Kα radiation (γ = 1.5478 Å). Surface area and pore size distributions of the catalysts were determined using nitrogen adsorption–desorption isotherms obtained on a Micromeritics ASAP 2020 surface area analyzer at 77 K. The Pd contents were determined by inductively coupled plasma atomic emission spectroscopy (ICP-AES) on an IRIS Intrepid II XSP instrument (Thermo Electron Corp.). Scanning electron microscopy (SEM) images were obtained using a JEOL JSM-7600 field-emission SEM with an accelerating voltage of 5 kV. TEM images were collected on a FEI Tecnai F20 microscope operating at 200 kV. X-ray photoelectron spectroscopy (XPS) analysis was performed on an Axis Ultra XPS spectrometer (Kratos, U.K.) with 225 W of Al Kα radiation. The Raman spectrum was collected via a HORIBA Evolution Raman microscope using 532 nm incident wavelength.