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Pyris 1 analyzer

Manufactured by PerkinElmer
Sourced in United States

The Pyris 1 analyzer is a laboratory equipment designed for thermal analysis. It is used to measure the thermal properties of materials, such as their melting point, glass transition temperature, and thermal stability. The Pyris 1 analyzer can be used to analyze a wide range of materials, including polymers, pharmaceuticals, and metals.

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5 protocols using pyris 1 analyzer

1

Thermal Degradation Analysis of Adhesives

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To investigate the thermal degradation behavior of the adhesives with or without lysine, the thermogravimetric experiments were performed on a PYRIS 1 analyzer (PerkinElmer, Akron, OH, USA) with a heating rate 20 °C/min under nitrogen (30 mL/min). The final temperature was 600°C and the sample mass used for the experiments was about 3–4 mg. The C0–2 (nonsoaked and soaked) and Lysine-2 (nonsoaked and soaked) samples were tested. The nonsoaked control beam samples (C0–2) and experimental samples (Lysine-2) were first dried in a vacuum oven at 37 °C to constant mass before testing. The soaked control (C0–2) and experimental (Lysine-2) samples were immersed in 0.1 M sodium bicarbonate solution at 23±2 °C for 7 days and then dried in a vacuum oven at 37 °C to constant mass. A minimum of three specimens of each formulation were measured.
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2

Physicochemical Characterization of Synthesized Materials

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An XPert MPD diffractometer was used to record the X-ray diffraction (XRD) patterns of all synthesized materials. The diffractometer was set up with CuK (λ = 1.5406 Å) radiation, a voltage of 40 kV, and a current of 30 mA. At a wavenumber of 400–4000 cm−1, FT-IR spectra were obtained using an 8400S Shimadzu infrared spectrophotometer. SEM pictures of samples were taken using EDAX advanced microanalysis solutions. FESEM studied surface morphology (FE-SEM, JEOL JIB-4610F). N2 adsorption–desorption was studied using Quantachrome NovaWin Gas Sorption Analyzer. A PerkinElmer Pyris 1 analyzer conducted thermogravimetric analysis (TGA) on a 10 mg sample. Thermograms were taken at 10 °C min−1 air temperatures between 30 and 900 °C. Ultraviolet-visible (UV-vis) spectra recorded on a Thermo Scientific GENESIS 10S UV-vis Spectrophotometer for concentration of dyes after each adsorption.
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3

Characterization of MoS2 Nanoparticles

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Fourier transform infrared spectrophotometer (FTIR, Nicolet Impact 410) was used in the scope of 400–4000 cm−1 to analyze the chemical functional groups of nanoparticles. X-ray photoelectron spectroscopy (XPS analysis) was conducted on an ESCALAB 250 spectrometer. Thermogravimetric analysis (TGA) was conducted with a Perkin Elmer Pyris 1 analyzer at 800 °C under air atmosphere. The morphology of the molybdenum disulfide (MoS2) nanoparticles and the hybrid membranes were characterized by the Transmission electron microscope (TEM, JEM-1400, JEOL). The surface roughness of the membrane was measured by the atomic force microscope (AFM, Bruker Dimension ICON). The hydrophilicity of the membrane was evaluated by a water contact angle device (Drop Shape Analysis System DSA-30).
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4

Thermal Analysis of Mcl-PHA Films

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DSC experiments were performed on a DSC 4000 apparatus (Perkin Elmer, Waltham, MA, USA). Mcl-PHA and polyene containing mcl-PHA films of about 4 mg were used. Samples were heated from −40 °C to 100 °C at a rate of 10 °C/min under nitrogen atmosphere and held for 2 min before cooling at 10 °C/min. A second heating scan was performed at 10 °C/min to characterize all materials after exactly the same thermal history.
TGA was performed on a Pyris 1 analyzer (Perkin Elmer, Waltham, MA, USA). The samples were heated from 30 to 600 °C at a rate of 10 °C/min under air flow.
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5

Comprehensive Materials Characterization

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The crystalline structure of the samples was identified by X-ray diffraction (XRD) using a Rigaku D/max 2500 V diffractometer (Rigaku, Japan) with Cu Kα radiation (λ = 1.5418 Å), operating voltage and current of 40 kV and 40 mA, respectively, and 2θ range from 20° to 70°. The morphology was characterized by Sirion 200 scanning electron microscopy (SEM, FEI, USA) and JEM 2100 F transmission electron microscopy (TEM, JEOL, Japan) with operating voltage 200 kV. X-ray photoelectron spectroscopy (XPS) measurements were taken using a Kratos Axis spectrometer (Kratos, Britain) with monochromatic Al Kα radiation (1486.71 eV), operating voltage and current of 15 kV and 10 mA, respectively, and a hemispherical electron energy analyzer. Raman spectra were recorder on an inVia spectrometer (Renishaw, Britain) with a 514 nm excitation source. Nitrogen adsorption/desorption isotherms at 77 K were measured using a Micromeritics Autosorb-iQ2-C instrument (Quantachrome, USA); specific surface areas were estimated by the Brunauer–Emmett–Teller (BET) method. Thermogravimetric analysis (TGA) was performed using Pyris 1 analyzer (PerkinElmer, USA) by heating under air flow from 30 to 900 °C at a rate of 10 °C min−1.
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