Field emission sem
The Field Emission Scanning Electron Microscope (FE-SEM) is a high-resolution imaging tool that uses a field-emission electron source to produce a narrow, high-intensity electron beam. This beam is scanned across the surface of a sample, generating various signals that are used to create detailed images of the sample's topography and composition.
4 protocols using field emission sem
Nanomaterial Characterization by Advanced Electron Microscopy
SEM Imaging of Mycobacterium BCG
Scanning Electron Microscopy of Wing Scales
Nanowire Sample Characterization by SEM
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