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Nanoscope 8 multimode scanning force microscope

Manufactured by Bruker
Sourced in United States

The Nanoscope VIII Multimode Scanning Force Microscope is a versatile laboratory instrument designed for high-resolution imaging and characterization of surfaces and materials at the nanoscale. It utilizes scanning probe microscopy techniques to capture detailed topographical and other physical data about a sample's surface.

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5 protocols using nanoscope 8 multimode scanning force microscope

1

Protein Nanostructure Characterization on Mica

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A droplet of 20 mL of solution of ILQINS, IFQINS, and TFQINS was deposited on freshly cleaved mica, incubated for 2 min, rinsed with Milli‐Q water, and dried by a pressurized air. PF‐QNM AFM was carried out using a Nanoscope VIII Multimode Scanning Force Microscope (Bruker, USA) operating at ambient conditions and covered by an acoustic hood to minimize vibrational noise. The cantilever (Bruker, USA) was calibrated as described in a previous work.[62] Images were flattened and analyzed using the NanoScope Analysis 8.15 software and FiberApp software.[63]
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2

Cryo-TEM, RT-TEM, and AFM Imaging of Assemblies

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Both room temperature (RT) and cryogenic transmission electron microscopy (cryo-TEM) were performed using a Tecnai 12 transmission electron microscope; diffraction patterns were imaged using a Tecnai F20 (FEI, Eindhoven, The Netherlands). Images were recorded on a Megaview III CCD camera (RT-TEM), a FEI Eagle 4k × 4k CCD camera (cryo-TEM), or a Gatan US4000 4kx4k CCD camera (diffraction patterns). For RT-TEM, assemblies were negative stained with potassium phosphate (2%, pH 7.2, 10 s). Samples for diffraction were prepared at room temp and cooled down for measuring (−180 °C). Cryogenic samples were prepared in liquid ethane using a Gatan 626 cryoholder (Gatan, Pleasanton, CA, USA). Atomic Force Microscopy (AFM) experiments were performed on a Nanoscope VIII Multimode Scanning Force Microscope (Bruker) operated in tapping mode in air. Image processing (first order flattening) was performed in the NanoscopeAnalysis 8.15 software, and statistical analysis was performed using the open source software FiberApp20 (link). More details are provided in Supplementary Methods.
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3

Amyloid Fibrils Imaging and Analysis

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A droplet of 20 μL of sample solution (50 μM each for IAPP and EGCG) was deposited and incubated for 2 min on freshly cleaved mica, rinsed with Milli-Q water, and dried with air. Images were collected using a Nanoscope VIII Multimode Scanning Force Microscope (Bruker) operated in tapping mode in air. Images were flattened using the NanoscopeAnalysis 8.15 software, and no further image processing was done. The statistical analysis of fibrils was performed by FiberApp software.
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4

Visualizing Amyloid Fibril Formation

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Aβ incubated in the presence or absence of FapCS, FapC monomers, FapC fibrils or bLgS were subjected to TEM imaging. After incubation for 12 h, a drop of sample was applied on a glow‐discharged carbon‐coated copper grid. After 1 min, the sample was blotted and then negatively stained with uranyl acetate (1%) for 30 s. The dried grid was then imaged with a Technei F20 TEM at 200 kV. For AFM, a drop of sample was placed on freshly cleaved mica surface and rinsed with water after 2 min and dried with pressurized air. The sample was scanned with an AFM (Nanoscope VIII Multimode Scanning Force Microscopes, Bruker), covered with an acoustic hood to minimize the vibrational noise. Images were acquired under the tapping mode with a silicon nitride cantilever (Bruker). AFM images were processed with Nanoscope Analysis 1.5 software to flatten the background and to calculate the statistical parameters.
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5

Visualizing IAPP-AuNP Complexes by AFM

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Aliquots of 20 μL of AuNP-IAPP solution (IAPP concentration: 25 μM, AuNPs: 0.083 mM, incubated 24 h) were deposited on freshly cleaved mica, left to adsorb for 2 min at room temperature, rinsed with MilliQ water, and gently dried with pressurized air. The samples were scanned on Nanoscope VIII Multimode Scanning Force Microscopes (Bruker) covered with an acoustic hood to minimize vibrational noise. The AFM was operated in tapping mode under ambient conditions using commercial silicon nitride cantilevers (Bruker). All AFM images were flattened to remove background curvature using the Nanoscope Analysis 1.5 software and no further image processing was carried out.
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