Jsm 6510 scanning electron microscope

All samples were scanned with a Skyscan 1072 micro-CT (Bruker, Artselaar, Belgium) with a linear resolution of 3.50 µm at a magnification of 80 with an accelerating voltage of 80 kV and tube current of 122 µA. Projection images were acquired over 180° at angular increments of 0.23° with an exposure time of 2.57 seconds per frame, averaged over six frames. Three-dimensional images were reconstructed using the reconstruction software provided by the manufacturer (NRecon Version 1.6.4.1, Micro Photonics Inc., Allentown, PA, USA), where the ring artifact reduction was applied as needed.
Samples were sputtered using a Cressington 108 auto sputter coater with Au coating thickness of 13 nm and studied in a JEOL JSM 6510 scanning electron microscope (JEOL, Tokyo, Japan).

Raman spectroscopy, X-ray diffraction (XRD), and scanning electron microscopy (SEM) were performed to determine the physicochemical properties of the hot-melt extrudate, which was processed based on computational simulation. Raman analysis was performed using a portable Raman spectrometer (BWTEK BWS465-532S, Newark, NY, USA). The analytical time was 10 s, and the laser was injected five times. For XRD, the Bruker D8 Focus (Bruker AXS GmbH, Karlsruhe, Germany) at 40 kV and 50 mA was used. The XRD data were collected in increments of 0.02° and the 2 range from 10–50° at 1 s/step. SEM was used to detect any physical changes in the matrix systems. The images were collected using a JSM-6510 scanning electron microscope (JEOL Ltd., Tokyo, Japan) at 20 kV and magnification of 500 ×. To increase sensitivity, before sample detection, samples were coated with gold nanoparticles. The images were acquired under the same conditions.

The molecular structure and interaction of chitosan, TC, and STC composites were investigated by Fourier transform infrared spectrometer (FTIR). The FTIR samples were prepared as KBr pellets, and the spectrum was collected at a resolution of 4 cm⁻¹ with 32 scans per run by using a Bruker Tensor 27 FTIR spectrometer (Ettlingen, Germany). The morphology of the samples was characterized by using a JEOL JSM-6510 scanning electron microscope (Tokyo, Japan). The dried samples were coated with gold before the characterization for better imaging. The surface of the samples was analyzed by X-ray photoelectron spectroscopy (XPS) and Auger electron spectra (AES) in AXIS ULTRA DLD (Kratos Analytical Ltd., Manchester, UK) with Al Kα (1486.6 eV) radiation as the excitation source, the analysis was done in the pressures on the order of 10⁻⁸ Pa. The charges of the samples were corrected by setting the binding energy of the C_1s peak at 284.8 eV. The bandgap of the samples was characterized with UV/Vis spectroscopy (SHIMADZU UV-2550 spectrophotometer, Kyoto, Japan).