Genesis xm4

The morphology and chemical composition of the samples were checked using a FE-SEM microscope FEI Nova NanoSEM 230 (FEI Company as a part of Thermo Fisher Scientific Inc., Hillsboro, OR, USA) equipped with an energy dispersive X-ray spectrometer (EDAX Genesis XM4). The samples were dispersed in alcohol, and then a drop was placed on the silicon stub. After drying using an infrared lamp, samples were put under the microscope. SEM-EDS measurements were carried out with an acceleration voltage of the 3.0 and 15.0 kV, respectively.

The single crystals of Hf₂Te₂P were grown through the vapor transport method as described elsewhere^{35 (link)}. The crystal structure was determined by X-ray diffraction on a Kuma-Diffraction KM4 four-circle diffractometer equipped with a CCD camera using Mo Kα radiation, while chemical composition was checked by energy dispersive X-ray analysis performed using a FEI scanning electron microscope equipped with an EDAX Genesis XM4 spectrometer. Electrical resistivity measurements were carried out within the temperature range 2–300 K and in applied magnetic fields of up to 9 T using a conventional four-point ac technique implemented in a Quantum Design on a four-circle PPMS platform. The electrical contacts were made using silver epoxy paste.

A PANalyticalX’Pert Pro diffractometer (Malvern Panalytical Ltd., Malvern, UK) equipped with Ni-filtered Cu Kα radiation (λ = 0.154 nm, V = 40 kV, I = 30 mA) was employed to get powder diffraction patterns that were compared to the reference pattern from Inorganic Crystal Structure Database (ICSD).
A Philips CM-20 SuperTwin high-resolution transmission electron microscopy microscope (HRTEM) operating at 200 kV was used (Eindhoven, The Netherlands). The sample for HRTEM was prepared by dispersing a small amount of specimen in methanol and putting a droplet of the suspension on a copper microscope gird covered with carbon.
A field-emission scanning electron microscope (FEI Nova NanoSEM 230; Hillsboro, OR, USA) equipped with an EDS spectrometer (EDAX Genesis XM4) was used to determine the surface morphology. SEM images were performed at 5.0 kV in a beam deceleration mode to improve the surface sensitivity and show more detailed features of the samples.
A Thermo Scientific Nicolet iS50 FT-IR spectrometer (Waltham, MA, USA) equipped with an Automated Beamsplitter exchange system (iS50 ABX containing DLaTGSKBr detector) and an HeNe laser as an IR radiation source were used to measure IR spectra. Polycrystalline mid-IR spectra were collected in the 4000–400 cm⁻¹ range in KBr pellets at the temperature of 295 K and spectral resolution of 4 cm⁻¹.

Composition of the HoPdBi single crystals was studied on a FEI scanning electron microscope (SEM) equipped with an EDAX Genesis XM4 energy-disspersive spectrometer (EDS). Specimens were glued to a SEM stub using carbon tape. EDS spectrum and SEM image are presented in Supplementary Materials. The crystals were found homogeneous and free of foreign phases. Crystal structure was examined by x-ray powder diffraction carried out on powdered single crystals, using an X’pert Pro PANanalytical diffractometer with Cu-Kα radiation. Obtained diffractogram is shown in Supplementary Materials. Lattice parameter 6.613 Å and space group F 3 m were determined, in a perfect agreement with previously reported data52 .

X-ray diffraction was used to determine the crystalline structures of the obtained materials. X-ray diffraction patterns were carried out usinga PANalytical X’Pert Pro X-ray diffractometer equipped with the Ni-filtered Cu Kα1 radiation (Kα1 = 1.54060 Å, U = 40 kV, I = 30 mA) in the 2θ range of 10–60°. The EDS spectra were recorded to confirm the chemical formula. The EDS spectra and SEM images were measured usinga FEI Nova NanoSEM 230 scanning electron microscopy equipped with the EDS spectrometer (EDAX GenesisXM4) and operating at an acceleration voltage in the range of 3.0–15.0 kV and spot 2.5–3.0 were observed. The infrared spectra were measured using a Thermo Scientific Nicolet iS50 FT-IR spectrometer equipped with the Automated Beamsplitter exchange system (iS50 ABX containing DLaTGS KBr detector), built-in all-reflective diamond ATR module (iS50 ATR), Thermo Scientific Polaris™ and a HeNe laser was used as an IR radiation source. The FT-IR spectra were measured in KBr (FT-IR grade, ≥99% Sigma-Aldrich, St. Louis, MO, USA) pellets at room temperature in the range of 4000–400 cm⁻¹ with a spectral resolution of 2 cm⁻¹.

The crystal phase purity of fluorapatite was analyzed via the X-ray diffraction (XRD) method. The obtained pattern was collected with an X’Pert PRO X-ray diffractometer (Cu Kα1, 1.54060Å) (PANalytical, Malvern Panalytical Ltd., Malvern, UK). The diffractogram was analyzed and assigned to the standard pattern from the Inorganic Crystal Structure Database (ICSD). Analysis of the morphology and size of fluorapatite powder was performed on the SEM (scanning electron microscope) FEI Nova NanoSEM 230 (Hillsboro, OR, USA) equipped with an energy-dispersive (EDS) spectrometer (EDAX Genesis XM4). The infrared spectrum measurement was performed using a Nicolet iS10 FT-IR (Waltham, MA, USA) spectrometer equipped with a HeNe laser as an infrared (IR) radiation source and an automated beam splitter exchange system (iS50 ABX containing a DLaTGSKBr detector) with a built-in all-reflective diamond ATR module (iS50 ATR), Thermo Scientific Polaris™. The spectrum was detected in the range of 400–1300 cm⁻¹ on a potassium bromide (KBr) plate.

A field emission scanning electron microscope (FE–SEM, Hitachi S−4800) was employed for the morphological characterization of the samples. The crystal structures and components of the ZnO nanostructures were analyzed using x-ray diffraction (XRD, Cu–K, Rigaku D/max–B), field emission transmission electron microscope (FE–TEM, FEI Tecnai F30), and energy dispersive x-ray spectrometry (EDS, EDAX Genesis XM4).