X act eds detector

The surface morphology of pure LDPE film as well as LDPE/xHNT and LDPE/xTO@HNT films was investigated by carrying out SEM and EDX measurements using a JEOL JSM-6510 LV SEM Microscope (Ltd., Tokyo, Japan) equipped with an X-Act EDS-detector from Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 20 kV was applied).

Collagen scaffold samples were mounted on specimen stubs fitted with adhesive carbon pads, sputter‐coated with carbon and examined using a Zeiss Evo50 (Oxford Instruments, Cambridge, UK) scanning electron microscope, with micrographs obtained at an acceleration voltage of 20 kV. Point EDS spectra were acquired using and Oxford Instruments x‐act EDS detector running INCA software. Silk samples were fixed to adhesive 12 mm carbon tabs (Agar Scientific, Stansted, UK) pre‐mounted onto 0.5 aluminium spectrum stubs (Agar Scientific, UK), and imaged using a field emission scanning electron microscope, (FE)SEM, (Zeiss, EVO HD, Jena, Germany) with operation voltage of 5 kV. Samples on the stubs were sputter‐coated with 95% gold and 5% palladium (Polaron E500, Quorum Technology, UK) and imaged at magnifications of x500 and X1K.

Particle morphology was determined by scanning electron microscopy (JSM-7000F, JEOL, Akrishima, Japan) and transmission electron microscopy (Hitachi 7700, TEM, Tokyo, Japan). For SEM analysis, the various samples were spread on a carbon tape slide. Once the sample was dry, a secondary electron image and energy-dispersive X-ray spectroscopy (X-act EDS detector from Oxford, Instruments, Abingdon, UK) study were performed. Particle size distribution and zeta potential were measured with dynamic light scattering equipment (DLS) (Nanotrack Wave II, Microtrac, Haan, Germany). UV-Vis absorbance was measured by nanodrop spectroscopy (Thermo Fisher Scientific, Waltham, MA, USA) at 450 nm. The crystal structure was made by means of X-ray diffraction (XRD PANalytical, X’Pert PRO, EA, Almelo, The Netherlands) Anode material: Cu, K-Alpha1 [Å] = 1.54060, Generator Settings: 25 mA, 35 kV). Hemolysis was determined according to ASTM F756-17 (Standard Practice for Assessment of Hemolytic Properties of Materials) [38 (link)].

The surface morphology of the obtained ZnO/NaMt nanostructures, as well as the average length of the ZnO nanorods, were obtained using a JEOL JSM-6510 LV SEM Microscope (Ltd., Tokyo, Japan) equipped with an X-Act EDS-detector by Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 20 kV was applied). Before SEM observation, the materials were dissolved in EtOH, sonicated for 30 min (to avoid aggregation), and dropcasted on silicon substrates.

The surface morphology characterization of the obtained films was performed with SEM images. For SEM image measurements a JEOL JSM-6510 LV SEM Microscope (Ltd., Tokyo, Japan) was used equipped with an X-Act EDS-detector by Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 20 kV was applied).

The surface and cross-section morphology of CS/PVOH/HNT and CS/PVOH/TO@HNT films was recorded by using a JEOL JSM-6510 LV SEM (Microscope Ltd., Tokyo, Japan) were used equipped with an X-Act EDS-detector by Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 20 kV was applied).

X-ray photoelectron spectroscopy (XPS) measurements were performed in an ultrahigh vacuum at a base pressure of 7 × 10⁻⁹ mbar with a SPECS GmbH spectrometer equipped with a monochromatic MgKa source (hv = 1253.6 eV) and a Phoibos-100 hemispherical analyzer (Berlin, Germany). The spectra were collected in normal emission and the energy resolution was set to 1.16 eV to minimize measuring time. The spectral analysis, including a Shirley background subtraction and a peak deconvolution employing mixed Gaussian-Lorentzian functions, was performed in a least squares curve-fitting program (WinSpec) developed at the Laboratoire Interdisciplinaire de Spectroscopie Electronique, University of Namur, Namur, Belgium.
Scanning electron microscopy (SEM) images were obtained using a JEOL JSM-6510 LV SEM Microscope (JEOL Ltd., Tokyo, Japan) equipped with an X–Act EDS-detector by Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 20 kV was applied). Prior to SEM analysis, the samples were coated with an Au/Pd thin film (4–8 nm) in a sputtering machine (SC7620, Quorum Technologies, Lewes, UK).