Hq nsc35 al probes

Surface roughness of the nanopores was examined with atomic force microscopy (AFM, VECCO model multicode, VECCO, Plainview, Oyster Bay, NY, USA) in air tapping mode, with a scan size of 5 µm, in combination with HQ: NSC35/Al probes (Mikromasch, Lady’s Island, SC, USA) with a nominal spring constant of 16 N/m, and resonant frequency of 300 kHz. Topographical analysis was performed by importing the resulting AFM data files into Nanoscope software (v5.10, VEECO) and selecting the roughness tool.

Scanning electron microscopy (SEM) imaging of the samples was undertaken with a Zeiss 1550 system (optimum resolution ≈1 nm at 2 kV accelerating voltage). Tapping-mode AFM imaging was carried out with an Agilent 5100 atomic force microscope using HQ:NSC35/Al probes (Mikromasch) with a nominal spring constant of 5–16 N/m and a resonance frequency 150–300 kHz.

The morphology of the different surfaces was analyzed using scanning electron microscopy (SEM). Samples were sputter gold coated before SEM analysis. Images were acquired using a scanning electron microscope (SEM; Hitachi S-3400 N, Krefeld, Germany) using secondary electrons, vacuum conditions, and 15 kV of voltage. Images were analyzed using ImageJ software (National Institutes of Health, Bethesda, MD, USA) to determine pore diameter.
The topography of the samples was analyzed using an atomic force microscope (VECCO model multicode, VECCO, Plainview, Oyster Bay, NY, USA) in air tapping mode with a scan size of 10 µm in combination with HQ:NSC35/Al probes (Mikromasch, Lady’s Island, SC, USA) with a nominal spring constant of 16 N/m and resonance frequency of 300 kHz.
The static contact angle was calculated by the sessile drop method using a Nikon D3300 (AF-P DX 18–55 mm lent). The contact angle measurements were performed using four samples of each group using 2 µL ultrapure water as a wetting agent. Image analyses were performed using ImageJ software (National Institutes of Health, Bethesda, MD, USA).