Su8030
The SU8030 is a high-performance scanning electron microscope (SEM) manufactured by Hitachi. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of applications. The SU8030 features a field emission gun (FEG) electron source, which enables high-resolution imaging with low accelerating voltages. It also offers advanced analytical capabilities, such as energy-dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD), for materials characterization.
Lab products found in correlation
83 protocols using su8030
Morphology Analysis of OVA-loaded Nanoparticles
Scanning Electron Microscopy of Microneedle Arrays
Structural Analysis of 3D-Printed BRS
Surface Morphology Analysis of Cellulose and Nanocellulose
Structural Characterization and SERS Analysis
For SERS measurements, about 7 µL of 1 mM Rhodamine 6G (R6G) in ethanol was dropped on top of the gold and left to dry at ambient conditions. SERS measurements and mapping were carried out with a backscattering configuration on a Horiba XploRA confocal Raman instrument equipped with a charge-coupled device (CCD) detector. The spectra acquisition was carried out using an excitation laser wavelength of 638 nm of ca. 40 mW power, in a spectral range of 500–2100 cm−1, with an integration time of 15 s per spectrum and averaged over 5 accumulations. Raman mapping was performed with a 1 μm step in the case of Aula and a 0.5 μm step in the cases of Cosc and Gomp, with an integration time of 1 s per step. For focusing the light, the 100x objective (NA = 0.9) was used, giving a beam size of approximately 0.5 μm. Grating was set to 1200 grooves/mm.
Characterization of NU-1000 Metal-Organic Framework
Thin Film Thickness Characterization
Electrospray Deposition of Carbon Nanotubes
Microstructural Analysis of 3D-Printed Tablets
Characterizing PEDOT-POCO Film Composition
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