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Jem 2011f

Manufactured by JEOL
Sourced in Japan

The JEM-2011F is a transmission electron microscope (TEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of materials at the nanoscale level. The JEM-2011F provides a maximum accelerating voltage of 200 kV and offers advanced features for precise and detailed examination of samples.

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5 protocols using jem 2011f

1

Multimodal Microscopy Characterization of Nanocrystals

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Transmission
electron microscopy (TEM) and angular dark-field scanning transmission
electron microscopy (STEM) were used to analyze the structure of the
NCs on a JEOL JEM-2011F that was run at an accelerating voltage of
200 kV and mounted with a Gatan camera. Prior to imaging, samples
were drop-casted on a nickel TEM grid. Using ImageJ software and counting
>100 particles per sample, size statistics were calculated. On
an
FEI Titan Cubed Themis G2 300, aberration-corrected microscopy, high-resolution
TEM (HRTEM) imaging, high-angle annular dark-field STEM (HAADF-STEM)
imaging, and energy-dispersive X-ray spectroscopy (EDX) with elemental
mapping were carried out.
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2

Characterization of Carbonaceous Porous Dielectric

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The microstructures of the CPD were investigated via HRTEM and SAED using a transmission electron microscope (JEM-2011F, JEOL Ltd., Japan) with an accelerating voltage of 200 kV. To depict the distribution of the amorphous carbon zone and graphite fragments zone in CPD, we performed pseudo-color calibration of the phase regions of multiple HRTEM images. Then ImageJ was employed to quantitatively analyze the corresponding areas, ultimately determining the content of each phase. The stress field of the nanocomposite phase structure was characterized via geometric phase analysis using the background-filtered image in Strain + + software. The component phases and structure of the CPD were characterized via TEM, XRD (Smartlab, Rigaku, Japan) with CuKα radiation (I = 1.541838 Å), XPS (PHI 5802, PHI, USA), and Raman spectroscopy (alpha300 R, WITec, Germany) with an excitation wavelength of 532 nm. Prior to XPS measurement, a 0.5 nm-thick Au coating was sputtered onto the samples to calibrate all spectra by shifting the Au 4f-7 peak to 84.0 eV.
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3

Characterization of Dispersed Nb2Se9 Nanowires

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To compare the concentration of dispersed solutions, their UV absorption were characterized by UV–Vis spectrophotometer (Agilent Technologies lnc., Agilent 89090A). The zeta potential of dispersed solution was investigated by Zetasizer (Malvern Instruments Ltd., Nano-ZS90). The chemical state of the Nb2Se9 was examined by XPS (Thermo, ESCALAB250). The samples for XPS were prepared by vacuum filtration method on the AAO membrane with a pore diameter of 100 nm. The morphologies of the exfoliated nanowires were analyzed by atomic force microscopy (Park Systems, NX 10) and aberration-corrected scanning transmission electron microscopy (STEM, JEOL, JEM-2011F). The AFM was operated in non-contact mode, and the samples for AFM were prepared on SiO2/Si wafers by spin-coating. The samples for STEM were prepared by drop-casting onto a carbon-coated TEM grid35 (link).
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4

Comprehensive Material Characterization by Advanced Microscopy and Spectroscopy

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The morphologies of the as-synthesized materials were characterized by a transmission electron microscope (TEM) equipped with energy-dispersive X-ray spectroscopy (EDX). High-resolution transmission electron microscope (HR-TEM) and selected area electron diffraction (SAED) were performed on the field emission-transmission electron microscope (FE-TEM, JEOL JEM-2011F).
The crystal planes of the as-synthesized materials were identified by powder X-ray diffraction (XRD) using Rigaku SmartLab with a CuKα (λ = 1.541862 Å) radiation, operating at 45 kV and 200 mA, with a scanning rate of 0.05°/s and 2-theta ranging from 20° to 90°.
X-ray photoelectron spectroscopy (XPS) studies were also carried out using Axis Ultra DLD XPS system equipped with monochromatic Al−Kα radiation of 1486.6 eV and an electron take-off angle of 90°. The pressure of the sample chamber was kept at 10−8 Torr during analysis. The spectrum was recorded in the binmr1ding energy (B.E.) range of 0.00 to 1400.00 eV with a step size of 1.00 eV. The binding energy was referenced with the C 1s peak of the carbon at 285.0 eV.
The mass loading on the carbon nanotubes supporting samples was measured by induced coupled plasma mass spectrometry (ICP-MS).
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5

Morphological Characterization of Fe0 and Bi/Fe0 Nanoparticles

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The morphologies
of the as-synthesized Fe0 and Bi/Fe0 nanoparticles
were investigated by scanning electron microscopy (SEM) (JEOL, JSM-5910)
and transmission electron microscopy (TEM) (JEM-2011F, JEOL, Japan).
Energy-dispersive X-ray (EDX) spectroscopy analysis was conducted
by EDX (EX-2300BU, Jeol) for elemental analysis of the as-synthesized
nanoparticles. To investigate the crystallinity of the as-synthesized
nanoparticles, X-ray diffraction (XRD, PANalytical) analysis was performed
using a Rigaku D/max-RB instrument with Cu Kα radiation (λ
= 1.54 Å), operated at 45 kV and 100 mA. Thermogravimetric analysis
(TGA) was conducted on a TG-DTA, PerkinElmer, system. The ultraviolet
diffuse reflectance spectroscopy was performed on a PerkinElmer Lambda
35 UV–vis spectrometer (Shelton, CT, USA) using BaSO4 as a reference. X-ray photoelectron spectroscopy (XPS) was conducted
through PHI-5300, ESCA in which Al Kα was used as the source
of X-ray excitation for studying the elemental composition and oxidation
states of Fe and Bi. A quantachrome analyzer was used during the investigation
of Brunauer–Emmett–Teller (BET) specific surface areas
(SBET), BJH pore size, and pore volume
of the Fe0 and Bi/Fe0 nanoparticles.
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