Data was acquired using a JEOL 2010F transmission electron microscope operated at 200 keV with a nominal magnification of ×60,000 (3.6 Å at the specimen level). Each image was acquired using a 1 s exposure time with a total dose of ~30–35 e− Å−2 and a defocus between −1 and −2 μm. A total of 1,250 micrographs were manually recorded on a Gatan OneView.
Oneview
Manufactured by Ametek
Sourced in United States
OneView is a versatile lab equipment product from Ametek. It is designed to provide users with a comprehensive data acquisition and analysis solution for various laboratory applications. The core function of OneView is to collect, display, and manage data from a wide range of laboratory instruments and sensors.
Automatically generated - may contain errors
Lab products found in correlation
Jem arm300f, by JEOL (3 mentions)
Tecnai 12, by Thermo Fisher Scientific (2 mentions)
Tecnai t12, by Thermo Fisher Scientific (2 mentions)
Uc7 ultramicrotome, by Leica (1 mentions)
Us1000 ccd camera, by Ametek (1 mentions)
Tecnai 12 tem, by Thermo Fisher Scientific (1 mentions)
Holey carbon support film, by Ted Pella (1 mentions)
Uc6 fc6, by Leica (1 mentions)
Model 654, by Ametek (1 mentions)
Jem arm300cf, by JEOL (1 mentions)
Jem f200, by JEOL (1 mentions)
Jed 2300, by JEOL (1 mentions)
Mpms xl, by Quantum Design (1 mentions)
Jem arm200f tem, by JEOL (1 mentions)
Diamond knife, by Electron Microscopy Sciences (1 mentions)
Em uct, by Leica (1 mentions)
Jem 2100f, by Ametek (1 mentions)
Formvar film, by Electron Microscopy Sciences (1 mentions)
D8 discover instrument, by Bruker (1 mentions)
22 protocols using oneview
1
Transmission Electron Microscopy Protocol
2
Transmission Electron Microscopy of Brain Tissue
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Perfused brain tissue was prepared according to standard TEM protocols [30] . Blocks were sectioned using a UC7 ultramicrotome (Leica) and a Diatome diamond knife. Sections (90 nm) were post-stained with lead citrate and imaged on a Tecnai 12 TEM (FEI) operated at 120 kV. Digital images were acquired using a US1000 CCD camera (Gatan) and OneView (Gatan).
3
High-Resolution TEM Imaging of Quantum Dots
4
Cryo-TEM Imaging of Pt/CB Catalysts
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Pt/CB powder was dispersed in water at a concentration of 10-4 wt% and deposited on the lacey carbon films on copper mesh TEM grids. The CLs were held between the epoxy resin blocks and sectioned to a thickness of ~200 nm using an ultramicrotome (Leica UC6/FC6, Leica Microsystems GmbH, Wetzlar, Germany) at −80 °C. The ultrathin sections were transferred to lacey carbon films on copper mesh TEM grids. TEM observations were carried out on a JEM-ARM300F (JEOL Ltd., Akishima, Japan) instrument operating at 300 kV and equipped with a CMOS camera (OneView, Gatan Inc., Pleasanton, CA, USA).
5
In Situ Tensile Deformation of Materials in TEM
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
In situ tensile straining tests were carried out in an aberration-corrected TEM operated at 300 kV (JEM-ARM300CF, JEOL) equipped with a straining holder (Model 654, Gatan). In situ TEM movies were recorded with a high-speed camera at a frame rate of 50 frames per second and 2k resolution (Oneview, Gatan). The displacement of the whole ~9 mm large sample support was controlled by a step motor whose resolution was 1 μm. The straining was interrupted intermittently to stabilize the stage and observe dislocation glide motion. No quantitative load-displacement data can be obtained during the deformation.
The contrast of dislocations in TEM images and videos is enhanced by image processing. Firstly, the background noise from the FIB damage is removed by using direct subtraction of the last frame after aligning all frames using the cross-correlation method. Then, a Gaussian filter is used to blur the remaining noise. To extract dislocation positions as shown in Fig.1b , a ridge detection filter is used after applying an additional Gaussian filter.
The contrast of dislocations in TEM images and videos is enhanced by image processing. Firstly, the background noise from the FIB damage is removed by using direct subtraction of the last frame after aligning all frames using the cross-correlation method. Then, a Gaussian filter is used to blur the remaining noise. To extract dislocation positions as shown in Fig.
6
Transmission Electron Microscopy Protocol
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
7
Electron Tomography of Target Structure
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
We used a JEM-F200 transmission electron microscope and Gatan OneView camera as imaging equipment. During the imaging process, the acceleration voltage is 200 kv. After manually adjusting the focus, brightness, contrast, and astigmatism for each volume, we first recorded the image of the target structure at 5K and then recorded the image of the target structure at 20K. Then, SerialEM was used to acquire Tilt Series images of the target structure between − 60 and + 60 at 2 intervals, and IMOD was used to obtain electron tomography images of the target structure.
8
Negative Staining of Protein Fibrils
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Ten microliters of a fibril suspension (0.2 mg/ml) was applied to freshly glow discharged carbon 200-mesh copper grids for 2 min, blotted with filter paper, stained with 2% uranyl acetate for 10 s, then blotted, briefly passed over a water droplet, blotted, and air-dried. Grids were imaged in a FEI Tecnai 12 transmission electron microscope at 120 kV using a Gatan OneView complementary metal-oxide semiconductor camera.
9
Serial Tomography for 3D Ultrastructural Imaging
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
For serial tomography, ribbons containing serial sections of approximately 150 nm were produced from samples prepared for TEM as described above, and sections were stained with Reynolds’ lead citrate prior to imaging at 120 kV, in a Tecnai T12 (FEI), equipped with a 16-MP camera (OneView, Gatan). Each individual tomogram was produced from a total of 240 4K × 4K pixel images (120 tilted images each of 0° and 90° axes, with 1° tilting between images) from the same area in each section, acquired using SerialEM (http://bio3d.colorado.edu/SerialEM/ ). Individual tomograms were produced using eTOMO (IMOD software package; http://bio3d.colorado.edu/imod/ ), which was also used to join six to seven consecutive tomograms into serial tomogram volumes. Tri-dimensional models from serial tomograms were produced by manual tracing and segmentation of selected structures using 3dmod (IMOD software package).
10
Synthesis and Characterization of V-Doped Sb2Te3 Thin Films
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Thin films of V-doped Sb2Te3 compounds were
fabricated by co-deposition of Sb2Te3 (99.9%)
and V (99.7%) targets via rf-magnetron sputtering onto SrTiO3(001) single crystalline substrates kept at 570 K. The sputtering
was performed at 10 mTorr of Ar gas (99.999%) in a chamber having
a base pressure of 4 × 10–6 Pa. Sputtering
power was set to 30 W in this study. The thickness of the films was
controlled by the sputtering duration between 30 and 180 s. Both cross-sectional
and plan-view TEM samples were prepared using a tripod polishing technique
in combination with low-energy Ar ion milling. The structure and morphology
of the prepared specimens were characterized using a JEOL JEM-ARM200F
TEM operating at 200 kV equipped with a Schottky field emission gun.
All the TEM images and diffraction patterns were recorded using a
CMOS camera (Gatan OneView). Compositional analyses were performed
using an energy-dispersive X-ray spectrometer (EDS; JEOL JED-2300).
V content was determined to be ≈2 at % by TEM–EDS analysis
(Sb38V2Te60, seeFigure S2 ) based on the thin film approximation assuming theoretical k-factors. Magnetic properties were measured using a superconducting
quantum interference device magnetometer (SQUID, Quantum Design, MPMS-XL)
in the temperature range between 5 and 300 K with magnetic fields
up to 20 kOe.
fabricated by co-deposition of Sb2Te3 (99.9%)
and V (99.7%) targets via rf-magnetron sputtering onto SrTiO3(001) single crystalline substrates kept at 570 K. The sputtering
was performed at 10 mTorr of Ar gas (99.999%) in a chamber having
a base pressure of 4 × 10–6 Pa. Sputtering
power was set to 30 W in this study. The thickness of the films was
controlled by the sputtering duration between 30 and 180 s. Both cross-sectional
and plan-view TEM samples were prepared using a tripod polishing technique
in combination with low-energy Ar ion milling. The structure and morphology
of the prepared specimens were characterized using a JEOL JEM-ARM200F
TEM operating at 200 kV equipped with a Schottky field emission gun.
All the TEM images and diffraction patterns were recorded using a
CMOS camera (Gatan OneView). Compositional analyses were performed
using an energy-dispersive X-ray spectrometer (EDS; JEOL JED-2300).
V content was determined to be ≈2 at % by TEM–EDS analysis
(Sb38V2Te60, see
quantum interference device magnetometer (SQUID, Quantum Design, MPMS-XL)
in the temperature range between 5 and 300 K with magnetic fields
up to 20 kOe.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!