Tm3000 benchtop sem
The TM3000 Benchtop Scanning Electron Microscope (SEM) is a compact and user-friendly instrument designed for high-resolution imaging and elemental analysis of a wide range of samples. The TM3000 offers a maximum magnification of 30,000x and can produce detailed images of surface topography and composition.
Lab products found in correlation
2 protocols using tm3000 benchtop sem
Ultrastructural Analysis of ECM Scaffolds
Morphological Analysis of Lyophilized Samples
Observations at higher magnification were carried out with a commercial AFM (NTMDT) model NTEGRA in tapping mode. For AFM measurements, the oxidized PS sample was fixed on a glass slide with a double tape.
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