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Tm3000 benchtop sem

Manufactured by Hitachi
Sourced in United States, Japan

The TM3000 Benchtop Scanning Electron Microscope (SEM) is a compact and user-friendly instrument designed for high-resolution imaging and elemental analysis of a wide range of samples. The TM3000 offers a maximum magnification of 30,000x and can produce detailed images of surface topography and composition.

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2 protocols using tm3000 benchtop sem

1

Ultrastructural Analysis of ECM Scaffolds

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ECM were fixed with 4% paraformaldehyde in phosphate buffer (PB) for 5 h, postfixed in 1% osmium tetroxide in PB for 1 h, dehydrated in ascending degree of ethanol (70–80–95–100%), dried for 30 min in xylene and embedded with paraffin after evaporation of xylene and serially cut as 10 μm thick sections using a Leica microtome. Sections were first deparaffinized in xylene for 2 h and then hydrated in descending degree of ethanol (100–95–80–70%) and H2O. Ultrathin sections were collected on glass coverslips, mounted on aluminum stubs and sputter-coated 3 min with gold. Morphology and ultrastructure were investigated by SEM on a TM3000 Benchtop SEM (Hitachi, Pleasanton, CA, USA) instrument operating at 15 kV acceleration voltage [30 (link)]. Areas of matrix or empty spaces were calculated with a tool of the ImageJ software (version 2.0, National Institute of Health, Bethesda, MD, USA) and reported as percentage area on the whole image analyzed. Results are also reported as perimeter/area ratio of empty spaces. Repopulated GelMA scaffolds were analyzed by SEM as above, after fixation without embedding.
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2

Morphological Analysis of Lyophilized Samples

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The morphology and structure of the samples were assessed using scanning electron microscopy (SEM) performed on a Hitachi TM 3000 Benchtop SEM instrument (Tokyo, Japan) operating at 15 kV acceleration voltage. Observations were carried out on fragile fractures (in liquid nitrogen) of samples lyophilized and sputter-coated with gold.
Observations at higher magnification were carried out with a commercial AFM (NTMDT) model NTEGRA in tapping mode. For AFM measurements, the oxidized PS sample was fixed on a glass slide with a double tape.
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