Cambridge s 360 scanning electron microscope
The Cambridge S 360 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of microscopic samples. It provides a magnification range from 10x to 300,000x, allowing users to observe fine details and structures at the nanoscale level. The SEM utilizes a focused electron beam to scan the surface of a sample, generating detailed information about its topography, composition, and other characteristics. This instrument is a versatile tool for applications in materials science, nanotechnology, and other fields that require advanced microscopic analysis.
Lab products found in correlation
2 protocols using cambridge s 360 scanning electron microscope
Characterization of Functionalized SBA-15 Nanocomposites
SEM Scaffold Morphology Evaluation
microscopy (SEM) was used to evaluate the scaffold morphology and
infiltration of the cells. At timed intervals, constructs were removed
from the plates, washed in PBS, and fixed with 2.5% glutaraldehyde
for 30 min. The samples were then washed with PBS, dehydrated in a
graded series of ethanol, dried by hexamethyldisilazane, mounted on
aluminum stages, sputter coated with gold (Fisons Instruments, Sputter
Coater SC502, U.K.), and examined with an a Leica Cambridge S360 Scanning
electron microscope.
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