UV-Vis absorption spectroscopy was collected using commercial Agilent Cary 60 (Santa Clara, CA, USA) Emission spectroscopy and fluorescence lifetime were measured by commercial fluorescence spectrometer FLS980 (Livingston, UK). Transient absorption spectroscopy was obtained using a femtosecond transient absorption (Fs-TA) spectrometer (Harpia-TA, Light Conversion, Vilnius, Lithuania). Details of the instrument have been described elsewhere [39 (link)]. The samples are excited with 480 nm. The concentration was 10−5 mol/L for UV-Vis and Fs-TA and 10−6 mol/L for fluorescence. The fluorescence quantum yield was measured by the comparative method in the literature [33 (link)]. The global and target analysis was performed by the software Glotaran [58 (link)].
Harpia ta
Manufactured by Light Conversion
Sourced in Lithuania
Harpia-TA is a high-performance transient absorption spectrometer designed for the analysis of ultrafast photophysical and photochemical processes. The instrument features a broadband probe pulse and a variety of excitation sources, enabling the investigation of a wide range of samples and phenomena.
Automatically generated - may contain errors
Lab products found in correlation
Orpheus hp, by Light Conversion (2 mentions)
Cary 60, by Agilent Technologies (1 mentions)
Pharos, by Light Conversion (1 mentions)
X pert pro mrd, by Philips (1 mentions)
Deltapro, by Horiba (1 mentions)
Geminisem, by Zeiss (1 mentions)
Ascendtm 600 mhz, by Bruker (1 mentions)
Fls920, by Horiba (1 mentions)
Dld 600w, by Shimadzu (1 mentions)
Dektak xt, by Bruker (1 mentions)
Oca20, by Dataphysics (1 mentions)
5 protocols using harpia ta
1
Photophysical Characterization of Molecular Probes
2
Ultrafast Dynamics Characterization of Photovoltaic Materials
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A Yb: KGW amplifier (PHAROS,Light Conversion,) supplied laser beams centered at 1030 nm with pulse duration of ~180 fs, pulse repetition rate of 33 kHz, and a maximum pulse energy of 0.3 mJ. The output of the amplifier was split into two streams of pulses. One was used to drive an optical parametric amplifier (ORPHEUS-HP, Light Conversion) to obtain the pump beam. The residual stream was directed into an ultrafast spectroscopic system (HARPIA-TA, Light Conversion) to generate the white light continuum probe beam. In the spectrometer, the pump chopped at 150 Hz frequency was spatially and temporally overlapped with the probe beam on the sample. Pump wavelength was set to 850 nm to selectively excite the BTPV-4F acceptor. Excitation energy of the pump pulse was set to 2 μJ/cm2 to avoid singlet-singlet annihilation. The film samples for TA measurements were prepared by spin coating the corresponding materials on quartz plates of 1 mm thick. The TA samples were annealed in nitrogen atmosphere at 100 °C for 3 min prior to measurement.
3
Ultrafast Transient Absorption Spectroscopy
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Femtosecond transient absorption spectra were measured by an ultrafast transient absorption spectrometer (Harpia-TA, Light Conversion). A Ti:sapphire laser amplifier (Astrella Coherent) with 40 fs pulse duration at 800 nm and 1 kHz repetition rate was used for these experiments. The white-light-continuum probe pulses were generated by a 2 mm CaF2 nonlinear crystal, and spectrally tunable pump pulses were generated by an optical parametric amplifier (TOPAS-C, light conversion). A 1 mm pathlength quartz cuvette housed the solution. Changes in absorbance were monitored by focusing the transmitted probe light through the solution onto a broadband UV/vis detector. Data analysis was performed applying Singular Value Decomposition (SVD) and global analysis with target model, using the software GLOTARAN.122
4
Ultrafast Transient Absorption Spectroscopy of Polymer Acceptors
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A Yb: KGW amplifier (PHAROS, Light Conversion,) supplied laser beams centered at 1030 nm with pulse duration of ~180 fs, pulse repetition rate of 33 kHz, and a maximum pulse energy of 0.3 mJ. The output of the amplifier was split into two streams of pulses. One was used to drive an optical parametric amplifier (ORPHEUS-HP, Light Conversion) to obtain the pump beam. Residual stream was directed into an ultrafast spectroscopic system (HARPIA-TA, Light Conversion) to generate the white light continuum probe beam. In the spectrometer, the pump chopped at 150 Hz frequency was spatially and temporally overlapped with the probe beam on the sample. Pump wavelength was set to 850 nm to selectively excite the polymer acceptors. Excitation energy of the pump pulse was set to 2 μJ/cm2 to avoid singlet-singlet annihilation. The film samples for the TA measurements were prepared by spin coating the corresponding materials on quartz plates with 1 mm thick. The TA samples were annealed in nitrogen atmosphere at 120 °C for 5 min prior to measurement.
5
Comprehensive Perovskite Film Characterization
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The J–V characteristics were measured under illumination of AM 1.5 G (100 mW cm−2) by using a Keithley 2400 source meter. The steady‐state PL spectra and time‐resolved PL decays of the perovskite films were measured on an Edinburgh fluorescence spectrometer (FLS920) and HORIBA Scientific DeltaPro, respectively. EQE was measured on an EQE system (Enli Technology Co., Ltd.). Philips diffractometer (X'pert PRO MRD) was used to obtain the X‐ray diffraction data of perovskite films deposited on a ITO/PEDOT:PSS substrate. The morphology of perovskite films was characterized by AFM (Bruker, Dimension3100) and SEM (Carl Zeiss, GeminiSEM). The contact angles of perovskite films were measured by optical contact angle measuring and contour analysis systems (Dataphysics, OCA20). NMR was obtained by using NMR spectrometer (Bruker, Ascend TM 600 MHZ). TA spectra were performed by transient absorption spectrometer (Light Conversion, HARPIA‐TA). The thickness of the perovskite films was measured by a probe surface profiler (Bruker, DektakXT). Perovskite energy level was measured by UPS (Kratos, AXIS‐ULTRA DLD‐600W).
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