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Microscopy merlin

Manufactured by Zeiss
Sourced in Germany

The Microscopy Merlin is a high-performance electron microscope designed for advanced materials analysis. It provides high-resolution imaging and analytical capabilities to support research and development in various scientific fields.

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3 protocols using microscopy merlin

1

Scanning Electron Microscopy of Material Samples

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Surface morphology was studied by using an instrument, Zeiss Microscopy Merlin with GEMINI II column. SEM study was carried out for the samples including EDR, SOL, and NEF. Each sample was mounted on the double-sided adhesive tape. The photomicrographs were obtained at the voltage of 0.7 kV and examined at the magnification of 2,000×.31 (link),39 (link)
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2

Structural Characterization of Nanoparticles

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Structural characteristics of the MSN and MON samples were observed using a field emission scanning electron microscope (SEM, Carl Zeiss Microscopy Merlin with GEMINI II, Oberkochen, Germany) operated at 2.5 kV and a transmission electron microscope (TEM, JEOL, JEM-2100F-HR) operated at 200 kV. Nitrogen adsorption-desorption isotherms were determined using Micromeretics Tristar II 3020 Surface Area and Porosity Analyser. Particle size distribution and z-average diameter were determined by dynamic light scattering (Zetasizer Nano, Malvern Instruments, Worcestershire, UK) by diluting the particles in PBS at 37 °C.
Nitrogen adsorption/desorption isotherms were collected using a Micromeritics TriStar II volumetric adsorption analyzer (Micromeritics Instrument Corporation, Norcross, GA, USA) at liquid nitrogen temperature. The particle sample was first outgassed for 3 h at 200 °C. Brunauer–Emmett–Teller (BET) was used to calculate the surface area from the isotherm in the relative pressure (P/Po) range of 0.05 to 0.3.
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3

Scanning Electron Microscopy of Samples

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The scanning electron microscope used was a (Carl Zeiss Microscopy Merlin with GEMINI II column) operated at 2 kV.
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