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Xflash 6 100

Manufactured by Bruker
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The XFlash 6|100 is an energy-dispersive X-ray (EDX) detector designed for microanalysis applications. It provides high-resolution X-ray detection and analysis capabilities for various materials characterization tasks.

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Lab products found in correlation

Merlin compact, by Zeiss (1 mentions) X pert3 powder, by Malvern Panalytical (1 mentions) Asap 2020, by Micromeritics (1 mentions) S 4800, by Zeiss (1 mentions) S 4800, by Hitachi (1 mentions) Smartlab, by Rigaku (1 mentions) Tecnai g2 20, by Thermo Fisher Scientific (1 mentions) V 660, by Jasco (1 mentions) Tg dta2000, by Bruker (1 mentions) D8 focus, by Bruker (1 mentions) Oxford x max, by Oxford Instruments (1 mentions) Fei tecnai g2 f20, by Thermo Fisher Scientific (1 mentions) Jsm 7200f, by JEOL (1 mentions) Escalab xi, by Thermo Fisher Scientific (1 mentions) Jsm 7900f, by JEOL (1 mentions) Regulus 8230, by Hitachi (1 mentions)

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XFlash 6 (6 citations)

5 protocols using xflash 6 100

1

Comprehensive Characterization of Prepared Sample

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The morphology
of the prepared sample
was analyzed by field-emission scanning electron microscopy (FESEM,
Hitachi S-4800 and Zeiss Merlin compact) and field-emission transmission
electronic microscopy (FETEM) (JEOL-2100F, JEOL Ltd., Japan). Elemental
distribution maps were collected by energy-dispersive spectrometry
(EDS, Bruker Xflash 6100) using an accelerating voltage of 15 kV.
Powder X-ray diffraction (PXRD) was performed using an X-Pert3 powder
(PANalytical, the Netherlands) diffractometer with Cu Kα1 (λ
= 1.5406 Å) radiation. X-ray photoelectron spectroscopy (XPS,
Al Kα radiation, and hν = 1486.6 eV)
was performed to reveal the chemical compositions and valence state
using the C 1s peak of the C–C and C–H bonds located
at 284.8 eV as reference. The CasaXPS software was adapted to conduct
the peak fitting. Thermogravimetric–mass spectrometric (TG-MS)
analysis was carried out using an STA449C/Qms 403C. The Raman spectra
of the prepared catalysts were collected with Jobin Yvon-Horiba LabRam
ARAMIS systems with 532 nm excitation lasers. A Micromeritics ASAP2020
device (at 77 K) was employed to perform the N2 adsorption–desorption
test. Infrared (IR) spectra were collected using a Fourier transform
infrared spectrometer (Nicolet is50, ThermoFisher Co.).
Wang L., Ma N., Wu N., Wang X., Xin J., Wang D., Lin J., Li X, & Sun J. (2021). Stable, Efficient, Copper Coordination Polymer-Derived Heterostructured Catalyst for Oxygen Evolution under pH-Universal Conditions. ACS Applied Materials & Interfaces, 13(21), 25461-25471.
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2

Characterization of PI FPs/TiO2 Nanocomposite

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X-ray diffraction (XRD) pattern of the fabricated PI FPs/TiO2 NPs was measured by a powder XRD system, SmartLab (Rigaku Corp.). Transmission electron microscopy (TEM) images were collected using FEI Tecnai G2 20. Dynamic light scattering (DLS) analysis was performed with DLS-7000 (Otsuka Electronics Co. Ltd.). Line scan elemental analysis was conducted using a scanning electron microscope (SEM, Hitachi S-4800) attached with an energy dispersive X-ray spectroscope (EDX, Bruker X Flash 6|100). For thermogravimetric analysis-differential thermal analysis (TG-DTA) of the as-fabricated material using TG-DTA2000 (Bruker Corporation) was used. UV-vis transmission spectra of ca. 50 μm thick application films, prepared from TiO2 NPs powder (1.4 wt%) or PI FPs/TiO2 NPs powder (7 wt% including 1.4 w% TiO2 NPs)-dispersed in oils used in cosmetics with a mechanical mixer, were collected using a UV-vis spectrophotometer (JASCO V-660).
Ishizaka T., Chatterjee M, & Kawanami H. (2021). Rapid and continuous fabrication of TiO2 nanoparticles encapsulated by polyimide fine particles using a multistep flow-system and their application. RSC Advances, 11(4), 2083-2087.
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3

Structural Analysis of Al-Nb-Zr-Ti-Ta-Ce Alloys

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Crystal structures of the Al0.5NbZrTi1.5Ta0.8Cex alloys were analyzed by X-ray diffractometry (XRD, Bruker D8 Focus, Bruker, Karlsruhe, Germany) using Cu Kα target with 2θ between 20–80° and a scan step of 0.05°. The microstructures were examined by scanning electron microscopy (SEM, JEOL JSM 7200F, JEOL Ltd., Tokyo, Japan) equipped with energy-dispersive detectors (EDS, Oxford X-Max, Oxford Instruments, Abingdon, Britain). Fine-structure observations were conducted by transmission electron microscopy (TEM, FEI Tecnai G2 F20, FEI Company, Hillsboro, OR, USA) equipped with energy-dispersive detectors (EDS, XFlash 6|100, Bruker, Karlsruhe, Germany).
Ma Y., Zhou L., Zhang K., Gai X., He J, & Zhang X. (2022). Effects of Cerium Doping on the Mechanical Properties and Energy-Releasing Behavior of High-Entropy Alloys. Materials, 15(20), 7332.
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4

Comprehensive Materials Characterization

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The phase structure
of the samples was identified by powder X-ray diffraction (XRD, Rigaku-D/max,
Cu Kα). The elemental composition and chemical state of the
composition were analyzed using an X-ray photoelectron spectrometer
(XPS, ThermoFisher ESCALAB XI+, Al Kα). The structure of the
sample surface was probed by Fourier transform infrared spectroscopy
(FT-IR, VERTEX 70). The morphology of the composite was observed through
scanning electron microscopy (SEM, JEOL JSM-7900F) with an energy
dispersive spectrometer (EDS, Bruker XFlash 6|100).
Lu M., Cao Y., Xue Y, & Qiu W. (2021). Preparation of Graphene Oxide/La2Ti2O7 Composites with Enhanced Electrochemical Performances for Supercapacitors. ACS Omega, 6(42), 27994-28003.
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5

Characterization of Ag-Cu Thin Film Nanostructures

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SEM images of the ultra-thin Ag–Cu film non-woven fabric were taken by a field emission scanning electron microscope (Regulus 8230, Hitachi, Tokyo, Japan). The elemental distribution was analyzed using energy-dispersive X-ray spectroscopy (EDS, XFlash 6|100, Bruker, Karlsruhe, Germany). The surface elemental distribution of the films were obtained by X-ray photoelectron spectroscopy (XPS, Axis supra, Kratos, Manchester, UK) with monochromatic Al Kα radiation (hν = 1486.7 eV). The XPS spectra were calibrated based on the binding energy of C 1s = 284.8 eV.
Huang X., Hu Q., Li J., Yao W., Wang C., Feng Y, & Song W. (2024). Sputtering-Deposited Ultra-Thin Ag–Cu Films on Non-Woven Fabrics for Face Masks with Antimicrobial Function and Breath NOx Response. Materials, 17(7), 1574.
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