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Jem 2100hr transmission electron microscope

Manufactured by JEOL
Sourced in Japan

The JEM-2100HR is a transmission electron microscope manufactured by JEOL. It is designed to provide high-resolution imaging and analysis capabilities. The JEM-2100HR can operate at accelerating voltages up to 200 kV and offers a range of advanced features for materials science and life science research applications.

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9 protocols using jem 2100hr transmission electron microscope

1

Visualizing SARS-CoV-2 in Gut Bacteria

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Gut bacteria derived from healthy donors were infected with the supernatant derived from COVID-19 affected individuals, containing bacteria and SARS-CoV-2 particles. Biological sample was directly deposited in a 3 µL drop on Formvar Carbon coated 200 mesh copper grids (Agar Scientific, USA), let to dry overnight in a desiccator, and the day after the sample was washed with ultrapure water and again let to dry overnight before analysis by JEOL JEM-2100 HR-transmission electron microscope at 120 kV (JEOL, Italy). TEM analysis conducted on unfiltered stock supernatants of Peptide samples demonstrated the presence of SARS-CoV-2 particles on the surface and inside gut bacteria (Supplementary Figure 2).
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2

Nanomaterial Characterization by Advanced Microscopy

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The images of transmission electron microscopy (TEM) were recorded on a JEM-2100 (HR) transmission electron microscope (JEOL, Tokyo, Japan). The images of scanning electron microscopy (SEM) were recorded on a S4800 transmission electron microscope (JEOL, Japan). FT-IR spectra were recorded on a Spectrum 100 spectrometer (Perkin Elmer, Waltham, MA, USA). Powder X-ray diffraction (PXRD) patterns were recorded on a Bruker D8 Advance X-ray diffractometer using Cu Kα radiation at 40 mA and 40 kV. UV-vis absorption and fluorescence spectra were recorded using an Evolution 350 UV-vis spectrophotometer (Thermo, USA) and an F-2500 fluorescence spectrometer (Hitachi, Tokyo, Japan), respectively.
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3

Visualizing Hsp12-induced DMPG LUV Structural Changes

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To visualize structural perturbations in DMPG LUVs in the presence of Hsp12, DMPG LUVs (0.5 μg/ml), either untreated or treated with 5 μM Hsp12 at 25°C for 1 h, were spread on AGS160‐3 copper grids (Agar Scientific) and stained with 2% uranyl acetate. The stained LUVs were then observed with a JEM‐2100 HR transmission electron microscope (JEOL) at 200 kV.
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4

Isolation and Characterization of Magnetotactic Bacteria

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A total of 53 sediment and soil samples were collected from a wide range of natural environments across China and Australia (Fig. 2a), including 13 sediment samples that have been described previously [41 (link), 88 ] (for details, see Supplementary Table 1). Each sample was examined for the presence of living MTB by light microscopy using the hanging-drop method [89 (link)]. MTB cells from sediments and peatland soils were enriched magnetically using a “MTB trap” and enriched MTB cells were then subjected to metagenomic analyses, the detailed procedures for which are described elsewhere [45 (link), 90 (link)]. The morphologies of enriched cells were examined using a JEM-2100 HR transmission electron microscope (JEOL, Japan) at 200 kV.
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5

Virus Visualization via Negative Staining TEM

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The virus particles were assessed by negative stain and transmission electron microscopy. Briefly, approximately 3–5 µL samples were spotted onto a 400-mesh carbon-coated copper grid, incubated for 1 min, quickly removed and air-dried. Then the grid was stained with 2% phosphotungstic acid (pH 7.4) for 2 min, removed immediately by adsorption to filter paper, washed with a drop of water, and air-dried again. Grids were examined using a JEM2100 (HR) transmission electron microscope (JEOL, Tokyo, Japan) at a magnification setting of 30,000× and an accelerating voltage of 100 kV.
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6

Advanced Material Characterization Techniques

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To observe the morphology and structures of our samples, we used Hitachi S-4800 field-emission scanning electron microscope (FE-SEM, Chiyoda, Tokyo, Japan) with an acceleration voltage of 10.0 kV and JEM-2100HR transmission electron microscope operating at 200 kV (TEM, JEOL Ltd., Akishima, Tokyo, Japan). X-Ray diffraction (XRD) data were recorded on Bruker AXS D8 Advance device (Billerica, MA, Cu-Kα λ = 1.5418 Å) working at 40 kV and 40 mA (2θ = 0.02° per step). X-Ray photoelectron spectroscopy (XPS, Thermo Scientific ESCALAB 250Xi spectrometer Al-Kα, Waltham, Massachusetts, USA) was obtained to analyze the composition and existing status of elements. In order to investigate the structures more detailedly, Fourier Transform Infrared spectra (FTIR, Nicolet Avatar 360, Nicolet, Waltham, Massachusetts, USA, KBr pellets) and Raman spectroscopy (LABRAM HR, Horiba, Kyoto, Japan) data were also collected. Thermo Gravimetric Analysis (TGA) was performed on Pysis 1 (PerkinElmer, Waltham, MA, USA) system in air with a heating rate of ∼10 °C min−1. The Mott–Schottky curve measurements were performed in a typical three-electrode electrochemical system (CHI 760e, Chenhua, Shanghai, China) at room temperature using Pt wire as the counter electrode and SCE as the reference electrode.
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7

Characterization of Carbon Nanodots

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The TEM images of CNDs solution with a concentration of 0.35 mM were obtained with a JEM-2100HR transmission electron microscope (JEOL, Japan). The CNDs (0.02 g) were fully reacted with H2O2 (1.0 mM), and the supernatant was discarded when no more bubbles were generated, dried under vacuum and washed three times with deionized water. The reacted sample (0.01 g) and the original sample (0.01 g) were analyzed by XPS separately. XPS spectra were obtained with a XPS spectrometer (ThermoFisher Nexsa, America). The Raman spectra of CNDs and CNDs + H2O2 were recorded by 488 nm laser. Raman spectra were obtained with a Alpha300R Raman spectrometer (Wealtec, Germany).
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8

Characterization of Nanoparticle Optical Properties

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The ultraviolet–visible light (UV–Vis) absorption spectra were recorded using a UV-1800 spectrophotometer (Shimadzu Co., Kyoto, Japan). The emission spectra were obtained on a Hitachi F-7000 fluorescence spectrophotometer (Hitachi Ltd., Tokyo, Japan). Transmission electron microscopy (TEM) was performed at room temperature using a JEM-2100HR transmission electron microscope (JEOL, Tokyo, Japan) with an accelerating voltage of 200 kV.
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9

Characterization of Upconversion Nanoparticles

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The size and morphology of nanoparticles were determined using a JEM-2100HR transmission electron microscope (TEM, JEOL Ltd., Japan). X-ray diffraction (XRD) measurements were performed using a D8-advance instrument (Bruker AXS Ltd., Germany). Upconversion fluorescence spectra were measured using an F-7200 fluorescence spectrophotometer (Hitachi Co., U.S.A.) modified with an external 980nm laser (Beijing Hi-Tech Optoelectronic Co., China) instead of the internal excitation source. Fourier transform infrared spectrophotometer (FT-IR) spectra of the nanoparticles were obtained with a Nicolet Nexus 470 (Thermo Electron Co., U.S.A.) using a KBr detector.
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