Nanowizard4 microscope

Optical microscopy images were recorded using a Leica DM 4000 M microscope equipped with a Leica DFC 320 camera. AFM images and corresponding height profiles were measured in non‐contact mode using a JPK NanoWizard4 microscope. NEXAFS spectra were recorded in partial electron yield mode at the HE‐SGM beamline at BESSY II, Berlin, Germany. Electron diffraction patterns were recorded using a Philips CM 30 transmission electron microscope at an acceleration voltage of 300 kV. Charge‐transport characteristics of fabricated OFETs were recorded at a Keithley SCS 4200 parameter analyzer under atmospheric conditions. Thin films were prepared via liquid‐liquid processing. Beakers were sonicated in acetone and isopropanol for 15 minutes subsequently and rinsed thoroughly with deionized (Millipore) water afterwards. 15 mL of Millipore water were then given into a beaker and solution of the respective N‐heterotriangulene concentration was added dropwise to form a floating lens on the water surface. Beakers were stored at RT or 278 K respectively until the solvent had evaporated. Resulting thin films were transferred from the water surface onto silicon wafers using a home‐made vertical lifting system. Single crystals of 3 suitable for X‐ray crystallographic analysis were successfully grown by solvent diffusion of hexanes into a solution of compound 3 in CH₂Cl₂.