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Jsm 6360lv field emission microscope

Manufactured by JEOL

The JSM-6360LV is a field emission scanning electron microscope (FESEM) manufactured by JEOL. It provides high-resolution imaging capabilities for a wide range of samples. The core function of the JSM-6360LV is to generate high-quality, high-magnification images of specimens using a focused electron beam.

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2 protocols using jsm 6360lv field emission microscope

1

Synthesis and Characterization of Fe3O4/N@C Nanocomposite

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The synthesized Fe3O4/N@C nanocomposite gained via using N-porous carbon derived from rice husk (N@C) as a matrix (framework) for the magnetic nanoparticles was characterized using different familiar characterization techniques such as transmission electron microscope (TEM), scanning electron microscope (SEM), Fourier-transform infrared spectroscopy (FT-IR), X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectra (XPS), and vibrating sample magnetometer (VSM). TEM analysis was carried out at an accelerating voltage of 200.0 kV using FEI Tecnai F20 transmission electron microscope while SEM analysis was carried out at 15.0 kV using a JEOL JSM-6360LV field emission microscope. FT-IR spectra were obtained via KBr pellet technology using a Vector 22 FTIR spectrometer. XRD analysis was achieved using Cu Kα radiation (λ = 0.15406 nm) by Bruker D8 Focus diffractometer at a scanning rate of 5.0° min−1. The Raman microscope (Renishaw inVia Qontor) was used to measure Raman spectra. XPS spectra were performed using an X-ray source of Mg K radiation on a spectrometer, Physical Electronics PHI 5400. Lakeshore 7407 vibrating sample magnetometer (VSM) was used to measure the magnetic properties. ASAP2020 volumetric adsorption analyzer was used to perform nitrogen adsorption studies at 77.0 K.
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2

Comprehensive Characterization of Synthesized Samples

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Fourier transform-infrared measurements (FT-IR) were conducted on KBr pellets with a PE Paragon 1000 spectrophotometer. The synthesized samples were characterized by Xray diffraction (XRD) on a RigakuD/max 2550VL/PC system operated at 35 kV and 200 mA with Cu Kα radiation (λ = 1.5406 Å), at a scan rate of 5°min -1 and a step size of 0.02°. Raman spectroscopy was measured on a Renishawin Via Raman microscope. X-ray photoelectron spectra (XPS) were collected on a physical electronics PHI5400 using Mg K radiation as the Xray source. All the spectra were corrected with the C 1s (285.0 eV) band. Elemental analysis was processed using a Vario ELIII/ Isoprime isotope ratio mass spectrometer. Nitrogen adsorption measurements at 77 K were performed using an ASAP2020 volumetric adsorption analyzer, after the samples had been outgassed for 8 h in the degas port of the adsorption apparatus. Scanning electron microscopy (SEM) was performed on a JEOL JSM-6360LV field emission microscope at 15 kV. Transmission electron microscopy (TEM) was carried out on a JEOL 2010 microscope at 200 kV. Thermogravimetric analysis (TGA) was conducted on a PE TGA-7 instrument at 20 °C min -1 .
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