Phi 5600

The morphologies of V₂O₅·nH₂O/CNT films before and after cycles were examined on scanning electron microscopes (SEM, 6335F and TESCAN VEGA3) and a transmission electron microscope (TEM, JEOL 2100F). Spectrum imaging of electron energy loss spectroscopy (EELS) was carried out under 200 kV accelerating voltage with a 13 mrad convergence angle for the optimal probe condition. Energy dispersion of 0.7 eV per channel and 21 mrad collection angle were set up for EELS; HAADF images were acquired with an 89 mrad inner angle simultaneously. The crystalline phases of the materials were detected on an X-ray diffraction (XRD) system (Rigaku SmartLab) with Cu Ka radiation source. To determine the water and CNT content in V₂O₅·nH₂O/CNT, thermogravimetric and differential thermal analysis (TGA-DTA) was conducted in the temperature range of 25-600°C at a heating rate of 10°C min⁻¹ under N₂ and air atmosphere, respectively. X-ray photoelectron spectroscopy (XPS, PHI5600 by Physical Electronics, Inc.) was conducted using monochromatic Al Ka X-ray at 14 kV. The solubilities of V₂O₅·nH₂O in different electrolytes were measured by inductively coupled plasma mass spectrometry (ICP-MS).

The neuromorphic device was analyzed with the KEYSIGHT B2902A source measuring unit. The XPS spectrum was measured by a PHI 5600 (Physical Electronics) with an Al X-ray monochromator, which uses photoelectrons excited by X-ray emission for surface characterization up to a depth of 2–5 nm. FTIR was performed using a Bruker I.F.S. The Raman spectrum was measured by a HORIBA LabRAM HR confocal spectrometer equipped with an 800-nm-long monochromator. The He-Cd laser was shined on the surface of the sample with an excitation wavelength of 325 nm.