Graphite powder was purchased from Sinocarbon Materials Technology Co. GO was synthesized via the Hummers’ method (35 ) and exfoliated following the procedure previously described (30 (link)). GO was deposited directly on the BALM substrate from the water solution or using the so-called bubble deposition method for samples imaged in air (30 (link)). Au (5 nm) and Cr/Au (2/5 nm) near-ARA layers were received from WATCH LIVE SAS (Lyon, France) or fabricated in the laboratory. Trimethyl-(2-oxo-2-pyrene-1-yl-ethyl)-ammonium bromide was prepared according to the procedure by Nakashima et al. (34 ). GO and r-GO were imaged using a Zeiss Axiovert 40 microscope equipped with a 63× Plan Apo oil immersion objective (numerical aperture of 1.40) and a Zeiss AxioCam HRc. AFM images were performed using a Dimension 3100 from Bruker (Digital Instruments); SEM images were performed using a Hitachi S4500 microscope. Chronoamperometry was carried out using a VoltaLab PGZ 301 potentiostat, in a three-electrode electrochemical cell developed for BALM under atmospheric conditions. The gold near-ARA layer was used as working electrode, a gold wire was used as counter electrode, and the Ag/AgCl electrode was used as the reference electrode.
S4500 microscope
Manufactured by Hitachi
The S4500 microscope is a high-performance scanning electron microscope (SEM) designed for advanced materials analysis. It features a field emission electron gun, providing high-resolution imaging capabilities. The S4500 can be used for a variety of applications, including the examination of surface topology, elemental analysis, and materials characterization.
Automatically generated - may contain errors
Lab products found in correlation
Axiovert 40 microscope, by Zeiss (1 mentions)
Axiocam hrc, by Zeiss (1 mentions)
Dimension 3100, by Bruker (1 mentions)
Uc6 cryo ultramicrotome, by Leica (1 mentions)
H 7600, by Hitachi (1 mentions)
H 600 microscope, by Hitachi (1 mentions)
Malvern zetasizer 3000 hs setup, by Malvern Panalytical (1 mentions)
Nanoscope 8, by Bruker (1 mentions)
4 protocols using s4500 microscope
1
Graphite to Graphene Oxide Synthesis
2
Ultrastructural Analysis of Anther Development
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For scanning electron microscopy, anthers at different developmental stages were fixed overnight in 2.5% glutaraldehyde, and then washed and postfixed in 1% osmium tetraoxide in 0.1 M sodium phosphate buffer (PBS, pH 7.2). Samples were then dehydrated in a graded ethanol concentration (30, 50, 70, 95 and 100%) and dried with liquid CO2. Before examination with the scanning electron microscope, dried anthers were sputtered with gold palladium for 300 s at 25 mA. Samples were finally visualized using a Hitachi S4500 microscope.
Transmission electron microscopy was performed using a Hitachi H7600 transmission electron microscope. Anthers were fixed in 2.5% glutaraldehyde (stored overnight at 4 °C), washed three times (5 min for each) with 0.1 M PBS, postfixed in 1% OsO4 for 2 h, and washed with PBS (three times, 5 min for each). Samples were then dehydrated as described above, treated with propylene oxide, and embedded in Spurr’s resin. Thin sections (70 nm) were taken using the Leica UC6 cryo ultramicrotome. Sliced sections were placed on 100-mesh copper grids and sequentially stained with uranyl acetate (30 min) and lead citrate (Sato’s Lead; 15 min).
Transmission electron microscopy was performed using a Hitachi H7600 transmission electron microscope. Anthers were fixed in 2.5% glutaraldehyde (stored overnight at 4 °C), washed three times (5 min for each) with 0.1 M PBS, postfixed in 1% OsO4 for 2 h, and washed with PBS (three times, 5 min for each). Samples were then dehydrated as described above, treated with propylene oxide, and embedded in Spurr’s resin. Thin sections (70 nm) were taken using the Leica UC6 cryo ultramicrotome. Sliced sections were placed on 100-mesh copper grids and sequentially stained with uranyl acetate (30 min) and lead citrate (Sato’s Lead; 15 min).
3
Characterization of Two-Patch Silica Nanoparticles
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Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) experiments were performed using a Hitachi H600 microscope operating at an acceleration voltage of 75 kV and a Hitachi S4500 microscope with an accelerating voltage of 5 kV, respectively. We prepared the samples by depositing one drop of the colloidal dispersion on conventional carbon-coated copper grids. We let the liquid evaporate in the open air at room temperature and placed the grids in a box away from dust. Before SEM analysis, samples deposited on a 300-mesh carbon coated copper grid were coated with nm-thick layer of gold and palladium (10%) with a SC7620 mini sputter coater.
The ζ potential value of a two-patch silica nanoparticles aqueous dispersion (1015 nanoparticles·L−1, pH~5.7) was measured using the Malvern Zetasizer 3000 HS setup (Malvern Instruments, Malvern, UK). The dielectric constant of water was set to 80.4 and the Smoluchowsky constant f(ka) was 1.5.
The ζ potential value of a two-patch silica nanoparticles aqueous dispersion (1015 nanoparticles·L−1, pH~5.7) was measured using the Malvern Zetasizer 3000 HS setup (Malvern Instruments, Malvern, UK). The dielectric constant of water was set to 80.4 and the Smoluchowsky constant f(ka) was 1.5.
4
Microscopic Imaging of Nanoscale Surfaces
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Scanning electron microscopy (SEM) micrographs were obtained with a Hitachi S-4500 microscope (0.5-30 kV). Atomic force microscopy (AFM) and conducting AFM images were obtained by scanning the samples using a Nanoscope 8 (Bruker) operating in Peak-Force tapping mode. For the contact current images, the scale is 3.6 pA, the image size is 0.4 μm × 0.4 μm, taken at 1 nN PeakForce, 5 V DC bias, using Bruker's PeakForce TUNA probe (Pt/Ir coating, spring constant of 0.4 N m -1 ) on an Icon dimension with an electrically conductive tip having a radius of about 50-100 nm.
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