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Jsm 7600f scanning electron microscope

Manufactured by JEOL
Sourced in United States, Japan

The JSM-7600F is a high-performance scanning electron microscope (SEM) manufactured by JEOL. It features a field emission electron gun, which provides a stable and high-brightness electron beam for high-resolution imaging. The JSM-7600F is capable of achieving a resolution of up to 1.0 nm and magnifications up to 1,000,000x. It is designed to accommodate a wide range of sample types and can be equipped with various detectors and analytical tools for comprehensive materials analysis.

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17 protocols using jsm 7600f scanning electron microscope

1

Stainless Steel Cell Fixation

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Cells were fixed on stainless steel by a solution of 2.5% glutaraldehyde in 0.1 M phosphate buffer pH 7.2 for 1 h at 4°C. The samples were then washed three times with phosphate buffer for 20 min at room temperature. Dehydration was performed by successive immersions in solutions of increasing ethanol content (70, 90, 100%), then three times for 10 min each in successive baths of ethanol-acetone solution (70:30, 50:50, 30:70, 100) and air-dried. Afterward, the samples were coated with a thin carbon layer using a CRESSINGTON 308R and observed with a JEOL JSM 7600F scanning electron microscope (JEOL, Ltd.). SEM was performed at 5 kV and the samples were observed at a working distance of 14.9 mm.
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2

SEM Imaging of Fixed Bacteria

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Bacteria were fixed in 2.5% glutaraldehyde for 30 min and 10 µl of the fixed bacteria were then dropped onto a poly-L-lysine coated silicon wafer. After 30 min of drying, the bacteria were washed with water and post-fixed in 4% osmium tetroxide for 1 h. After gentle washing in distilled water, cells were dehydrated through a graded series of ethanol baths (from 30 to 100%) and dried by the critical point drying (CPD) method using a Leica CPD 030. Finally, the samples were coated with a thin carbon layer using a CRESSINGTON 308R and observed with a JEOL JSM 7600F scanning electron microscope (JEOL Ltd) at the DimaCell platform (http://www.dimacell.fr/).
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3

Scanning Electron Microscopy Sample Preparation

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Cells were fixed on stainless steel by a solution of 2.5% glutaraldehyde in 0.1M phosphate buffer pH 7.2 for 1 h at 4°C. The samples were then washed three times with phosphate buffer for 20 min at room temperature. Dehydration was performed by successive immersions in solutions of increasing ethanol content (70, 90, 100%), then three times for 10 min each in successive baths of ethanol-acetone solution (70:30, 50:50, 30:70, 100) and air-dried. Afterward, the samples were coated with a thin carbon layer using a CRESSINGTON 308R and observed with a JEOL JSM7600F scanning electron microscope (JEOL, Ltd.). Scanning electron microscopy was performed at 5 kV and the samples were observed at a working distance of 14.9 mm.
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4

Electrochemical and Spectroscopic Characterization

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All of the electrochemical measurements were carried out with a Model 900 electrochemical workstation (CH Instruments, USA) with a standard three-electrode system. A glassy carbon electrode (1.6 mm in diameter, BAS Japan) or a gold disk electrode (1.6 mm in diameter, BAS Japan) served as a working electrode, a platinum wire served as a counter electrode, and an Ag/AgCl reference electrode (RE-1, BAS Japan) served as the reference electrode. The UV-Vis absorption spectra were recorded with a Shimadzu UV-2550 spectrophotometer (Shimadzu, Japan). Scanning electron microscopy (SEM) images were obtained with a JEOL or JSM-7600F scanning electron microscope, operated at 15 kV. It was equipped with an energy dispersive X-ray (EDS) spectrometer.
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5

Scanning Electron Microscopy Protocol

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Cell measurements (n = 50) were made using the 40×/0.65 objective and an Olympus BX51 compound microscope. Four samples were examined in a JEOL JSM-7600F scanning electron microscope (SEM) at a working distance of 15 to 21 mm and a voltage of 1.2 to 5.0 kV after a preliminary wash in distilled water, followed by dehydration in a series of ethanol solutions of increasing concentration (30, 50, 70, 90 and 100%), air drying on 0.5″ aluminum mounts and sputter coating with gold–palladium using a Polaron SC7640 High Resolution Sputter Coater (Quorum Technologies, Newhaven, UK).
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6

SEM Imaging of Aminated, Carboxylated Nanoparticles

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The 50–5000 nm aminated, carboxylated and NF particles were imaged using a scanning electron microscope to determine their sizes in the absence of an aqueous dispersion media. Round glass coverslips 12 mm diameter (Assistent, Germany) were cleaned with ethanol and attached to cylindrical aluminum mounts (Ted Pella Inc., Redding, California, USA) with silver paint (SPI Supplies, West Chester, Pennsylvania, USA). Using a glass pipette, a drop of the sterilized particles was deposited on each mounted coverslip, placed in a covered container, and allowed to air-dry at RT. Mounted dried samples were coated with a conductive layer of carbon in a high-vacuum evaporative coater (Cressington 208c, Ted Pella Inc., Redding, California, USA). Images were obtained with a JEOL JSM-7600F scanning electron microscope (JEOL USA Inc., Peabody, Massachusetts) operating at 2 kV.
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7

Scanning Electron Microscopy of Fiber Composites

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The morphology of the fiber ash, untreated fiber and polypropylene reinforced composites were studied using a JEOL JSM-7600F scanning electron microscope (SEM). The samples were thoroughly cleaned and positioned in a void chamber to dry and coat the polymer surface with 100 A thick irradium in JEOL sputter ion coater at 15 keV.
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8

SEM Imaging of Allantoic and Amniotic Fluids

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Scanning electron microscopy (SEM) imaging was performed on some of the allantoic and amniotic fluid samples that had greatest DNA concentrations. The SEM imaging was carried out by the NDSU Electron Microscopy Center core facility. Allantoic and amniotic fluids (4 ml) were centrifuged for 10 min at 14,000 × g to produce a pellet, then the pellet was resuspended in deionized water. This process was repeated twice to remove buffer salts. Pelleted material was then applied to round glass coverslips affixed to aluminum mounts with silver paint (SPI Supplies, West Chester, PA, United States), air dried, and sputter coated with carbon (Cressington 208c, Ted Pella Inc., Redding, CA, United States). Images were obtained using a JEOL JSM-7600F scanning electron microscope at an accelerating voltage of 2 kV or a JEOL JSM-6490LV scanning electron microscopy at an accelerating voltage of 15 kV (JEOL USA Inc., Peabody, MA, United States).
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9

SEM Analysis of Coated Sheets

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The thickness of the coating was analyzed using SEM. Coated and uncoated sheets were cut using a razor blade and the samples (n=3) were attached to cylindrical aluminum mounts using colloidal silver paint (Structure Probe Inc., West Chester, Pennsylvania). Subsequently, the samples were coated with a conductive layer of carbon in a high-vacuum evaporative coater (Cressington 208c, Ted Pella Inc., Redding, California). Images were obtained with a JEOL JSM-7600F scanning electron microscope (JEOL USA Inc., Peabody, Massachusetts) operating at 2 kV.
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10

PMMA Bead Fracture Analysis

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After immersion in PBS, the PMMA beads were fractured using osteotomes. The gross appearance was observed to determine whether the sutures were completely hydrolyzed. The fracture surfaces were studied using a JSM-7600 F scanning electron microscope (SEM)(JEOL, Japan). An energy dispersive X-ray spectroscopy (EDS) was also used to visualize and analyze the surface features. The energy of the electron beam was 10 kV. To ensure high quality images, the samples were sputter-coated with platinum using a JFC 1600 auto-fine coater (JEOL, Japan).
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