Jsm 7600f scanning electron microscope
The JSM-7600F is a high-performance scanning electron microscope (SEM) manufactured by JEOL. It features a field emission electron gun, which provides a stable and high-brightness electron beam for high-resolution imaging. The JSM-7600F is capable of achieving a resolution of up to 1.0 nm and magnifications up to 1,000,000x. It is designed to accommodate a wide range of sample types and can be equipped with various detectors and analytical tools for comprehensive materials analysis.
Lab products found in correlation
17 protocols using jsm 7600f scanning electron microscope
Stainless Steel Cell Fixation
SEM Imaging of Fixed Bacteria
Scanning Electron Microscopy Sample Preparation
Electrochemical and Spectroscopic Characterization
Scanning Electron Microscopy Protocol
SEM Imaging of Aminated, Carboxylated Nanoparticles
Scanning Electron Microscopy of Fiber Composites
SEM Imaging of Allantoic and Amniotic Fluids
SEM Analysis of Coated Sheets
PMMA Bead Fracture Analysis
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