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Tristar 3020 analyzer

Manufactured by Micromeritics
Sourced in United States

The Tristar 3020 analyzer is a surface area and porosity analyzer that uses the principles of gas adsorption to determine the surface area and pore size distribution of solid materials. It is capable of measuring surface areas as low as 0.01 m²/g and pore sizes ranging from 0.35 to 500 nanometers. The Tristar 3020 provides accurate and reliable data through its advanced software and hardware features.

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4 protocols using tristar 3020 analyzer

1

Comprehensive Material Characterization Protocol

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Powder X-ray diffraction (XRD) measurements were acquired using a Bruker D8 X-ray diffractometer (Bruker, Germany) with Ni-filtered Cu Kα radiation (40 kV, 40 mA). Atomic force microscopy (AFM) images were obtained by using a Multimode 8 (Bruker, Germany) in the tapping mode. The size and morphology of the products were characterized by a field-emission scanning electron microscope (FESEM, S-4800, HITACHI, Japan) and transmission electron microscope (TEM, JEM-2100F, JEOL, Japan). Fourier transform infrared spectroscopy (FTIR) was determined by a Thermo Fisher Nicolet 6700 spectrometer (ThermoFisher, USA). X-ray photoelectron spectroscopy (XPS) measurements were recorded on KRATOS Axis Ultra Dld (SHIMADZU, Japan) equipped with a monochromatic X-ray source (Al Kα, = 1486.6 eV). UV-vis diffused reflectance spectra (UV-vis DRS) of the samples were analyzed using a UV-3600 UV-vis-NIR spectrophotometer (SHIMADZU, Japan) at room temperature. Photoluminescence (PL) spectrum was recorded on a on a Fluorescence Spectrophotometer (F-7000, HITACHI, Japan) at an excitation wavelength of 380 nm. The transient state fluorescence spectra were tested by fluorescence spectrometer (FLS920, Edinburgh Instruments, UK). Nitrogen adsorption isotherm measurements were carried out at 77 K with a Micromeritics Tristar 3020 analyzer (USA).
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2

Characterization of g-C3N4/Bi12O17Cl2 Composite

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The X-ray diffraction (XRD) patterns of all as-made samples were measured by an X-ray diffractometer (Bruker D8 Advance). Fourier transform infrared spectra (FTIR) of all as-prepared samples were detected by Thermo Fisher Scientific IS10. The X-ray photoelectron spectroscopy (XPS) of g-C3N4/Bi12O17Cl2 (3 wt%) composite was recorded on Thermo Fisher Scientific Escalab 250. The microtopographies of g-C3N4, Bi12O17Cl2 and g-C3N4/Bi12O17Cl2 (3 wt%) composite were observed using JEM-2100F transmission electron microscope (TEM). The UV-vis diffuse reflectance spectra (DRS) of as-made samples were collected by an UV-vis spectrometer (Agilent Cary 5000). BET surface areas of all as-made samples were collected using a Micromeritics Tristar 3020 analyzer. Samples were outgassed at 150 °C for 12 h prior to measurements. Transient photocurrent properties of g-C3N4, Bi12O17Cl2 and g-C3N4/Bi12O17Cl2 (3 wt%) were measured by a CHI760 electrochemical system (China) in a three-electrode quartz cells. Pt wire was the counter electrode, and the saturated calomel electrode was the reference electrode. The sample films coated on ITO glasses were applied as the working electrode was. A 300 W Xe lamp with 400 nm filters provided the light source, and the electrolyte was 0.1 M Na2SO4. The total organic carbon (TOC) assays were investigated by using a Shimadzu TOC-VCPH analyzer.
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3

Multi-Technique Characterization of Materials

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Field-emission scanning electron microscopy (FE-SEM) was operated on a Hitachi S4800 (Japan) field-emission scanning electron microscope. Transmission electron microscopy (TEM) was conducted on a JEM-2100 F at an accelerating voltage of 200 kV. Wide-angle X-ray diffraction (XRD) patterns were collected on a Rigaku D/Max-2550 PC diffractometer (Tokyo, Japan) in the 2θ range of 10–90°. Nitrogen sorption isotherms were measured at 77 K with a Micromeritics Tristar 3020 analyzer (USA). Before measurements, the samples were degassed under vacuum at 180°C for at least 6 h. The Brunauer-Emmett-Teller (BET) method was utilized to calculate the specific surface areas using the adsorption data at P/P0 = 0.02–0.20. The pore size distribution (PSD) was calculated from the adsorption branch using the Barrett-Joyne-Halenda (BJH) model. The total pore volume (Vtotal) was estimated from the adsorbed amount at P/P0 = 0.995. The XPS were collected on an RBD 147 upgraded PHI 5000C ESCA system with a dual X-ray source. The Mg Kα (1253.6 eV) anode and a hemispherical energy analyzer were used in the measurements. All of the binding energies were referenced to the C 1s peak at 284.8 eV of the surface adventitious carbon.
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4

Comprehensive Materials Characterization Techniques

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High-resolution transmission electron microscopy images were obtained using a Tecnai G2 F20 ​S-Twin instrument at an accelerating voltage of 200 ​kV, and X-Max 80 ​T and Be4-Cf98 EDS. High-contrast transmission electron microscopy was performed using a Hitachi HT7800 transmission electron microscope with an accelerating voltage of 100 ​kV. FESEM images were captured using a Zeiss Ultra 55 microscope. Absorption spectra were recorded using a Shimadzu UV-2600 spectrophotometer. Fourier transform infrared spectra of the samples in KBr pellets were obtained using a Thermo Fisher Nicolet 6700 spectrometer. The zeta potentials were measured using a Malvern nanoparticle size zeta potential analyzer. XPS was performed on a PHI 5300 instrument (Delphi, US). Nitrogen adsorption-desorption measurements were conducted at 77 ​K using an ASAP 2420 and Micromeritics Tristar 3020 analyzer (USA) to obtain information regarding the porosity. The distributions of S, B, and Mn contents in different solutions were determined using ICP-AES (ThermoFisheriCAP 7400 ICP-AES).
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