Electron Microscopy images were acquired in a Field Emission Scanning Electron Microscope (Thermo-Fisher Scientific, FEI Teneo, Hillsboro, OR, USA). Two secondary electron detectors were used to evaluate the surface topography: the on-camera ETD and the T1 in lens.
Field emission scanning electron microscope
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Field Emission Scanning Electron Microscope (FESEM) is a high-resolution imaging tool that utilizes a field emission source to produce a focused electron beam. This electron beam scans the surface of a sample, generating various signals that are collected and processed to create detailed images of the sample's topography and composition.
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6 protocols using field emission scanning electron microscope
1
Surface Topography Evaluation via SEM
2
Scanning Electron Microscopy of Particles
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Morphological features of the particles were then observed by a field emission scanning electron microscope (Thermo Fisher Scientific, USA) at 6000.
3
Ethanol Treatment of CSLA Nanostructures
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The CSLA was cut in half, and then one half of the CSLA was soaked in anhydrous ethanol for 3 d, then baked in a vacuum oven at 40 °C to a constant weight. Thereafter, SEM was used to observe the CSLA profile. The experiments were performed using a field emission scanning electron microscope manufactured by FEI, USA, with an accelerating voltage of 200 V~30 kV and secondary electron imaging.
4
Scanning Electron Microscopy of PVA/CHT/PHMB Blends
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The surface morphology of PVA/CHT/PHMB blends formed film was observed under a Field Emission Scanning Electron Microscope (FEI Co., Hillsboro, OR, USA) operated at 5 kV. The samples were cut into small pieces (5 × 5 mm), and coated with gold using a sputter coater under 15 mA for 60 s.
5
Surface Morphology Analysis of Coated Discs
6
Comprehensive Material Characterization
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Field emission scanning electron microscope (FEI, Hillsboro, OR, USA) and high-resolution transmission electron microscope (JEOL, Tokyo, Japan)were applied to observe the modified material. Raman spectroscopy (Renishaw PLC, Wotton-under-Edge, UK) with a laser wavelength of 532 nm and X-ray photoelectron spectroscopy (XPS, Kratos Analytical, Manchester, UK) were used to characterize the chemical compositions and element chemical states. All the electrochemical experiments were carried out by a CHI660e electrochemical workstation (Shanghai Chenhua, Shanghai, China).
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