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Attenuated total reflectance accessory

Manufactured by PIKE Technologies
Sourced in Japan

The attenuated total reflectance (ATR) accessory is a laboratory equipment designed to facilitate the analysis of solid, liquid, and semi-solid samples. It operates by directing an infrared beam onto the surface of a crystal, creating an evanescent wave that interacts with the sample in close contact with the crystal. This interaction allows the infrared spectrum of the sample to be captured and analyzed without the need for complex sample preparation.

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3 protocols using attenuated total reflectance accessory

1

Structural and Physicochemical Analysis of Ho-based MOFs

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The phase composition and X-ray crystal structure of the resulting Ho-based MOFs were determined using a MiniFlexII powder diffractometer (Rigaku, Japan) with CuKα-radiation.
Physisorption measurements with nitrogen were performed at 77 K with an ASAP 2020 MP analyzer (Micromeritics, Norcross, GA, USA). The specific surface area for the obtained MOFs was calculated through the BET method [89 (link)]. Determination of the pore size distribution was achieved by the BJH method with Harkins–Jura and Faas correction [90 (link),91 (link)].
The structural changes of the Ho-MOFs were investigated by Fourier-transform infrared spectroscopy (FTIR) using an IRAffinity-1S spectrometer (Shimadzu, St. Petersburg, Russia) and an attenuated total reflectance accessory (PIKE Technologies, St. Petersburg, Russia) in the range of 400–4000 cm−1 at 25 °C in KBr matrix.
The morphology of the developed Ho-MOFs was studied by scanning electron microscopy (SEM) using a Zeiss Merlin SEM (Carl Zeiss SMT, Oberkochen, Germany) at an accelerating voltage of 1 kV and electron beam current of 100 pA to prevent surface charging.
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2

Structural Analysis of CA and CMC Membranes

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The structural changes of the developed CA and CMC-based membranes were investigated by Fourier-transform infrared spectroscopy (FTIR) using an IRAffinity-1S spectrometer (Shimadzu, St. Petersburg, Russia) and an attenuated total reflectance accessory (PIKE Technologies, St. Petersburg, Russia) in the range of 400–4000 cm−1 at 25 °C.
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3

Spectroscopic Analysis of Starch and Protein

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Starch and protein isolate were analyzed in both dry and non-cold-set dough forms prepared as stated in 2.2.5. The non-cold-set dough examined contained 0, 30 and 100% protein on dry matter base. The infrared spectra for the samples were obtained using a Fourier Transform Infrared Spectrometer (FTIR) (IRprestige 21-FTIR- Shimadzu Corp. Japan) fit with an attenuated total reflectance accessory (Pike Technologies, Madison, WI, USA). The scans were performed in the wavenumber range of 600–4000 cm−1 at a rate of 32 scans per spectra and resolution of 4 cm−1. For the dry samples, background scans were taken with the crystal bare and for hydrated samples, water was used as the reference for subtraction. All spectra have undergone ATR correction (OMNIC Software, Thermo Scientific), to correct for the intensity of peaks due to the variation of the penetration depth of the evanescent wave with frequency. All samples were analyzed in triplicate.
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