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Miniflex x ray diffractometer

Manufactured by Rigaku
Sourced in Japan, United States

The Miniflex X-ray diffractometer is a compact and versatile instrument used for the analysis of crystalline materials. It is designed to perform qualitative and quantitative phase analysis, as well as the determination of various structural parameters such as lattice parameters and crystallite size. The Miniflex is capable of generating and detecting X-rays for the purpose of powder X-ray diffraction analysis.

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29 protocols using miniflex x ray diffractometer

1

X-ray Powder Diffraction of Solid Phases

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X-ray powder diffractograms of solid phases were recorded on a benchtop Rigaku Miniflex X-ray diffractometer (Danvers, MA) using Cu Kα radiation (λ = 1.54 Å), a tube voltage of 30 kV, and a tube current of 15 mA. Data was collected between 5° and 40° in 2θ at a continuous scan rate of 2.5°/min.
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2

X-Ray Powder Diffraction Analysis

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X-Ray powder diffraction patterns were collected using a Rigaku Miniflex X-Ray diffractometer using CuKα radiation at 40 kV and 15 mA. The diffraction pattern was collected at a scanning rate of 0.2 degrees per second with a diffraction angle of 2θ ranging from 5 to 70°.
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3

XRD Analysis of Powder and Thin Film Samples

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The XRD patterns were collected by a Rigaku Miniflex X-ray diffractometer and used Cu Kα radiation at 30 kV and 15 mA. Data were collected from 10.00° to 79.99° for the powder and 10.00° to 34.00° for the drop-cast thin film (range selected to avoid the intense gold peaks from the underlying substrate). All samples were analyzed at a sampling width of 0.03° and scan speed of 3°/min.
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4

Powder X-ray Diffraction of Micronized CFZ-HCl

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Powder X-ray diffraction (pXRD) spectra of micronized CFZ-HCl crystals at different stages of manufacturing were taken by Rigaku Miniflex X-ray diffractometer (Rigaku-USA Inc., Danvers, MA, USA) using Cu Kα radiation, a tube voltage of 30 kV, and a tube current of 15 mA. Measurements were taken from 5° to 40° at a continuous scan rate of 2.5°/min.
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5

Polymorphic Analysis of Lipid-Based Nanoformulations

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XRD was performed to study the polymorphic changes in the lipids and drugs used in the formulation of SLNs [32 (link)]. The analysis was carried out using Rigaku Miniflex X-ray Diffractometer (Rigaku Corporation, Tokyo, Japan). A double-sided adhesive tape was applied over the sample holder and powdered (ground) samples were poured onto the sample holder using a thin spatula. The intensity of the diffracted beam was analyzed in a 2θ range between 10° and 70°. All of the samples were analyzed using JADE software (Livermore, CA, USA).
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6

Characterization of Synthesized Nanoparticles

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Crystalline phases of the synthesized NPs were analyzed by Rigaku MiniFlex X-ray diffractometer (XRD, Tokyo, Japan) with Cu Kα (λ 1.540593 Å) radiation in the scan range 5–90°. The morphology and size of synthesized NPs were characterized using a scanning electron microscope (SEM, Lyra, Tescan and Helios 5UX, FEI, Eindhoven, Netherland) and transmission electron microscopy (TEM, Tecnai F20, FEI, Eindhoven, Netherland). Average hydrodynamic diameter (dh) and zeta (ζ) potential of NPs (50 mg/L) in DI water and 2% NaCl solution were measured using Zetasizer Nano ZS (Malvern Instruments Ltd, Worcestershire, UK). The dh and ζ-potential were measured in 1mL DTS1061 folded capillary cell (Malvern Instruments, Worcestershire, UK) immediately after preparation (0 h) and after 24 h. Attenuated total reflection–Fourier transform infrared (ATR-FTIR, Varian 800 FT-IR, Scimitar Series, Fitchburg, WI, USA) measurements were recorded on a Attenuated Total Reflectance (ATR, GladiATRTM, Pike technologies, Fitchburg, WI, USA) mode in the range of 4000 to 400 cm−1 at a resolution of 4 cm−1 after 50 continuous scans.
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7

Structural and Optical Characterization of Materials

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TEM images were taken on a Hitachi H-9000NAR instrument operated at 300 kV. Powder X-ray diffraction (XRD) patterns were recorded using a Rigaku MiniFlex X-ray diffractometer (CuKα, Ni filter). Analyses of the surface area and pore structure were carried out using a Quantachrome AUTOSORB-1 automated gas-sorption system with N2 as the adsorbate, after pretreatment of the sample at 200 °C for 2 h under reduced pressure. The BET surface area was calculated from the adsorption branch of the isotherm. Ultraviolet and visible-light diffuse reflection (UV-vis DR) spectra were obtained with a Hitachi U-4100 UV-vis-NIR spectrometer equipped with an integrating sphere using BaSO4 as a reference. The reflectance spectra were converted to absorbance spectra by the Kubelka–Munk method.
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8

X-ray Diffraction Analysis of Samples

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Phase analysis of control and experimental samples were performed using X-ray diffraction (XRD) equipment (Rigaku MiniFlex X-ray diffractometer, Tokyo, Japan). The diffractometer was operated at 0.15416 nm wavelength, 10 mA current, and 30 kV voltage. Each sample was scanned from 2θ ~ 10° −70° with a 0.02° step size. The crystal size (D) evaluation was done in the long dimension and the mean size in the plane of cross-section. The D was calculated using Scherrer equation (Islam et al., 2017 (link)): D = K λ / β½ cosθ
Where λ is the X-ray wavelength, θ is the diffraction angle and K is a constant.
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9

Characterization of Metal Salts via XRF, AAS, and XRD

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Individual metal contents
were evaluated using an EDXL300 X-ray fluorescence spectrometer (Rigaku,
Tokyo, Japan) for the Ca, Mn, Co, Ni, Cu, and Zn salts. The magnesium
content of the Mg salt was measured with a Z-5010 polarized Zeeman
atomic absorption spectrophotometer (Hitachi, Tokyo, Japan). Melting
points were determined using a melting-point apparatus (Bibby Scientific
Ltd., Staffordshire, U.K.). SEM images were obtained using an SU8000
instrument (Hitachi High-Technologies Corp., Tokyo, Japan) at an electron
beam accelerating voltage of 1 kV. XRD analyses were performed using
a MiniFlex X-ray diffractometer (Rigaku, Tokyo, Japan) operating at
30 kV and 15 mA to generate Cu Kα radiation.
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10

Characterization of Biogenic Silver Nanoparticles

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The morphology of purified AgNPs was scanned by field emission scanning electron microscopy (Hitachi SU6600, Japan) by taking a thin sheet of AgNPs that were mounted on the carbon-coated copper grid. The X-ray diffraction analysis of synthesized biogenic AgNPs was conducted by using Rigaku Miniflex X-ray diffractometer with Cu-Ka radiations 2θ = 0.15406 nm from 30 to 80° with 2 h running time.
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