The crystal morphologies of the samples were obtained on an XL 30 ESEM FEG field-emission scanning electron microscope (FESEM; FEI Company). The X-ray diffraction patterns were recorded on a Thermo Scientific ARL X’TRA Power Diffractometer with Cu Kα radiation (λ = 1.54056 Å) in the 20–70° range. The X-ray photoelectron spectra (XPS) of the samples were characterized with an Escalab 250 spectrometer with monochromatized Al Kα. The UV-Vis-NIR spectrophotometer (Shimadzu UV-3600) was used to characterize the UV-Vis diffuse reflectance spectra (UV-Vis DRS) of the samples. The SPV of the samples was characterized with an equipment reported in our earlier study.
Xl 30 esem feg field emission scanning electron microscope
Manufactured by Thermo Fisher Scientific
Sourced in United States
The XL 30 ESEM FEG is a field-emission scanning electron microscope designed for high-resolution imaging and analysis of samples. It features a field-emission electron source, which provides improved resolution and brightness compared to traditional tungsten filament sources. The instrument is capable of operating in both high-vacuum and low-vacuum (environmental) modes, allowing for the analysis of a wide range of specimen types, including those with low vapor pressure. The XL 30 ESEM FEG is a versatile tool for research, development, and quality control applications across various industries and scientific fields.
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Lab products found in correlation
2 protocols using xl 30 esem feg field emission scanning electron microscope
1
Comprehensive Characterization of Crystal Morphologies
2
Comprehensive Material Characterization via SEM, EDS, and XPS
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Scanning electron microscopy (SEM) images and energy dispersive spectroscopy (EDS) analysis were obtained using an XL30 ESEM FEG field emission scanning electron microscope (FEI Company, Hillsboro, OH, USA) at an accelerating voltage of 20 kV. X-ray photoelectron spectroscopy (XPS) was carried out on an ESCALABMKII spectrometer (VG Co., UK) with AlKα X-ray radiation as the source for excitation. SERS spectra were performed on a Renishaw 2000 model confocal microscopy Raman spectrometer (Renishaw Ltd., Gloucestershire, UK). The 514.5 nm radiation from an air-cooled argon ion laser was used as the exciting source.
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