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Dimension 3100 nanoscope 5

Manufactured by Veeco
Sourced in United States

The Dimension 3100 + Nanoscope V is a high-resolution atomic force microscope (AFM) system developed by Veeco. It enables the imaging and characterization of surface topography at the nanoscale level. The system combines the Dimension 3100 AFM with the Nanoscope V controller, providing advanced capabilities for surface analysis.

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2 protocols using dimension 3100 nanoscope 5

1

Nanoscale Characterization of Cu/CuO Heterostructures

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The morphologies of the Cu/CuOx/Cu nanodots were observed using a field emission scanning electron microscope (FE-SEM; JSM 7401F, JEOL). The microstructure and crystal structure of nanodots were investigated using a high-resolution transmission electron microscope (HR-(S)TEM-I; JEM 2100F with a Cs corrector on STEM, JEOL) and by x-ray diffraction (XRD, D/MAX-2500/PC, RIGAKU) using Cu Kα radiation (λ  =  1.54178 Å). Before the TEM investigations, the samples were prepared using a focused ion beam (FIB; Helios, FEI).The surface morphologies of Cu/CuOx/Cu were examined using AFM (Dimension 3100 +  Nanoscope V, VEECO) in non-contact mode and the electrical properties were measured using conductive AFM (XE-100, Park systems) in contact mode; the scan rate was 1 Hz, the scan configuration was 256 ×  256 pixels, and the scan size was 500 nm ×  500 nm. The AFM measurements were performed at room temperature and atmospheric pressure. Micro- cantilevers (length : 225 μ m, Park Systems) with frequency of 75 kHz, a spring constant of ~2.8 N m−1 and a radius of curvature of ~25 nm were used.
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2

Nanogel Characterization and Thermal Analysis

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Proton nuclear magnetic resonance (NMR) spectra were recorded on a Varian Mercury-400 NMR spectrometer (400 MHz) in D2O using tetramethylsilane (TMS) as a reference. The particle sizes and zeta potentials of complexes at weight ratio 10 were determined using a commercial laser light scattering instrument (Malvern ZEN3690, Malvern Panalytical Ltd., Cambridge, UK) at room temperature. The hydrodynamic diameter of nanogels was measured from 25–80 °C with 2 °C intervals [45 (link)]. The morphologies of nanogels were characterized through atomic force microscopy (AFM) imaging (Dimension 3100 Nanoscope V, Veeco, Plainview, NY, USA). DNP cantilevers (k = 0.24 N/m) were operated in the air using contact mode.
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