Dimension 3100 nanoscope 5
The Dimension 3100 + Nanoscope V is a high-resolution atomic force microscope (AFM) system developed by Veeco. It enables the imaging and characterization of surface topography at the nanoscale level. The system combines the Dimension 3100 AFM with the Nanoscope V controller, providing advanced capabilities for surface analysis.
2 protocols using dimension 3100 nanoscope 5
Nanoscale Characterization of Cu/CuO Heterostructures
Nanogel Characterization and Thermal Analysis
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!