The largest database of trusted experimental protocols

Aquilos 2 cryo fib sem dual beam microscope

Manufactured by Thermo Fisher Scientific

The Aquilos 2 cryo-FIB/SEM dual beam microscope is a high-performance instrument that combines focused ion beam (FIB) and scanning electron microscopy (SEM) capabilities. The system is designed for cryogenic sample preparation and analysis, enabling the study of delicate, beam-sensitive specimens in their native hydrated state.

Automatically generated - may contain errors

2 protocols using aquilos 2 cryo fib sem dual beam microscope

1

Cryo-FIB Lamella Preparation of Y. entomophaga

Check if the same lab product or an alternative is used in the 5 most similar protocols
Grids containing Y. entomophaga Ara-RoeA ∆YenLC, Ara-RoeA ∆HolA/Rz/Rz1 or Ara-RoeA ∆Rz/Rz1 strain cells were clipped in cryo-FIB-specific AutoGrids (Thermo Fisher) with alignment markers and a cut-out for milling at shallow angles. Clipped grids were transferred to an Aquilos 2 cryo-FIB/SEM dual beam microscope (Thermo Fisher). Lamella preparation was performed as previously described80 (link). In brief, after platinum sputter coating and deposition of metalloorganic platinum, clusters of bacterial cells were targeted for a 4-step milling procedure using decreasing ion beam currents from 0.5 nA to 50 pA. Milling angles of 6–10° relative to the grid were used. Lamellae were milled to a thickness range of 50–100 nm.
+ Open protocol
+ Expand
2

Cryo-FIB/SEM Lamella Preparation

Check if the same lab product or an alternative is used in the 5 most similar protocols
Grids were clipped into autogrids modified for FIB preparation62 (link) and loaded into either an Aquilos or an upgraded Aquilos2 cryo-FIB/SEM dual-beam microscope (Thermofisher Scientific). Overview tile sets were recorded using MAPS software (Thermofisher Scientific) before being sputter coated with a thin layer of platinum. Good sites with parasites were identified for lamella preparation before the coincident point between the electron beam and the ion beam was determined for each point by stage tilt. Prior to milling, an organometallic platinum layer was deposited onto the grids using a GIS (gas-injection-system). Lamellae were milled manually until under 300 nm in a stepwise series of decreasing currents. Milling was performed at the lowest possible angles to increase lamella length in thin cells. Finally, polishing of all lamella was done at the end of the session as quickly as possible but always within 1.5 h to limit ice contamination from water deposition on the surface of the lamellae. Before removing the samples, the grids were sputter coated with a final thin layer of platinum. Grids were stored in liquid nitrogen for a maximum of 2 weeks before imaging in the TEM.
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!