Field emission scanning electron microscope
The field emission scanning electron microscope (FE-SEM) is a high-resolution imaging tool that utilizes a focused electron beam to scan the surface of a specimen. It provides detailed information about the topography, composition, and other properties of the sample at the nanoscale level.
Lab products found in correlation
43 protocols using field emission scanning electron microscope
Characterization of Thin Film Properties
Morphological Analysis of Samples
Synthesis and Characterization of Silver Nanoparticles
Electrochemical Characterization of FGPC
Physiochemical Characterization of Nanoparticles
PF127 Hydrogels for Drug Delivery
Membrane and Electrode Morphology Analysis
Comprehensive Characterization of MoS2 Nanostructures
Leaf Ultrastructure Imaging Protocols
TEM samples were fixed, post-fixed, and dehydrated as described in SEM, and then embedded in propylene oxide and Spurr’s resin overnight at 70°C. Embedded samples were sliced to 60 mm with an ultramicrotome (MT–X, RMC), and then stained with 2% uranyl acetate for 5 min and Reynold’s lead citrate for 2 min at 25°C. Processed samples were examined using a JEM-1010 EX electron microscope (JEOL,
Transmission Electron Microscopy Imaging
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