Labram hr evolution raman microscope

The thermogravimetric analyses (TGAs) of the metal complexes were carried out with a Perkin–Elmer Pyris 1 TGA apparatus at a heating rate of 5 °C/min for CuL14 and MnL14, and 2.5 °C/min for FeL14 in a temperature range of 25 to 800 °C under an O₂ atmosphere at a flow rate of 20 mL/min. Spectrum evaluations were performed using the Pyris version 11.1.1.0492 software package.
The infrared spectra were recorded in the spectral range between 4000 and 250 cm⁻¹ in KBr pellets with a Perkin–Elmer FTIR/FIRS Spectrometer Frontier instrument. A total of 32 scans were performed. Raman spectra were obtained using a HORIBA LabRam HR Evolution Raman microscope at room temperature. A He–Ne laser was employed with an energy of 633 nm from 20 mW to 100 mW and a slit of 100 µm. The X-ray photoelectron spectra (XPS) were obtained on a Perkin–Elmer PHI 5100 model with a Mg Kα source under a vacuum of 4 × 10⁻⁹ torr. All the spectra were corrected to alkyl type carbon C1s (285.0 eV) and fitted by applying a Tougard baseline and a Gaussian–Lorentzian function to each peak.

The measurements were carried out using a Horiba LabRAM HR Evolution Raman microscope with a common objective (10×) in a modified flow cell, and the 785-nm laser was chosen. The Ag/AgCl electrode and Ni foam were used as the reference electrode and counter electrode. The electrolyte for both the cathode and the anode was 1 M KOH. The different potentials were applied during the In situ SERS measurements, and a 15-minute electrolysis was performed at each potential before the signals were collected.

The c-AFM measurements were carried out in an Asylum Research Cypher AFM with conductive probes in ambient conditions (temperature ∼26°C, relative humidity ∼50%). A constant voltage bias was applied between the sample and the probe. The typical spring constant and resonance frequency of the conductive probe coated with Ti/Ir (ASYELEC.01-R2, Asylum Research) are 2.8 N/m and 75 kHz, respectively. To exclude the possibility of an extra moiré pattern in top multilayer graphene created during the transfer process, we also carried out c-AFM measurements on suspended graphene near the graphite edge without the bottom graphite substrate (Fig. S3). In our c-AFM experiments, measurements were intentionally conducted in the inner regions of graphene far away from the graphite edge, where the strain induced by the SiO₂/Si substrate was minimized (Fig. S4). The Raman spectra were obtained using a Horiba LabRAM HR Evolution Raman microscope with a 532 nm He-Ne laser as the excitation source.

OM and FL images were acquired with an optical microscope (DM4000 M, Leica). Raman and PL spectra, line scans and mapping images were obtained with a Horiba Jobin Yvon LabRAM HR-Evolution Raman microscope under 532 nm laser irradiation. AFM characterizations were performed on Multimode 8 (Bruker). TEM, HAADF, and SAED measurements were performed using a transmission electron microscope (Talos F200X, Thermo Fisher) operated at 200 kV. XPS spectra were acquired using an Axis Ultra spectrometer (ESCALAB 250Xi, Thermo Fisher).

Surface coverage and thickness were measured using peak-force tapping mode in a Bruker Icon AFM using scanasyst AFM tips with a nominal tip radius of ∼2 nm and a spring constant of 0.4 N/m. Raman and PL measurements were performed using a HORIBA LabRAM HR Evolution Raman microscope with laser wavelengths of 532 nm. Raman spectra were collected with 1800 grooves per mm grating, while PL measurements were conducted with 300 grooves per mm grating. The Raman and PL maps were acquired over a 5 × 5 µm² area. X-ray diffraction characterization of MoS₂ films was carried out with a PANalytical MRD diffractometer with a 5-axis cradle. X-rays were generated in a standard Cu anode X-ray tube operated at 40 kV accelerating voltage and 45 mA filament current. Cu K line was filtered by a mirror with 1/4° slit and Ni filter on the primary beam side. On the diffracted beam side, an 0.27° parallel plate collimator with 0.04 rad Soller slits with PIXcell detector in open detector mode was employed. Samples' surface was ~2–4° away from the X-ray incidence plane such that diffraction caused by the (h k i 0) planes, to determine the in-plane epitaxial relation of the film with respect to a substrate, could be measured^{35 (link)}.

A flow cell with a quartz window by GaossUnion (Tianjin) Photoelectric Technology Company was used to carry out in situ Raman measurements using a Horiba LabRAM HR Evolution Raman microscope (Fig. S25). A 785 nm laser was used and signals were recorded using a 20 s integration and by averaging two scans. The gas diffusion electrode sprayed with the catalyst was used as working electrode and a graphite rod and a Hg/HgO electrode were used as counter and reference electrodes, respectively. The counter electrode was separated from the working electrode by anion exchange membrane. The 5 M KOH aqueous solution was used as electrolyte and were recirculated by pump with flow rates of 20 mL min⁻¹. Meanwhile, CO₂ gas was continuously supplied to the gas chamber with a flow rate of 40 mL min⁻¹.