TEM was performed on a JEOL JEM 2100 system operating at an acceleration voltage of 200 kV. Diluted nanoparticle suspensions were placed onto carbon‐coated copper grids and dried at room temperature. X‐ray powder diffraction pattern was recorded in the range of 10° ≤ 2q ≤ 70° using an Empyrean diffractometer (Malvern Panalytical; CuKα radiation). Fourier transform infrared analysis of the samples was performed using a PerkinElmer spectrophotometer (Spectrum 65 FTIR) equipped with an attenuated total reflectance sample chamber. The hydrodynamic diameter of the nanoparticles in suspension was measured using a Zetasizer Nano ZS (Malvern Panalytical). Chemical component analysis of nanoparticles was performed by inductively coupled plasma‐optical emission spectrometry technique (ACTIVA, Horiba Jobin Yvon). This technique has also been used to calculate the concentration of the nanoparticles in suspension.
Jem 2100 system
Manufactured by JEOL
Sourced in Japan
The JEM-2100 system is a high-performance transmission electron microscope (TEM) designed for advanced materials analysis and characterization. It provides high-resolution imaging, diffraction, and analytical capabilities to support research and development across various scientific disciplines.
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Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Spectrum 65 ftir, by PerkinElmer (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
Empyrean diffractometer, by Malvern Panalytical (1 mentions)
Activa, by Horiba (1 mentions)
Escalab220i xl electron spectrometer, by VG Scientific (1 mentions)
X ray tube, by Philips (1 mentions)
Spectra 300, by Thermo Fisher Scientific (1 mentions)
Merlin system, by Zeiss (1 mentions)
Bx53m microscope, by Olympus (1 mentions)
Evo 18, by Zeiss (1 mentions)
Ultra 55, by Zeiss (1 mentions)
Nanolab 600, by Thermo Fisher Scientific (1 mentions)
6 protocols using jem 2100 system
1
Characterization of Nanoparticle Properties
2
Comprehensive Characterization of Crystalline Products
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The crystal phases of the products were characterized by X-ray diffraction (XRD) using Philips X’pert PRO analyzer (Philips, Amsterdam, The Netherlands) equipped with a Cu Kα radiation source (λ = 0.154187 nm) and operated at an X-ray tube (Philips, Amsterdam, The Netherlands) voltage and current of 40 KV and 30 mA, respectively. The morphology of the products was examined by scanning electron microscopy (SEM) using a JEOL JSM 67OOF system (JEOL, Tokyo, Japan) and transmission electron microscopy (TEM) using a JEM-2100 system (JEOL, Tokyo, Japan) operated at 200 kV. Surface composition was determined by X-ray photoelectron spectroscopy (XPS) using an ESCALab220i-XL electron spectrometer (VG Scientific, Waltham, MA, USA) with monochromatic Al Kα radiation. Nitrogen adsorption-desorption isotherms were analyzed using an automatic adsorption system (Autosorb-1, Quantachrome, Boynton Beach, FL, USA) at the temperature of liquid nitrogen.
3
Tempol-Lipid Nanoparticle Morphology
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Morphology of Tempol-Lips with a concentration of 200 μg mL−1 in PBS (pH 7.4) was analyzed by transmission electron microscopy (TEM). Sample was placed on a carbon film copper grid, air-dried and negatively stained with phosphomolybdic acid (2%, w/v). The images of TEM were visualized by JEM-2100 system (JEOL, Japan), which was operated at an acceleration voltage of 80 kV.
4
Multimodal Nano-Characterization Techniques
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Optical images were captured by an Olympus BX 53 M microscope. AFM images were recorded using an Oxford MFP-3D Infinity system in a tapping mode. XPS (Thermo Fisher ESCALAB 250Xi) was used to analyze the chemical states. The binding energies were calibrated with C 1 s at 284.8 eV. SEM images were collected on a Zeiss Merlin system. TEM analysis was performed on FEI Tecnai F30 system and JEOL JEM-2100 system, operating at 300 kV and 200 kV accelerating voltages, respectively. HAADF-STEM images were taken on a FEI Spectra 300, operating at 80 kV accelerating voltage. UV-visible transmission measurements were recorded on U-3900H Spectrophotometer at a scan speed of 120 nm min−1.
5
Characterization of NiO/CeO2 Nanocomposites
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The phase and crystallinity of the pure CeO2 NPs and NiO/CeO2 NCs were examined by powder X-ray diffraction (XRD) patterns recorded on Philips diffractometer (40 kV, 30 mA, Cu Kα radiation with λ = 1.54178 Å) at room temperature over a 2θ range between 20° to 80°. The surface morphological and chemical compositional studies of the pure CeO2 NPs and NiO/CeO2 NCs were carried out by using field emission scanning electron microscopy (FESEM, Zeiss/Ultra 55) equipped with energy dispersive X-ray spectroscope (EDS). After fabricating the gas sensors, the morphology and composition characteristics were analyzed using scanning electron microscope (SEM, Zeiss Evo18) equipped with EDS. X-ray photo electron spectra (XPS) on a PHI5000VersaProbeII system using Al Kα (1486.6 eV) radiation operating at an accelerating power of 15 kW were used to investigate the surface chemical states of the elements in NiO/CeO2 NCs. The shape, size, and structure related information of NiO/CeO2 NCs was obtained from high resolution transmission electron microscopy (HRTEM) imaging via a JEOL-JEM 2100 system operating at 200 kV.
6
Electron Microscopy Imaging Techniques
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High-resolution secondary electron images were obtained using a FEI Helios Nanolab 600 scanning electron microscope (SEM). Transmission Electron Microscopy (TEM) micrographs were obtained on a JEOL JEM-2100 system.
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