X-ray diffraction analysis (XRD, PANalytical X’Pert PRO MPD Diffractometer, The Netherlands) with Cu-Kα radiation in the range 2theta = 20–80° was used to investigate the crystalline structure of the hybrid structures. A UV-VIS spectrophotometer (PerkinElmer Lambda 950 UV/Vis, Shelton, WA, USA) with an integrating sphere in the range of 300–800 nm was used to record the optical characteristics. In order to identify the vibrational states of the as-synthesized structures, Raman spectroscopy was used with a Nanonics Imaging (Israel)—MultiProbe Imaging—MultiView 1000™ Platform (SPM) equipped with a 532 nm laser. The morphological and elemental properties of the structures were investigated by Scanning Electron Microscopy (SEM) using an FEI Inspect S model, The Netherlands coupled with an energy dispersive X-Ray analysis detector (EDX), both for Zn-ZnO(Nw) supports and Zn-ZnO(Nw)-rGO hybrid electrodes. The electrochemical characteristics were measured with a potentiostat/galvanostat, PGSTAT 302, Metrohm Autolab B.V. The Netherlands controlled with GPES 4.9 software using a classical three-electrode cell system in a 1M KOH solution, consisting of hybrid electrode Zn-ZnO(Nw)-rGO (an effective area of 1 cm2) as the working electrode, Ag/AgCl as the reference electrode, and platinum counter electrode.
Lambda 950uv vis
Manufactured by PerkinElmer
Sourced in United States
The Lambda 950 UV-vis is a high-performance spectrophotometer designed for a wide range of applications. It features a dual-beam optical system, a wavelength range of 175 to 3,300 nm, and a photometric range of -6 to 6 Abs. The instrument is capable of accurate and reliable measurements across numerous sample types.
Automatically generated - may contain errors
Lab products found in correlation
Inspect s model, by Thermo Fisher Scientific (1 mentions)
X pert pro mpd diffractometer, by Malvern Panalytical (1 mentions)
Pgstat302, by Metrohm (1 mentions)
Easy scan afm, by Nanosurf (1 mentions)
D8 discover lynxeye, by Bruker (1 mentions)
Jsm 6700 microscope, by JEOL (1 mentions)
Auriga microscope, by Zeiss (1 mentions)
D8 advance, by Bruker (1 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
Frontier ft ir spectrophotometer, by PerkinElmer (1 mentions)
Ultima 4 x ray powder diffractometer, by Rigaku (1 mentions)
J 815, by Jasco (1 mentions)
Hr4000, by OceanOptics (1 mentions)
9 protocols using lambda 950uv vis
1
Multifunctional Hybrid Electrode Characterization
2
Weatherability Comparison of LaB6-2 and Ep-1 Coatings
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Example 7
Coating LaB6-2 and comparative coating Ep-1 were tested for weather-ability. The coatings were cured on a white colored aluminum panel (Tru aluminum 04X12X038, unpolished, white, APT33676, Batch: 20814216, ACT Laboratories Inc.) and placed into a weather-o-meter (following SAE J2527) for 250 to 500 hours. Then, the film was tested for reflectivity utilizing a Perkin Elmer Lambda 950UV-Vis NIR spectrometer. The NIR electromagnetic radiation extinction of the comparative coating Ep-1 containing films deteriorated quickly such that after 250 h, no pronounced electromagnetic radiation extinction can be seen in the NIR. After 500 hours of weathering, coating LaB6-2 did not have an observable NIR electromagnetic radiation extinction signal deterioration as shown in
3
Comprehensive Characterization of VO2 Thin Films
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The surface morphologies of the films
were determined by SEM using a JEOL JSM-6700 microscope (3 kV). The
roughness measurements were obtained using a Nanosurf easy scan AFM,
equipped with a 10 μm tip in noncontact mode with an oscillating
probe. The scan area was 5 μm × 5 μm with 20 nm scan
intervals. XRD was performed on a Bruker D8 Discover LynxEye diffractometer
using primary monochromated Cu Kα1 radiation (λ
= 1.5406 Å, 2θ = 5–66°, 0.05° per step).
XRD patterns were compared with Inorganic Crystal Structure Database
(ICSD) reference patterns for monoclinic VO2 (ICSD 34033).
Optical transmittances were monitored on a Perkin Elmer Lambda 950
UV–vis–NIR spectrophotometer that was equipped with
a homemade heating unit. The thermochromic properties of the films
were measured by recording the transmittance spectra from 2500 to
250 nm as a function of temperature between 20 and 90 °C. The
Scotch tape test20 (link) was used to determine
the adhesion of the films to the substrate. Thin films thicknesses
were determined by the φ SemiLab SE-2000 ellipsometer. XPS was
carried out on thin films using a Thermo Scientific K-α spectrometer
with monochromated Al Kα radiation, a dual beam charge compensation
system, and constant pass energy of 50 eV (spot size, 400 μm).
Spectra were recorded from 0 to1200 eV.
were determined by SEM using a JEOL JSM-6700 microscope (3 kV). The
roughness measurements were obtained using a Nanosurf easy scan AFM,
equipped with a 10 μm tip in noncontact mode with an oscillating
probe. The scan area was 5 μm × 5 μm with 20 nm scan
intervals. XRD was performed on a Bruker D8 Discover LynxEye diffractometer
using primary monochromated Cu Kα1 radiation (λ
= 1.5406 Å, 2θ = 5–66°, 0.05° per step).
XRD patterns were compared with Inorganic Crystal Structure Database
(ICSD) reference patterns for monoclinic VO2 (ICSD 34033).
Optical transmittances were monitored on a Perkin Elmer Lambda 950
UV–vis–NIR spectrophotometer that was equipped with
a homemade heating unit. The thermochromic properties of the films
were measured by recording the transmittance spectra from 2500 to
250 nm as a function of temperature between 20 and 90 °C. The
Scotch tape test20 (link) was used to determine
the adhesion of the films to the substrate. Thin films thicknesses
were determined by the φ SemiLab SE-2000 ellipsometer. XPS was
carried out on thin films using a Thermo Scientific K-α spectrometer
with monochromated Al Kα radiation, a dual beam charge compensation
system, and constant pass energy of 50 eV (spot size, 400 μm).
Spectra were recorded from 0 to1200 eV.
4
Characterization of As-Synthesized Samples
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The crystal structure of the as-synthesized samples was determined by X-ray powder diffraction (XRD) using a Bruker D8 Advance diffractometer equipped with a Cu Kα radiation (1.5417 Å) source, a LYNXEYE super speed detector and a Ni filter. X-ray diffraction data was collected in the 2θ range between 20° and 80° using a scan rate of 0.05° by 2 s. The light absorption properties were measured by using a UV-Vis diffuse reflectance spectrophotometer (Perkin Elmer Lambda 950 UV-Vis) with a wavelength range of 250–800 nm. A Zeiss Auriga microscope equipped with energy-dispersive X-ray (EDX) detector was used to perform scanning electron microscopy (SEM) and EDX analysis.
X-ray photoelectron spectroscopy (XPS) from SPECS system (Germany) was used to identify Mn and Fe oxidation states on the samples. The instrument was equipped with XR50 duel anode source (Al operated at 150 W) and a Phoibos MCD-9 detector. All measurements were done under the vacuum (pressure 5 × 10−9 mbar) and the hemispherical analyzer was set at the pass energy 25 eV while the high resolution spectra step size was set at 0.1 eV. Casa XPS program (Casa Software Ltd., UK) was used for the data analysis.
X-ray photoelectron spectroscopy (XPS) from SPECS system (Germany) was used to identify Mn and Fe oxidation states on the samples. The instrument was equipped with XR50 duel anode source (Al operated at 150 W) and a Phoibos MCD-9 detector. All measurements were done under the vacuum (pressure 5 × 10−9 mbar) and the hemispherical analyzer was set at the pass energy 25 eV while the high resolution spectra step size was set at 0.1 eV. Casa XPS program (Casa Software Ltd., UK) was used for the data analysis.
5
Comprehensive Characterization of Thin-Film Devices
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Current density–voltage
(J–V) measurements were performed
using a solar cell I–V testing
system from PV Measurements, Inc. with a Keithley 2400 source meter.
The light intensity was calibrated to 100 mW/cm2 intensity
with an AM 1.5G solar simulator. The structural and crystallographic
properties of the deposited films were studied with PANalytical Empyrean
thin-film XRD machine with Cu Kα radiation. The surface morphology
of the films was measured by scanning electron microscopy (FEI Nova
NanoSEM450) equipment. For optical characterization (transmittance,
reflectance, and absorbance) of the films, PerkinElmer Lambda 950
UV–vis–NIR spectrometer was used. The impedance analysis
was conducted with an Autolab PGSTAT-30 equipped with a frequency
analyzer module in the frequency range from 1 MHz to 1 Hz.
(J–V) measurements were performed
using a solar cell I–V testing
system from PV Measurements, Inc. with a Keithley 2400 source meter.
The light intensity was calibrated to 100 mW/cm2 intensity
with an AM 1.5G solar simulator. The structural and crystallographic
properties of the deposited films were studied with PANalytical Empyrean
thin-film XRD machine with Cu Kα radiation. The surface morphology
of the films was measured by scanning electron microscopy (FEI Nova
NanoSEM450) equipment. For optical characterization (transmittance,
reflectance, and absorbance) of the films, PerkinElmer Lambda 950
UV–vis–NIR spectrometer was used. The impedance analysis
was conducted with an Autolab PGSTAT-30 equipped with a frequency
analyzer module in the frequency range from 1 MHz to 1 Hz.
6
Structural and Optical Characterization of Magnetic Nanoparticles
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The crystallinity, structure and phase purity of the annealed samples were identified using X-ray diffraction (Rigaku Ultima-IV powder X-ray diffractometer) employing Cu-Kα radiation over the range of 20–70 °C and Fourier-transform infrared (FTIR) spectra recorded using a PerkinElmer Frontier FTIR spectrophotometer in the range 4000–450 cm−1. The thermal stability of MNPs was studied using thermogravimetric analysis (TGA) in the temperature range of room temperature–800 °C at a heating rate of 10 °C/min. The optical parameters were measured using an ultraviolet–visible spectrophotometer (PerkinElmer Lambda 950 UV–VIS) in the wavelength range of 200–1600 nm. For magnetic measurements, a vibrating-sample magnetometer (Lakeshore model 7400 VSM) is used within the range of ± 1 T. Prepared pellets were exposed to different humidity values in the range of 15 to 90% RH in a closed chamber for a constant time. Dielectric properties of pellets before and after humidity exposure were analyzed using an impedance analyzer in the frequency range of 300 Hz–1 MHz.
7
Characterization of Ni(II) Complexes with Peptides
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The UV-visible spectra were recorded in the range of 850–330 nm, on a LAMBDA 950 UV/vis/NIR spectrophotometer (PerkinElmer). The path length was 1 cm. Complexometric titrations were performed for the samples containing 0.95 mM peptide and 0.9 mM Ni(NO3)2 dissolved in H2O. The pH of the solution was adjusted manually in the range of 3–11.5 by titrating with small amounts of concentrated NaOH. Circular dichroism (CD) spectra of Ni2+ complexes with peptides were recorded in the range of 270–800 nm, on a Jasco J-815 spectropolarimeter, using the same samples as for UV-vis experiments. The pKa values for the complex formation were obtained by fitting the absorption value at the band maximum to the Hill equation (Acerenza and Mizraji, 1997 (link)).
8
Spectroscopic Characterization of MXene Films
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Spectroscopic
ellipsometry measurements were performed on MXene films using a VUV-VASE
variable-angle spectroscopic ellipsometer (J.A. Woollam M-2000 DI)
in the range of 193 to 1690 nm. The ellipsometric data were collected
over Ti3C2Tx MXene films spray-coated onto ITO/c-Si substrates in the spectral
region of 300 to 2500 nm, at multiple incident angles from 60°
to 75° with a step size of 5°. Transmittance/reflectance
measurements were performed using a PerkinElmer Lambda 950 UV/vis–NIR
spectrophotometer. Hall-effect and conductivity measurements were
conducted at room temperature using a Lake Shore 7700 Hall system
in Van der Pauw geometry. Series resistance values are extracted from
the J–V curves.
ellipsometry measurements were performed on MXene films using a VUV-VASE
variable-angle spectroscopic ellipsometer (J.A. Woollam M-2000 DI)
in the range of 193 to 1690 nm. The ellipsometric data were collected
over Ti3C2Tx MXene films spray-coated onto ITO/c-Si substrates in the spectral
region of 300 to 2500 nm, at multiple incident angles from 60°
to 75° with a step size of 5°. Transmittance/reflectance
measurements were performed using a PerkinElmer Lambda 950 UV/vis–NIR
spectrophotometer. Hall-effect and conductivity measurements were
conducted at room temperature using a Lake Shore 7700 Hall system
in Van der Pauw geometry. Series resistance values are extracted from
the J–V curves.
9
Ensemble-Scale Spectroscopy of NPLs
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For ensemble-scale
steady-state spectroscopy, NPLs were diluted in n-hexane and placed in airtight 10 × 10 mm2 quartz
cuvettes. Absorption spectra were recorded using an absorption spectrometer
(PerkinElmer Lambda 950 UV/vis). Emission spectra were recorded on
a home-built setup, in which the sample was excited by a 405 nm laser
diode, and a lens pair projected the luminescence onto a fiber that
guided the light to a spectrometer (Ocean Optics HR4000).
steady-state spectroscopy, NPLs were diluted in n-hexane and placed in airtight 10 × 10 mm2 quartz
cuvettes. Absorption spectra were recorded using an absorption spectrometer
(PerkinElmer Lambda 950 UV/vis). Emission spectra were recorded on
a home-built setup, in which the sample was excited by a 405 nm laser
diode, and a lens pair projected the luminescence onto a fiber that
guided the light to a spectrometer (Ocean Optics HR4000).
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