To characterize the Si nanowires embedded in the SiNWS, we cut the SiNWS to expose the cross sections of the silicon nanowire arrays. The broken SiNWS was placed on the SEM sample holder for SEM imaging (ZEISS Supra 40VP SEM at an accelerating voltage of 10 keV). For SEM characterization of EVs captured on Si nanowires, the SiNWS were separated from the NanoVilli Chip after capturing EVs from 100 μL of artificial plasma samples. The EVs immobilized on SiNWS were fixed in 4% PFA for 1 h. The samples were dehydrated by sequential immersion in 30, 50, 75, 85, 95, and 100% ethanol solutions for 10 min per solution. After overnight lyophilization, sputter-coating with gold was performed at room temperature. The morphology of EVs immobilized on Si nanowires was observed using a ZEISS Supra 40VP SEM at an accelerating voltage of 10 keV.
Supra 40vp sem
Manufactured by Zeiss
Sourced in Germany
The Supra 40VP SEM is a scanning electron microscope (SEM) produced by Zeiss. It provides high-resolution imaging capabilities for a variety of applications. The Supra 40VP SEM utilizes a field emission gun (FEG) as its electron source, enabling the generation of a high-brightness electron beam. This instrument is designed to deliver detailed, high-quality images of samples at the nanoscale level.
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Lab products found in correlation
3d fib instrument, by Thermo Fisher Scientific (3 mentions)
Electroplus 1000, by Instron (2 mentions)
Gemini column, by Zeiss (1 mentions)
208hr sputter coater, by Cressington (1 mentions)
Polaron critical point dryer, by Quorum Technologies (1 mentions)
Biomate 3, by Thermo Fisher Scientific (1 mentions)
Malvern zetasizer nano zs model zen 3600, by Malvern Panalytical (1 mentions)
Autosamdri 810 critical point dryer, by Tousimis (1 mentions)
Ftir prestige 21, by Shimadzu (1 mentions)
208 sputter coater, by Cressington (1 mentions)
Ultim max 100, by Oxford Instruments (1 mentions)
Glutaraldehyde fixative, by Merck Group (1 mentions)
Model 682 pecs, by Ametek (1 mentions)
Osmium tetroxide, by Merck Group (1 mentions)
Picoplus, by Agilent Technologies (1 mentions)
32 protocols using supra 40vp sem
1
Characterization of Si Nanowires in SiNWS
2
Elemental Analysis of Recovered Implants
3
SEM and Elemental Analysis of Tissue
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Ring quarters for SEM and elemental analysis were embedded in Optimal Cutting Temperature compound, flash-frozen in liquid nitrogen, and stored at -80°C. Frozen sections were collected on Cryofilm 2c (UConn Health Sciences, Molecular Core Facility), attached to 12.7 mm Zeiss aluminum pin subs (16111–9, Ted Pella, Redding, CA) using adhesive carbon dots (16084–1, Ted Pella, Redding, CA), and critical point dried before sputter coating with iridium, as above. All samples were imaged using a Zeiss Supra 40VP SEM (Carl Zeiss Microscopy, LLC, White Plains, NY). EDS was performed using an integrated Thermo Noran UltraDry System SIX EDS system (ThermoFisher, Waltham, MA). The details of SEM imaging are presented in the appropriate Figure legends.
4
Scanning Electron Microscopy of Powder Samples
5
Hydrogel Swelling and Imaging
6
Clearing Seeds for Microscopic Analysis
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Immature seeds were cleared in Hoyer’s solution (30 mL of water, 100 g of chloral hydrate, 7.5 g of Arabic gum, and 5 mL of glycerin) on a glass slide and examined with a compound microscope equipped with Nomarski optics. For scanning electron microscopy (SEM) the plant material was dried in liquid carbon dioxide and mounted on stubs using double sided adhesive and conductive tabs. Next, plant material was coated with gold and platin before imaging with a Zeiss Supra 40VP SEM (Carl Zeiss NTS, Oberkochen, Germany). For each experiment at least three biological replicates were used.
7
Nanoparticle Characterization by SEM
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Samples were visualized by Scanning Electron Microscopy (SEM) on a Zeiss supra 40 V P SEM (Carl Zeiss Microscopy GmbH, Iena, Germany), fitted with a GEMINI column, which made it possible to work in Inlens mode. It was equipped with an energy dispersive spectroscopy (EDS) microanalysis system. The nanoparticle solution samples were deposited on copper, silicon and/or platinum substrates (one drop deposit). They were not metallized before observation. The areas of interest were first located in backscattered electron mode.
8
Platinum/Palladium Sputter Coating SEM Imaging
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Samples mounted on standard aluminum SEM stubs were sputter coated with 12 nm platinum/palladium (Pt/Pd) in an argon atmosphere using a sputter coater 208HR (Cressington Scientific Instruments Ltd., Watford, UK). The particles were imaged using a Zeiss Supra 40VP SEM (Carl Zeiss Microscopy GmbH, Jena, Germany).
9
Characterization and Mechanical Properties of Zn-TiB2 Nanocomposite
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The high purity Zn and Zn-3vol%TiB2 nanocomposite samples, both in hot rolling conditions, were prepared by mechanical grinding, alumina nanoparticle polishing and ion milling polishing for microstructure characterization using a scanning electron microscopy (ZEISS Supra 40VP SEM). The dispersion and size distribution of in situ TiB2 nanoparticles was also investigated by SEM and energy-dispersive x-ray spectroscopy (EDS) analysis, with image processing through Image Pro. Microhardness test was performed covering the entire samples by LM 800AT microhardness tester using a load of 200gf with a 10s dwell time. The tensile testing specimens were fabricated by electrical discharge machining (EDM). The gage length and width of the tensile specimens were 10 mm and 4 mm, respectively (ASTM E8/E8M standard sub-size). Tensile tests were carried out using Instron ElectroPlus 1000 at a strain rate of 2 mm/min. 0.2% proof stress was used as yield strength.
10
Characterizing EV Distribution on Si Nanowires
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