Scanning electron microscope SEO-SEM Inspect S50-B (FEI, Brno, Czech Republic) was used to describe the surface characteristics after the immersion test. The chemical composition of the surface before and during the examination was evaluated by an energy-dispersive X-ray spectrometer AZtecOne with X-MaxN20 detector (Oxford Instruments, Abingdon, Oxfordshire, UK) attached to the SEM.
Seo sem inspect s50 b
The SEO-SEM Inspect S50-B is a scanning electron microscope (SEM) designed for inspection of semiconductor devices. It provides high-resolution imaging capabilities for the analysis of materials at the micro- and nano-scale.
Lab products found in correlation
2 protocols using seo sem inspect s50 b
Simulated Body Fluid Immersion of Biomaterials
Scanning electron microscope SEO-SEM Inspect S50-B (FEI, Brno, Czech Republic) was used to describe the surface characteristics after the immersion test. The chemical composition of the surface before and during the examination was evaluated by an energy-dispersive X-ray spectrometer AZtecOne with X-MaxN20 detector (Oxford Instruments, Abingdon, Oxfordshire, UK) attached to the SEM.
Nanofibrous Mesh Characterization
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